14 Receiver

3GPP51.010-1Mobile Station (MS) conformance specificationPart 1: Conformance specificationTS

In this clause on receiver measurements, the procedures to test equipment which is fitted with a permanent antenna connector, and the procedures to test equipment which is designed to only be used with an integral antenna, are in general combined into one single test description.

Tests on Mobile Stations fitted with an integral antenna and having no means of connecting an external antenna are specified in terms of received field strength. In order to perform tests on such Mobile Stations without the need for separated access to a calibrated test site a temporary antenna connector is used as defined in annex 1 subclause 1.1.3 (General Conditions).

In practice the temporary antenna connector may be used for transmitter measurements described in clause 3, but the calibration factors determined in annex 1 will not be directly usable. The detailed calibration, when needed, for transmission tests are described in the relevant subclauses of 3.

Wherever in this subclause, for FACCH tests, the SS is required to send a Layer 3 message not requiring a Layer 3 response from the MS the message can be a TEST INTERFACE message or a STATUS message, possibly with an unknown Protocol Discriminator.

Testing philosophy

Certain assumptions concerning the functional mechanisms of GSM receivers have been made in order to define tests that will verify the receiver performance without excessive redundancy and excessive test times.

The receiver functions can be divided into:

– Analogue RF and IF stages that are affected by input levels, temperature and power supply levels.

– Demodulator that is affected by input levels and interfering signals.

– Decoders that are affected by the different logical channels and input levels.

The tests are designed to stress each of these blocks with a minimum of redundancy.

Statistical testing of receiver BER/FER performance

Error Definition

1) Frame Erasure Ratio (FER)

A frame is defined as erased if the error detection functions in the receiver, operating in accordance with 3GPP TS 05.03, indicate an error (BFI = 1). For full rate or half rate speech this is the result of the cyclic redundancy check (CRC) as well as other processing functions that cause a Bad Frame Indication (BFI). For signalling channels it is the result of the FIRE code or any other block code used. For data traffic FER is not defined.

2) Residual Bit Error Ratio (RBER).

The Residual Bit Error Ratio is defined as the Bit Error Ratio (BER) in frames which have not been declared as erased.

3) Bit Error Ratio (BER).

The Bit Error Ratio is defined as the ratio of the bits wrongly received to all data bits sent.

4) Unreliable Frame Ratio (UFR).

The Unreliable Frame Ratio is defined as the ratio of frames declared as erased (BFI=1), or unreliable (UFI=1), to the total number of frames transmitted. An unreliable frame is indicated by setting the UFI flag (UFI=1) and an erased frame is indicated by setting the BFI flag (BFI=1) (see 3GPP TS 06.21).

5) Erased SID Frame Ratio (ESIDR).

A SID Frame is erased (SID=0) when the MS does not detect a valid transmitted SID frame as a valid SID frame (SID=2), or an invalid SID frame (SID=1). The Erased SID Frame Ratio is defined as the ratio of erased SID frames (SID=0), to the total number of valid SID frames transmitted (see 3GPP TS 06.41).

6) Erased Valid SID Frame Ratio (EVSIDR).

An Erased Valid SID Frame is declared when the MS does not detect a valid transmitted SID frame as a valid SID frame (SID=2) and (BFI=0 and UFI=0). The Erased Valid SID Frame Ratio is defined as the ratio of erased valid SID frames (SID=0), or (SID=1), or ((BFI or UFI)=1), to the total number of valid SID frames transmitted (see 3GPP TS 06.41).

7) Erased Valid SID_UPDATE frame Rate associated to an adaptive speech traffic channel (EVSIDUR).

This related to the erasure of a SID_UPDATE frame related to an AMR channel (full rate or half rate) due to the failure to detect the SID_UPDATE identifier or to a due to a CRC failure.

8) Erased Valid RATSCCH Frame Rate associated to an adaptive speech traffic channel (EVRFR).

This relates to the erasure of the RATSCCH message due to the failure to detect the RATSCCH identifier or due to a CRC failure.

9) Frame error rate for the In-Band channel (TCH/AFS-INB or TCH/AHS-INB).

This related to the erasure of an AMR speech frame (full rate or half rate) due to the bad decoding of the Mode Indication in-band bits.

Test method

Each test is performed in the following manner:

a) Set up the required test conditions.

b) Perform the test for at least the minimum number of samples (frames, bits or bits from non erased frames) and record the number of offered samples and the number of occurred events (frame, bit or residual bit errors).

c) Terminate the test and determine the test result ("pass" or "fail") by comparing the measured error rate against the test limit error rate.

It is permitted to run the test over more samples than the value stated for minimum number of samples. The effect of increasing the number of samples is always to give a higher probability that a good unit will pass and a lower risk that a bad unit will pass, according to the definitions of good and bad unit in this subclause.

Test criteria

The limits on number of samples and test limit error rate shall be defined in order to comply with different requirements:

1) to keep reasonably low the risk of passing a bad unit for each individual test;

2) to have high probability of passing a good unit for each individual test;

3) to perform measurements with a high degree of statistical significance;

4) to keep the test time as low as possible.

The risk of passing a bad unit (point 1) should be kept lower than 0,2 %. The performance on a full rate channel, or a half rate data channel, is generally considered "bad" if its BER (or FER) performance is 1,5 times worse than that specified in AWGN (Additive White Gaussian Noise) and 1,26 times worse than that specified in multipath environment. These values have been adopted (taking into account the expected shapes of the BER performance) in order not to pass a unit with performance worse than the specifications by more than 1 dB.

The performance on a half rate speech channel, is generally considered "bad" if the BER (or FER, or UFR) is worse than that specified, multiplied by the factors given in table 14-1. These values have been adopted (taking into account the expected shapes of the BER performance) in order not to pass a unit with performance worse than the specifications by more than 1 dB.

Table 14-1: TCH/HS "bad" unit multiplication factors

GSM 400, GSM 700, T-GSM 810,

GSM 850 and GSM 900

DCS 1 800 and PCS 1 900

Propagation Conditions

TUlow (No FH)

TUhigh (FH/

No FH)

HT

(No FH)

RA

(No FH)

TUlow (No FH)

TUhigh (FH/

No FH)

HT

(No FH)

RA

(No FH)

Reference sensitivity:

TCH/HS FER

1,7

1,7

TCH/HS class Ib (BFI=0)

2,2

2,0

TCH/HS class II (BFI=0)

1,2

1,2

1,2

1,2

1,2

1,2

TCH/HS UFR

2,0

1,9

TCH/HS class Ib (BFI=0 and UFI=0)

1,8

1,7

Reference interference:

TCH/HS FER

1,6

1,6

TCH/HS class Ib (BFI=0)

1,8

1,8

TCH/HS class II (BFI=0)

1,2

1,2

TCH/HS UFR

1,6

1,6

TCH/HS class Ib (BFI or UFI)=0

1,4

1,4

EVSIDR

1,2

1,2

RBER (SID=2 and (BFI or UFI)=0

1,3

1,3

ESIDR

1,3

1,3

RBER (SID=1 or SID=2)

1,3

1,3

The probability of passing a good unit operating on the specification limit of performance (point 2) should be at least 99,7 %.

If the error events can be assumed to be random independent variables, outputs of stationary random processes with identical Gaussian distributions, the previous figures suggest a number of events (point 3) not lower than 200 in AWGN channel and not lower than 600 in a multipath environment, and to test a BER (or FER) performance 1,22 times worse than that specified in AWGN and 1,12 times worse than that specified in a multipath environment (this corresponds to testing a performance, at the most, 0,5 dB worse than that specified).

For multipath propagation conditions the hypothesis of stationary random processes does not generally hold. In case of non frequency hopping operation mode, the radio channel may be assumed to change 10 times per wavelength of travelled distance and to be short term stationary in between. So, in this case, the required observation time for having good statistical properties should not be lower (with some rounding) than that reported in table 14-1.

Table 14-2: Minimum test time according to propagation profile

GSM 400, GSM 700, T-GSM 810,

GSM 850 and GSM 900

DCS 1 800 and PCS 1 900

Propagation Conditions

TUlow

TUhigh

HT

RA

TUlow

TUhigh

HT

RA

Min. test time (s)

500

30

15

6

500

15

7,5

6

Tables 14-3 and 14-4 detail, for the different test conditions, the minimum number of samples required in order to meet points 1) to 3): the corresponding test time (point 4) can be consequently computed.

As can be seen in the tables, in some of the cases in which both FER and RBER have to be tested on the same channel, the length of time for the FER measurement has been adopted for the RBER measurement. This is longer than that required for the RBER only according to the discussed criteria, but allows the use of a test limit error rate closer to the specified error rate while maintaining the same statistical significance. When, as is normal, it is desired to perform the FER and RBER tests, the closer test limit error rate for the RBER measurement can be achieved without increasing the total test time. It is always possible to extend the length of any test and further improve the statistical significance of that test.

Co-channel rejection tests with a frequency condition noted as "@ndB" are performed with the interfering frequency transmitted with an additional n dB attenuation, see 3GPP TS 45.005.

Table 14-3: Test conditions for GSM 400, GSM 700, T-GSM 810, GSM 850 and GSM 900

Type of test

Type of channel

Propagation/ frequency conditions

Specified FER/ BER

%

Test limit FER/ BER

%

Minimum No of samples

Prob that good unit will pass %

Bad unit BER/ FER

%

Risk that bad unit will pass

BFI

TCH/FS

Static

0,033

0,041

492000

99,813

0,050

0,140

TCH/FS

Static / FH

0,033

0,041

492000

99,813

0,050

0,140

TCH/AFS

Static

0,033

0,041

492000

99,813

0,050

0,140

TCH/AHS

Static

0,033

0,041

492000

99,813

0,050

0,140

Sensitivity

TCH/FS

Static/FH

0,100*

0,122*

164000

99,717

0,150*

0,140

,,

TCH/FS Class Ib

Static/FH

0,400/

0,410/

20000000

100,000

0,600/

<0,001

,,

TCH/FS Class II

Static/FH

2,000

2,439

8200

99,714

3,000

0,001

,,

TCH/FS

TUhigh/No FH

6,000*

6,742*

8900

99,825

7,560*

0,162

,,

TCH/FS Class Ib

TUhigh/No FH

0,400/

0,420/

1000000

99,919

0,504/

<0,001

,,

TCH/FS Class II

TUhigh/No FH

8,000

8,333

120000

99,999

10,080

<0,001

,,

TCH/FS Class II

HT/No FH

9,000

9,333

60000

99,779

11,340

<0,001

,,

TCH/FS Class II

RA/No FH

7,000

7,500

24000

99,873

8,694

<0,001

,,

TCH/EFS

Static/FH

0,100

0,122

164000

99,758

0,150

0,171

,,

TCH/EFS Class Ib

Static/FH

0,100

0,110

20000000

100

0,150

<0,001

,,

TCH/EFS Class II

Static/FH

2,000

2,439

8200

99,753

3,000

0,168

,,

TCH/EFS

TUhigh/No FH

8,000

8,867

8900

99,808

10,080

0,016

,,

TCH/EFS Class Ib

TUhigh/No FH

0,210

0,224

1000000

99,887

0,265

<0,001

,,

TCH/EFS Class II

TUhigh/No FH

7,000

7,500

120000

99,999

8,820

<0,001

,,

TCH/EFS Class II

HT/No FH

9,000

9,350

60000

99,787

11,340

<0,001

,,

TCH/EFS Class II

RA/No FH

7,000

7,500

24000

99,829

8,820

<0,001

,,

TCH/HS (FER)

TUhigh/No FH

4,100

4,598

13050

99,776

6,970

<0,001

,,

TCH/HS Class Ib (BFI=0)

TUhigh/No FH

0,360

0,404

148500

99,750

0,792

<0,001

,,

TCH/HS Class II (BFI=0)

TUhigh/No FH

6,900

7,725

25500

100,00

8,280

0,061

,,

TCH/HS Class II (BFI=0)

HT/No FH

7,600

8,500

20000

100,00

9,120

0,110

,,

TCH/HS Class II (BFI=0)

RA/No FH

6,800

7,600

20000

100,00

8,160

0,182

,,

TCH/HS (UFR)

TUhigh/No FH

5,600

6,250

9600

99,702

11,200

<0,001

"

TCH/AFS-INB (FER)

TUhigh/No FH

0,034

0.047

150000

99.733

0.068

0.103

"

TCH/AHS-INB (FER)

TUhigh/No FH

0.720

0.806

74000

99.728

0.907

0.191

,,

FACCH/F

TUhigh/No FH

8,000

8,961

6696

99,798

10,080

0,108

,,

FACCH/H

TUhigh/No FH

6,900

7,728

7764

99,785

8,694

0,115

,,

TCH/F9,6andH4,8

HT/No FH

0,700

0,778

180000

99,995

0,882

<0,001

,,

TCH/F4,8

HT/No FH

0,010

0,011

5350000

99,732

0,013

0,197

,,

TCH/F2,4

HT/No FH

0,001

0,001

11900000

99,734

0,002

<0,001

,,

TCH/H2,4

HT/No FH

0,010

0,011

5350000

99,732

0,013

0,197

Input level

TCH/FS Class II

Static<-40dBm

0,010

0,012

1640000

99,716

0,015

0,141

Input level

TCH/FS Class II

Static<-15dBm

0,100

0,122

164000

99,717

0,150

0,140

range

TCH/FS Class II

EQ

3,000

3,250

120000

100,000

3,780

<0,001

Co-channel

TCH/FS

TUlow/No FH

21,000*

24,000*

25000

100,000

27,720*

<0,001

rejection

TCH/FS Class Ib

TUlow/No FH

2,000/

2,091/

3300000

100,000

2,520/

<0,001

,,

TCH/FS Class II

TUlow/No FH

4,000

4,300

2000000

100,000

5,040

<0,001

,,

TCH/FS

TUhigh/FH

3,000*

3,371*

17800

99,797

3,780*

0,194

,,

TCH/FS Class Ib

TUhigh/FH

0,200/

0,215/

2000000

100,000

0,252/

<0,001

,,

TCH/FS Class II

TUhigh/FH

8,000

8,333

1200000

100,000

10,080

<0,001

,,

TCH/EFS

TUlow/No FH

23,000

24,000

25000

99,951

27,720

<0,001

,,

TCH/EFS Class Ib

TUlow/No FH

0,2000

0,209

3300000

99,987

0,252

<0,001

,,

TCH/EFS Class II

TUlow/No FH

3,000

3,039

2000000

99,927

3,780

<0,001

,,

TCH/EFS

TUhigh/FH

3,000

3,357

17800

99,702

3,780

0,185

,,

TCH/EFS Class Ib

TUhigh/FH

0,100

0,115

2000000

100,00

0,126

<0,001

,,

TCH/EFS Class II

TUhigh/FH

8,000

8,333

1200000

99,998

10,08

<0,001

"

TCH/AFS-INB (FER)

TUhigh/FH@-3 dB

0,160

0.189

150000

99.737

0.224

0.197

"

TCH/AHS 7.95 (FER)

TUhigh/NoFH@3dB

6,700

8.44

8960

"

TCH/AHS-INB (FER)

TUhigh/No FH

0.700

0.784

76000

99.726

0.882

0.193

"

O-TCH/AHS-INB (FER)

TUhigh/No FH

10.500

11.760

5102

99.822

13.230

0.089

,,

FACCH/F

TUlow/No FH

22,000

24,000

25000

100,000

27,720

<0,001

,,

FACCH/H

TUlow/No FH

22,000

24,000

25000

100,000

27,720

<0,001

,,

TCH/F9,6 or H4,8

TUhigh/FH

0,300

0,336

178500

99,716

0,378

0,180

,,

TCH/F4,8

TUhigh/FH

0,010

0,011

5350000

99,732

0,013

0,197

,,

TCH/F2,4

TUhigh/FH

0,001

0,001

11900000

99,734

0,002

<0,001

,,

TCH/H2,4

TUhigh/FH

0,010

0,011

5350000

99,732

0,013

0,197

Adjacent

TCH/FS

TUhigh/No FH

6,000*

6,742*

8900

99,825

7,560*

0,162

channel

TCH/FS Class Ib

TUhigh/No FH

0,400/

0,420/

1000000

99,919

0,504/

<0,001

200 kHz

TCH/FS Class II

TUhigh/No FH

8,000

8,333

600000

100,000

10,080

<0,001

,,

TCH/HS (FER)

TUhigh/FH

5,000

5,607

10700

99,787

8,000

<0,001

,,

TCH/HS Class Ib (BFI=0)

TUhigh/FH

0,290

0,325

184700

99,711

0,522

<0,001

,,

TCH/HS Class II (BFI=0)

TUhigh/FH

7,100

7,961

25500

100,00

8,520

0,065

,,

TCH/HS (UFR)

TUhigh/FH

6,100

6,834

8780

99,781

9,760

<0,001

,,

TCH/HS Class Ib (BFI or UFI)=0

TUhigh/FH

0,210

0,235

255000

99,715

0,294

<0,001

,,

EVSIDR

TUlow/No FH

21,900

24,000

25000

100,000

26,280

<0,001

,,

SID RBER (SID=2 and (BFI or UFI=0)

TUlow/No FH

0,020

0,022

2678500

99,705

0,026

0,010

,,

ESIDR

TUlow/No FH

17,100

19,152

25000

100,000

22,230

<0,001

,,

SID RBER (SID=1 or SID=2)

TUlow/No FH

0,500

0,560

500000

100,000

0,650

<0,001

,,

FACCH/F

TUhigh/No FH

9,500

10,640

5639

99,812

11,970

0,096

Adjacent

TCH/FS

TUhigh/No FH

10,200*

11,461*

8900

99,995

12,852*

0,004

channel

TCH/FS Class Ib

TUhigh/No FH

0,720/

0,756/

1000000

99,999

0,9077/

<0,001

400 kHz

TCH/FS Class II

TUhigh/No FH

8,800

9,167

600000

100,000

11,088

<0,001

,,

FACCH/F

TUhigh/No FH

17,100

19,152

3133

99,878

21,546

<0,052

Intermod.

TCH/FS Class II

Static

2,000

2,439

8200

99,741

3,000

0,122

FACCH/F

TUhigh/No FH

8,000

8,961

6696

99,798

10,080

0,108

Blocking and

TCH/FS Class II

Static

2,000

2,439

8200

99,741

4,000

<0,001

spurious resp.

FACCH/F

TUhigh/No FH

8,000

8,961

6696

99,798

10,080

0,108

Table 14-4: Test conditions for DCS 1 800 DCS 1 800 and PCS 1 900

Type of test

Type of channel

Propagation/ Frequency conditions

Specified

Test limit FER/BER

%

Mini-mum No of samples

Prob that good unit will pass %

Bad unit FER/BER

%

Risk that bad unit will pass

BFI

TCH/FS

Static

0,033

0,041

492000

99,813

0,050

0,140

TCH/FS

Static/FH

0,033

0,041

492000

99,813

0,050

0,140

TCH/AFS

Static/FH

0,033

0,041

492000

99,813

0,050

0,140

TCH/AHS

Static/FH

0,033

0,041

492000

99,813

0,050

0,140

Sensitivity

TCH/FS

Static/FH

0,100*

0,122*

164000

99,717

0,150*

0,140

,,

TCH/FS Class Ib

Static/FH

0,400/

0,410/

20000000

100,000

0,600/

<0,001

,,

TCH/FS Class II

Static/FH

2,000

2,439

8200

99,714

3,000

0,001

,,

TCH/FS

Tuhigh/No FH

4,000*

4,478*

13400

99,743

5,040*

0,133

,,

TCH/FS Class Ib

Tuhigh/No FH

0,300/

0,320/

1500000

100,000

0,378/

<0,001

,,

TCH/FS Class II

Tuhigh/No FH

8,000

8,333

60000

99,865

10,080

<0,001

,,

TCH/FS Class II

HT/No FH

9,000

9,333

30000

97,826

11,340

<0,001

,,

TCH/FS Class II

RA/No FH

7,000

7,500

24000

99,873

8,820

<0,001

,,

TCH/EFS

Static/FH

0,100

0,122

164000

99,758

0,150

0,171

,,

TCH/EFS Class Ib

Static/FH

0,100

0,110

20000000

100,00

0,150

<0,001

,,

TCH/EFS Class II

Static/FH

2,000

2,439

8200

99,753

3,000

0,168

,,

TCH/EFS

Tuhigh/No FH

4,000

4,475

13400

99,701

5,040

0,179

,,

TCH/EFS Class Ib

Tuhigh/No FH

0,120

0,130

1500000

99,979

0,151

<0,001

,,

TCH/EFS Class II

Tuhigh/No FH

8,000

8,333

60000

99,804

10,080

<0,001

,,

TCH/EFS Class II

HT/No FH

9,000

9,498

30000

99,798

11,340

<0,001

,,

TCH/EFS Class II

RA/No FH

7,000

7,500

24000

99,829

8,820

<0,001

,,

TCH/HS (FER)

Tuhigh/No FH

4,200

4,706

12750

99,763

7,140

<0,001

,,

TCH/HS Class Ib (BFI=0)

Tuhigh/No FH

0,380

0,426

141000

99,706

0,760

<0,001

,,

TCH/HS Class II (BFI=0)

Tuhigh/No FH

6,900

7,725

25500

100,00

8,280

0,061

,,

TCH/HS Class II (BFI=0)

HT/No FH

7,800

8,735

20000

100,00

9,360

0,114

,,

TCH/HS Class II (BFI=0)

RA/No FH

6,800

7,600

20000

100,00

8,160

0,182

,,

TCH/HS (UFR)

Tuhigh/No FH

5,700

6,383

9400

99,769

10,830

<0,001

,,

TCH/HS Class Ib

(BFI or UFI0=0)

Tuhigh/No FH

0,260

0,291

206000

99,712

0,442

<0,001

,,

TCH/AHS-INB (FER)

Tuhigh/No FH

0,640

0.717

83000

99.724

0.806

0.195

,,

FACCH/F

TUhigh/No FH

3,900

4,368

13736

99,752

4,914

0,140

,,

FACCH/H

TUhigh/No FH

7,200

7,752

7440

97,027

9,072

0,002]

,,

TCH/F9,6

HT/No FH

0,700

0,784

76500

99,721

0,882

0,176

,,

TCH/F4,8

HT/No FH

0,010

0,011

5350000

99,732

0,013

0,197

,,

TCH/F2,4

HT/No FH

0,001

0,001

11900000

99,734

0,002

<0,001

Input level

TCH/FS Class II

Static-23dBm

0,100

0,122

164000

99,717

0,150

0,140

range

TCH/FS Class II

Static<-40dBm

0,010

0,012

1640000

99,716

0,015

0,141

TCH/FS Class II

EQ

3,000

3,250

60000

99,981

3,780

<0,001

Co-channel

TCH/FS

TUlow/No FH

21,00*

24,00*

25000

100,000

26,460*

<0,001

rejection

TCH/FS Class Ib

TUlow/No FH

2,000/

2,091/

3300000

100,000

2,520/

<0,001

,,

TCH/FS Class II

TUlow/No FH

4,000

4,300

2000000

100,000

5,040

<0,001

,,

TCH/FS

TUhigh/FH

3,000*

3,371*

17800

99,797

3,780*

0,194

,,

TCH/FS Class Ib

TUhigh/FH

0,200/

0,215/

2000000

100,000

0,252/

<0,001

,,

TCH/FS Class II

TUhigh/FH

8,000

8,333

1200000

100,000

10,080

<0,001

,,

TCH/EFS

TUlow/No FH

23,000

24,000

25000

99,999

26,680

<0,001

,,

TCH/EFS Class Ib

TUlow/No FH

0,200

0,209

3300000

100,000

0,252

<0,001

,,

TCH/EFS Class II

TUlow/No FH

3,000

3,039

2000000

100,000

3,780

<0,001

,,

TCH/EFS

TUhigh/FH

3,000

3,357

17800

99,815

3,780

0,185

,,

TCH/EFS Class Ib

TUhigh/FH

0,100

0,115

2000000

99,999

0,126

<0,001

,,

TCH/EFS Class II

TUhigh/FH

8,000

8,333

1200000

100,00

10,08

<0,001

,,

TCH/AFS-INB (FER)

TUlow/No FH@-3 dB

3.500

3.920

15000

99.744

4.410

0.173

,,

TCH/AFS-INB (FER)

TUhigh/FH@-3 dB

0.120

0.145

150000

99.759

0.180

0.074

,,

TCH/AHS-INB (FER)

TUhigh/No FH

0.710

0.795

75000

99.727

0.895

0.192

,,

O-TCH/HS-INB (FER)

Tuhigh/No FH

11.000

12.320

4870

99.827

13.860

0.086

,,

FACCH/F

TUlow/No FH

22,000

24,000

25000

100,000

27,720

<0,001

,,

FACCH/H

TUlow/No FH

22,000

24,000

25000

100,000

27,720

<0,001

,,

TCH/F9,6 or H4,8

TUhigh/FH

0,300

0,336

178500

99,716

0,378

0,180

,,

TCH/F4,8

TUhigh/FH

0,010

0,011

5350000

99,732

0,013

0,197

,,

TCH/F2,4

TUhigh/FH

0,001

0,001

11900000

99,734

0,002

<0,001

,,

TCH/H2,4

TUhigh/FH

0,010

0,011

5350000

99,732

0,013

0,197

Adjacent

TCH/FS

TUhigh/No FH

3,000*

3,371*

17800

99,797

3,780*

0,194

channel

TCH/FS Class Ib

TUhigh/No FH

0,250/

0,270/

2000000

100,000

0,315/

<0,001

200 kHz

TCH/FS Class II

TUhigh/No FH

8,100

8,333

1200000

100,000

10,206

<0,001

,,

TCH/HS (FER)

TUhigh/FH

5,000

5,607

10700

99,787

8,000

<0,001

,,

TCH/HS Class Ib (BFI=0)

TUhigh/FH

0,290

0,325

184700

99,711

0,522

<0,001

,,

TCH/HS Class II (BFI=0)

TUhigh/FH

7,200

8,078

25500

100,00

8,640

0,066

,,

TCH/HS (UFR)

TUhigh/FH

6,100

6,834

8780

99,781

9,760

<0,001

,,

TCH/HS Class Ib ((BFI or UFI)=0)

TUhigh/FH

0,210

0,235

255000

99,715

0,294

<0,001

,,

EVSIDR

TUlow/No FH

21,900

24,000

25000

100,000

26,280

<0,001

,,

SID RBER (SID=2 and (BFI or UFI)=0)

TUlow/No FH

0,020

0,022

2678500

99,705

0,026

0,010

,,

ESIDR

TUlow/No FH

17,100

19,152

25000

100,000

22,230

<0,001

,,

SID RBER (SID=1 or SID=2)

TUlow/No FH

0,500

0,560

500000

100,000

0,650

<0,001

,,

FACCH/F

TUhigh/No FH

3,400

3,808

15756

99,746

4,284

0,145

Adjacent

TCH/FS

TUhigh/No FH

5,100*

5,714*

10500

99,773

6,426*

0,134

channel

TCH/FS Class Ib

TUhigh/No FH

0,450/

0,483/

1200000

100,000

0,567/

<0,001

400 kHz

TCH/FS Class II

TUhigh/No FH

8,900

9,167

720000

100,000

11,214

<0,001

,,

FACCH/F

TUhigh/No FH

6,100

6,832

8782

99,777

7,686

0,122

Intermod,

TCH/FS Class II

Static

2,000

2,439

8200

99,741

3,000

0,122

FACCH/F

TUhigh/No FH

3,900

4,368

13736

99,752

4,914

0,140

Blocking and

TCH/FS Class II

Static

2,000

2,439

8200

99,741

4,000

<0,001

spurious resp.

FACCH/F

TUhigh/No FH

3,900

4,368

13736

99,752

4,914

0,140

NOTE 1:  is a parameter which ranges from 1 to 1,6. The value of  for a RBER test on TCH/FS class Ib bits under particular measurement conditions shall be the same as that determined in the FER test on TCH/FS under the same conditions. For example, the value of  may be different for a TUhigh sensitivity test and an RA sensitivity test. The value of  is determined by dividing the measured error rate for the FER test by the value of the test limit error rate listed in the limits section of the test corresponding to =1; if the result of the division is lower than 1, a value of =1 shall be used, if the value of  > 1,6 the FER test has failed (the normal treatment of stimulus uncertainties applies). The probabilities that a good unit will pass and the risks that a bad unit will pass, listed in the table are valid for =1, and would be slightly different for other values of .

NOTE 2: In order to save time the sensitivity and co-channel rejection tests for the TCH/F2,4 channel does not comply with the above said constraints.

In fact, a bad unit which performs 2 times (instead of 1,26) worse than that specified is accounted for, so reducing the required number of events to 150, instead of 600. On the other hand, the specified RBER is in this case 10E-5 and, on the basis of simulations and hardware validation results, doubling this RBER results in a drop in performance of less than 1 dB.