A5.3 SS functional requirements

3GPP51.010-1Mobile Station (MS) conformance specificationPart 1: Conformance specificationTS

A5.3.1 Level setting range

It is assumed that the SS is capable of setting stimulus levels, at the MS interface, to those required in the test specification extended by the measurement uncertainty defined in this annex.

NOTE: This ensures that the SS is able adequately to stimulate the MS performance at and just beyond the limit requirement under all conditions.

A5.3.2 Level Measurement / operation range

It is assumed that the SS is capable of performing measurements, within the uncertainty defined in this annex, over a level range, at the MS interface, as required in the test specification extended by the SS measurement uncertainty defined in this annex and extended by a further 3dB on the MS conformity requirement.

NOTE: This ensures that the SS is able adequately to measure the MS performance at and just beyond the limit requirement under all conditions.

A5.3.3 MS power supply interface

Test DC power supply for MS:

Voltage setting uncertainty < 1 %.

Ripple < 10 mV RMS, 50 mV peak to peak.

Test AC power supply for MS:

Voltage setting uncertainty: < 1 %.

A5.3.4 MS antenna interface

The SS is assumed to offer a nominal 50 ohm impedance to the MS.

GSM/DCS/PCS bands

< 4 GHz

< 10 GHz

< 12,75 GHz

VSWR

 1,3

 2,0

 3,0

 3,5

A5.3.4.1 Uplink receiver error

The SS receiver should be capable of performing the tests as specified in 3GPP TS 11.10 without the addition of bit errors in excess of 1 in 10E7 due to the receiver performance when operated with a MS which meets the transmitter requirements of 3GPP TS 05.05. This requirement shall apply for GMSK and 8PSK modulation.

NOTE: This requirement is based on a minimum BER measurement of 1 in 10E5.

A5.3.4.2 Power and Power versus time measurements

Measurement uncertainty of transmitter output power for GMSK and 8PSK signals: ±1 dB.

In the case of 8PSK, provision is made for power measurement by averaging over multiple bursts or by using an estimation method, see 3GPP TS 05.05, clause 4. The estimation method may be based on measurements of one or more bursts, or part of a burst.

If 8PSK power is measured by averaging over multiple bursts, allowance must be made for variations in burst power as a function of the data. This allowance must be included within the ±1 dB measurement limit. The allowance is related to the number of bursts taken in the average and shall be defined as follows:

Allowance for burst power variation = 2/SQRT(N)

Where:  = the standard deviation of burst power variation for random data (0,2 dB).

(two standard deviations yield a 95 % confidence interval).

N = number of averages.

EXAMPLE: An average is calculated from 4 bursts. The allowance for burst power variation is 0,2 dB. The accuracy for the power meter should then be better than ±0,8 dB.

If 8PSK power is measured using an estimation method, it shall be demonstrated, using the method described below, that the accuracy of the estimation technique is also ±1 dB.

A test signal is established consisting of properly formatted bursts with midambles and random data in the payload. The long-term average power of this signal is determined by measuring the power over 200 bursts and taking the average (Pavg). The measurement uncertainty of the equipment used to determine the long-term average shall be noted (P).

The same test signal is then measured using the estimation technique. The difference between the estimated value of long-term average power and the measured long-term average power is noted (Pest). The following inequality shall hold:

|P| + |(Pavg – Pest)| ≤ 1 dB

For GMSK, measurement uncertainty of power level (relative to peak transmitter carrier power):

Power level

Measurement uncertainty

+6 dB to -7 dB

±0,25 dB

-7 dB to -20 dB

±1,0 dB

-20 dB to -32 dB

±2,0 dB

-32 dB to -45 dB

±2,0 dB

-45 dB to -71 dB

±1,0 dB

< -71 dB

±2,0 dB

For 8PSK, measurement uncertainty of power level (relative to output power):

Power level

Measurement uncertainty

+6 dB to -7 dB

±0,25 dB

-7 dB to -16 dB

±1,0 dB

-16 dB to -32 dB

±2,0 dB

-32 dB to -45 dB

±2,0 dB

-45 dB to -71 dB

±1,0 dB

< -71 dB

±2,0 dB

NOTE: Due to the method of measurement (downconversion to I/Q baseband / filtering / A/D conversion / postprocessing) several uncertainties occur. The sources are:

a) absolute level uncertainty;

b) filter ripple,
I/Q gain imbalance,
I/Q imperfect quadrature;

c) A/D conversion (resolution),
I/Q offset.

Items under b) and c) affect the individual samples and can be observed as a "ripple" in the horizontal part of the power time mask.

Items under b) are uncertainties which are proportional to the signal measured.

Items under c) are constant amounts of uncertainty, independent of the signal measured.

The item a) moves the entire power time template up or down.

The uncertainties b) and c) are added to the measured signal as an uncorrelated interferer.

The above mentioned absolute measurement uncertainty refers to a). The table covers uncertainties b) and c).

Uncertainty of time measurement

The relative timing uncertainty of the transition point:

– symbol 13 to 14 in the midamble (normal burst);

– end of the sync sequence (access burst);

is ±1/8 symbol.

Timing uncertainty of the measurement samples in the vertical part of the power time mask are displayed as marked fields in the figure A5.3-1.

Figure A5.3-1: Time Measurement Uncertainty for the Power Time Mask

NOTE: With a real method of measurement one has to reckon on systematic measurement uncertainties in the vertical part of the power time template (figures 13-2 & 13-3). The reason for this is that the measurement is conducted through a filter which has to fulfil different requirements simultaneously, requirements in the frequency domain and in the time domain as well. The time behaviour of the filter causes the above mentioned measurement uncertainty. It occurs clearly when measuring the falling edge of the power burst. The measurement uncertainty, which in principle delays the actual performance, depends on the filter characteristics and on the signal shape. At favourable signal shapes the uncertainty is negligible, however, at unfavourable signal shapes it consumes the marked area in figure A5.3-1 (falling edge).

The underlying filter is:

– type inverse Chebycheff.

– passband  ±200 kHz.

– stopband (40 dB stop att.)  ±541,67 kHz.

To avoid aliasing with this filter the RF output spectrum must meet the requirements of subclause 13.4.

If the lowest limit line in the power time template is replaced by a -54 dBm line, measuring lower carrier powers, the area of measurement uncertainty is reduced equivalently.

The marked area in figure A5.3-1 describes the systematic measurement uncertainty of the test equipment and does not widen the design requirements.

Uncertainties associated with 13.3.5 requirement b) (power control levels, adjacent steps):

Repeatability ± 0,3 dB

Linearity ± 0,03 dB/dB

Combined uncertainty is: ± (0,3 + 0,03 dB/dB) dB

E.g. where the indicated value of the step size is 2,0 dB, the uncertainty is:

± (0,3 + 0,06) dB = ± 0,36 dB.

A5.3.4.3 Wideband selective power measurement

Power is to be measured selectively for spurious emissions without frequency hopping (ref.: clause 12).

Uncertainty conducted 100 kHz to 1GHz ±1,5 dB

1 GHz to 12,75 GHz ±3,0 dB

Uncertainty radiated 30 MHz to 4 GHz ±6 dB

NOTE: The uncertainties include the effect of a worst case reflection from the MS of 0,7 for out of band signals.

It is acceptable to use a band stop filter in spurious emission measurements of the transceiver in order to fulfil the above requirements.

A5.3.4.4 Inband selective power measurements

Power is to be measured selectively for output RF spectrum.

The measurement is performed on a single frequency while the MS is frequency hopping (ref.: subclause 13.3).

Uncertainty < ±1,6 dB

NOTE: The video signal of the spectrum analyser is "gated" such that the spectrum generated by at least 40 of the bits 87 to 132 of the burst is the only spectrum measured. This gating may be analogue or numerical, dependent upon the design of the spectrum analyser.

A5.3.4.5 Modulation accuracy and frequency error measurements

GMSK modulation

Ref.: Subclauses 13.1 and 13.2 for definitions and methods of measurement.

Phase measurement uncertainty:

±1 degree RMS;

±4 degrees for individual phase measurement samples.

The phase measurement uncertainties above apply during the useful bits.

Frequency measurement uncertainty: ±5 Hz.

8PSK modulation

Ref.: Subclause 13.17.1 for definitions and methods of measurement.

EVM measurement uncertainty:

+(0,75 – 0,025RMS_EVM), -(0,75 + 0,025RMS_EVM) % RMS;

4% for individual EVM measurement samples.

NOTE 1: The value of the RMS EVM specification is a function of the value of RMS_EVM being measured. The asymmetric specification results from the RMS EVM minimisation method used for parameter estimation (see 3GPP TS 05.05, annex G). This method of measurement for RMS EVM always produces a result that is lower than the actual value of RMS EVM.

NOTE 2: The value for individual EVM samples assumes a Rayleigh distribution of measurement errors. It represents the maximum 95th percentile value test equipment should return when measuring a signal without error.

NOTE 3: If the test equipment demodulates the transmitted signal to derive the reference signal for the EVM measurement, the symbol error rate of the demodulation process must be less than 4.410E-4 for 95% confidence that no detection errors occur in a burst.

Origin Offset uncertainty (for a single burst) < ±1,5 dB for origin offset ≥ -35dBc.

Frequency measurement uncertainty < ±20 Hz.

A5.3.4.6 RF delay measurements relative to nominal times

Range -140 to +140 symbol periods.

Resolution 1/4 symbol period.

Uncertainty ±1/8 symbol period.

A5.3.4.7 The wanted signal or traffic channel of serving cell

The Wanted signal is used in most of the specified RF measurements. The traffic channel of the serving cell is used in most of the signalling tests.

FREQUENCY:

GMSK

Uncertainty: < ± 5*10E-9.

8PSK

Uncertainty: < ± 20*10E-9.

MODULATION (see 3GPP TS 05.04):

GMSK

Phase uncertainty: < ±1 degree RMS; and

< ±4 degrees peak(as defined in 3GPP TS 05.05).

8PSK

EVM uncertainty < 4 % RMS.

Origin offset suppression < -35 dBc.

LEVEL:

Uncertainty: < ±1 dB in subclause 13, 14 except;

< ±3 dB for test 14.2 radiated;

< ±1,2 dB for test 14.6;

< ±2,5 dB for all other tests.

Settling time: < 10 us.

DYNAMIC LEVEL SETTING:

The SS shall be able to switch from any power level to any other power level within the range of 30 dB on a timeslot per timeslot basis. This dynamic switching requirement only applicable for a single channel for a limited number of tests.

SPURIOUS:

in channel:

Covered by phase error.

out channel:

Noise Power, 1 Hz bandwidth:

< -100 dBc for > 100 kHz carrier offset;

< -110 dBc for > 300 kHz carrier offset;

< -121 dBc for > 1 500 kHz carrier offset.

Non harmonics:

< -55 dBc for > 100 kHz carrier offset;

< -68 dBc for > 1 500 kHz carrier offset.

FREQUENCY HOPPING:

The signal shall be capable of hopping according to the criteria of 3GPP TS 05.02. The timing of the frequency change shall be such that frequency transitions do not occur during the active timeslot of the MS.

A5.3.4.8 The first interfering signal or traffic channel of the first adjacent cell

The First interfering signal is used in measurements of co-channel rejection, adjacent channel rejection and intermodulation rejection. The Traffic channel of the first adjacent cell is used in handover tests.

FREQUENCY:

Uncertainty:

< ±5*10E-9

PHASE:

Uncertainty:

< ±1 degree RMS; and

< ±4 degrees peak(as defined in 3GPP TS 05.05).

LEVEL:

Uncertainty:

< ±1 dB relative to the wanted signal for test 13.2 and 14.5;

< ±0,3 dB relative to the wanted signal for test 14.4, 14.10, 14.11, 14.12 and 14.16.4;

< ±1 dB for test 14.6;

< ±2,5 dB for all other tests.

MODULATION:

GMSK (as specified in 3GPP TS 05.04)

The total relative single sideband power (noise + harmonics) in the frequency range 1,5 MHz to 1,7 MHz offset from the nominal carrier frequency shall be less than -72 dBc.

SPURIOUS:

In channel:

Covered by phase error.

Out channel:

Noise Power, 1 Hz bandwidth:

< -100 dBc for > 100kHz carrier offset;

< -110 dBc for > 300kHz carrier offset;

< -127 dBc for > 1 500kHz carrier offset.

non harmonics:

< -55 dBc for > 100 kHz carrier offset;

< -68 dBc for > 1 500 kHz carrier offset.

FREQUENCY HOPPING:

The signal shall be capable of hopping according to the criteria of 3GPP TS 05.02. The timing of the frequency change shall be such that frequency transitions do not occur during the active timeslot of the MS.

A5.3.4.9 The second interfering signal

The second interfering signal is used in the measurements of intermodulation rejection and blocking.

FREQUENCY:

Uncertainty:

< ±5*10E-9.

LEVEL:

Uncertainty:

< ±1 dB for test 14.6;

< ±1,5 dB relative to the wanted signal for all other tests.

MODULATION:

Unmodulated.

SPURIOUS:

In channel:

No requirements.

Out channel:

Noise Power, 1 Hz bandwidth:

< -135 dBc for > 500kHz carrier offset;

< -140 dBc for > 700kHz carrier offset;

< -150 dBc for > 1 500kHz carrier offset.

Non harmonics:

< -79 dBc for > 500 kHz carrier offset;

< -84 dBc for > 700 kHz carrier offset;

< -94 dBc for > 1 500 kHz carrier offset.

Harmonically related spurii:

< -40 dBc.

A5.3.4.10 BCCH carriers of serving and adjacent cells

The BCCH of the serving cell is used for synchronizing the MS and to send network information to the MS under test. The BCCH signals of the adjacent cells are used in the handover tests. The MS measures the RF-levels of the BCCHs of adjacent cells.

FREQUENCY:

Uncertainty:

< ±5*10E-9.

PHASE:

Uncertainty:

< ±1 degree RMS; and

< ±4 degrees peak(as defined in 3GPP TS 05.05).

LEVEL:

Uncertainty:

< 1 dB for test 13.2 and 20;

< 2,5 dB for all other tests;

< 0,6 dB relative to each other and to TCH for test 21 over the range 65 dBmicroVoltemf to 3 dBmicroVoltemf;

< 1,2 dB relative to each other and to TCH for test 26.3.

MODULATION:

GMSK (as specified in 3GPP TS 05.04).

SPURIOUS:

In channel:

Covered by phase error.

Out channel:

Noise Power, 1Hz bandwidth:

< -100 dBc for > 100 kHz carrier offset;

< -125 dBc for > 1 500 kHz carrier offset.

Non harmonics:

< -55 dBc for > 100 kHz carrier offset;

< -72 dBc for > 1 500 kHz carrier offset.

A5.3.4.11 The wide frequency range signal

The wide frequency range signal is used in the measurements of spurious response.

FREQUENCY

Uncertainty:

< ± 5*10E-9.

LEVEL

Uncertainty:

< ±1,5 dB relative to the wanted signal for test 14.7;

< ±1 dB error of substituted "wanted signal".

MODULATION:

Unmodulated.

SPURIOUS in the MS receiving range:

Non harmonics:

< -94 dBc.

Harmonically related spurii:

< -40 dBc.

Noise:

< -4 dBuVemf equivalent at the MS receiver input when measured in a 200 kHz bandwidth.

A5.3.4.12 The multipath fading function

The multipath fading function simulates the fading effects of a broadband radio channel in mobile radio communication.

The propagation conditions are specified in 3GPP TS 05.05, annex 3.

The multipath fading function shall be performed only within a 5 MHz bandwidth during one test case.

A5.3.5 MS audio interface and DAI

A5.3.5.1 General uncertainties

Unless otherwise specified, the following uncertainties apply to the audio interface:

Signal level measurement uncertainty: ± 0,2 dB;

Sound pressure measurement uncertainty: ± 0,6 dB;

Frequency Measurement uncertainty: ± 0,1 %.

Stimulus frequency setting uncertainty:

Frequency settings are taken from ISO 3, R10 series or R40 series or from table 2 of Rec. ITU-T Recommendation P.79. A departure from the nominal frequencies of ±5 % below 240 Hz and ±2 % at 240 Hz and above is accepted.

In the case of 4 kHz the departure is restricted to -2 %.

A5.3.5.2 Analogue single test tone

Total distortion:

< 0,5 %.

A5.3.5.3 Delay measurement between Um and DAI

The delay measurement between the Um interface of the MS and its DAI in both directions is described in subclause 32.5.

Uncertainty:

< ±0,1 ms.