14 Receiver
3GPP51.010-1Mobile Station (MS) conformance specificationPart 1: Conformance specificationTS
In this clause on receiver measurements, the procedures to test equipment which is fitted with a permanent antenna connector, and the procedures to test equipment which is designed to only be used with an integral antenna, are in general combined into one single test description.
Tests on Mobile Stations fitted with an integral antenna and having no means of connecting an external antenna are specified in terms of received field strength. In order to perform tests on such Mobile Stations without the need for separated access to a calibrated test site a temporary antenna connector is used as defined in annex 1 subclause 1.1.3 (General Conditions).
In practice the temporary antenna connector may be used for transmitter measurements described in clause 3, but the calibration factors determined in annex 1 will not be directly usable. The detailed calibration, when needed, for transmission tests are described in the relevant subclauses of 3.
Wherever in this subclause, for FACCH tests, the SS is required to send a Layer 3 message not requiring a Layer 3 response from the MS the message can be a TEST INTERFACE message or a STATUS message, possibly with an unknown Protocol Discriminator.
Testing philosophy
Certain assumptions concerning the functional mechanisms of GSM receivers have been made in order to define tests that will verify the receiver performance without excessive redundancy and excessive test times.
The receiver functions can be divided into:
– Analogue RF and IF stages that are affected by input levels, temperature and power supply levels.
– Demodulator that is affected by input levels and interfering signals.
– Decoders that are affected by the different logical channels and input levels.
The tests are designed to stress each of these blocks with a minimum of redundancy.
Statistical testing of receiver BER/FER performance
Error Definition
1) Frame Erasure Ratio (FER)
A frame is defined as erased if the error detection functions in the receiver, operating in accordance with 3GPP TS 05.03, indicate an error (BFI = 1). For full rate or half rate speech this is the result of the cyclic redundancy check (CRC) as well as other processing functions that cause a Bad Frame Indication (BFI). For signalling channels it is the result of the FIRE code or any other block code used. For data traffic FER is not defined.
2) Residual Bit Error Ratio (RBER).
The Residual Bit Error Ratio is defined as the Bit Error Ratio (BER) in frames which have not been declared as erased.
3) Bit Error Ratio (BER).
The Bit Error Ratio is defined as the ratio of the bits wrongly received to all data bits sent.
4) Unreliable Frame Ratio (UFR).
The Unreliable Frame Ratio is defined as the ratio of frames declared as erased (BFI=1), or unreliable (UFI=1), to the total number of frames transmitted. An unreliable frame is indicated by setting the UFI flag (UFI=1) and an erased frame is indicated by setting the BFI flag (BFI=1) (see 3GPP TS 06.21).
5) Erased SID Frame Ratio (ESIDR).
A SID Frame is erased (SID=0) when the MS does not detect a valid transmitted SID frame as a valid SID frame (SID=2), or an invalid SID frame (SID=1). The Erased SID Frame Ratio is defined as the ratio of erased SID frames (SID=0), to the total number of valid SID frames transmitted (see 3GPP TS 06.41).
6) Erased Valid SID Frame Ratio (EVSIDR).
An Erased Valid SID Frame is declared when the MS does not detect a valid transmitted SID frame as a valid SID frame (SID=2) and (BFI=0 and UFI=0). The Erased Valid SID Frame Ratio is defined as the ratio of erased valid SID frames (SID=0), or (SID=1), or ((BFI or UFI)=1), to the total number of valid SID frames transmitted (see 3GPP TS 06.41).
7) Erased Valid SID_UPDATE frame Rate associated to an adaptive speech traffic channel (EVSIDUR).
This related to the erasure of a SID_UPDATE frame related to an AMR channel (full rate or half rate) due to the failure to detect the SID_UPDATE identifier or to a due to a CRC failure.
8) Erased Valid RATSCCH Frame Rate associated to an adaptive speech traffic channel (EVRFR).
This relates to the erasure of the RATSCCH message due to the failure to detect the RATSCCH identifier or due to a CRC failure.
9) Frame error rate for the In-Band channel (TCH/AFS-INB or TCH/AHS-INB).
This related to the erasure of an AMR speech frame (full rate or half rate) due to the bad decoding of the Mode Indication in-band bits.
Test method
Each test is performed in the following manner:
a) Set up the required test conditions.
b) Perform the test for at least the minimum number of samples (frames, bits or bits from non erased frames) and record the number of offered samples and the number of occurred events (frame, bit or residual bit errors).
c) Terminate the test and determine the test result ("pass" or "fail") by comparing the measured error rate against the test limit error rate.
It is permitted to run the test over more samples than the value stated for minimum number of samples. The effect of increasing the number of samples is always to give a higher probability that a good unit will pass and a lower risk that a bad unit will pass, according to the definitions of good and bad unit in this subclause.
Test criteria
The limits on number of samples and test limit error rate shall be defined in order to comply with different requirements:
1) to keep reasonably low the risk of passing a bad unit for each individual test;
2) to have high probability of passing a good unit for each individual test;
3) to perform measurements with a high degree of statistical significance;
4) to keep the test time as low as possible.
The risk of passing a bad unit (point 1) should be kept lower than 0,2 %. The performance on a full rate channel, or a half rate data channel, is generally considered "bad" if its BER (or FER) performance is 1,5 times worse than that specified in AWGN (Additive White Gaussian Noise) and 1,26 times worse than that specified in multipath environment. These values have been adopted (taking into account the expected shapes of the BER performance) in order not to pass a unit with performance worse than the specifications by more than 1 dB.
The performance on a half rate speech channel, is generally considered "bad" if the BER (or FER, or UFR) is worse than that specified, multiplied by the factors given in table 14-1. These values have been adopted (taking into account the expected shapes of the BER performance) in order not to pass a unit with performance worse than the specifications by more than 1 dB.
Table 14-1: TCH/HS "bad" unit multiplication factors
GSM 400, GSM 700, T-GSM 810, GSM 850 and GSM 900 |
DCS 1 800 and PCS 1 900 |
|||||||
Propagation Conditions |
TUlow (No FH) |
TUhigh (FH/ No FH) |
HT (No FH) |
RA (No FH) |
TUlow (No FH) |
TUhigh (FH/ No FH) |
HT (No FH) |
RA (No FH) |
Reference sensitivity: |
||||||||
TCH/HS FER |
1,7 |
1,7 |
||||||
TCH/HS class Ib (BFI=0) |
2,2 |
2,0 |
||||||
TCH/HS class II (BFI=0) |
1,2 |
1,2 |
1,2 |
1,2 |
1,2 |
1,2 |
||
TCH/HS UFR |
2,0 |
1,9 |
||||||
TCH/HS class Ib (BFI=0 and UFI=0) |
1,8 |
1,7 |
||||||
Reference interference: |
||||||||
TCH/HS FER |
1,6 |
1,6 |
||||||
TCH/HS class Ib (BFI=0) |
1,8 |
1,8 |
||||||
TCH/HS class II (BFI=0) |
1,2 |
1,2 |
||||||
TCH/HS UFR |
1,6 |
1,6 |
||||||
TCH/HS class Ib (BFI or UFI)=0 |
1,4 |
1,4 |
||||||
EVSIDR |
1,2 |
1,2 |
||||||
RBER (SID=2 and (BFI or UFI)=0 |
1,3 |
1,3 |
||||||
ESIDR |
1,3 |
1,3 |
||||||
RBER (SID=1 or SID=2) |
1,3 |
1,3 |
The probability of passing a good unit operating on the specification limit of performance (point 2) should be at least 99,7 %.
If the error events can be assumed to be random independent variables, outputs of stationary random processes with identical Gaussian distributions, the previous figures suggest a number of events (point 3) not lower than 200 in AWGN channel and not lower than 600 in a multipath environment, and to test a BER (or FER) performance 1,22 times worse than that specified in AWGN and 1,12 times worse than that specified in a multipath environment (this corresponds to testing a performance, at the most, 0,5 dB worse than that specified).
For multipath propagation conditions the hypothesis of stationary random processes does not generally hold. In case of non frequency hopping operation mode, the radio channel may be assumed to change 10 times per wavelength of travelled distance and to be short term stationary in between. So, in this case, the required observation time for having good statistical properties should not be lower (with some rounding) than that reported in table 14-1.
Table 14-2: Minimum test time according to propagation profile
GSM 400, GSM 700, T-GSM 810, GSM 850 and GSM 900 |
DCS 1 800 and PCS 1 900 |
|||||||
Propagation Conditions |
TUlow |
TUhigh |
HT |
RA |
TUlow |
TUhigh |
HT |
RA |
Min. test time (s) |
500 |
30 |
15 |
6 |
500 |
15 |
7,5 |
6 |
Tables 14-3 and 14-4 detail, for the different test conditions, the minimum number of samples required in order to meet points 1) to 3): the corresponding test time (point 4) can be consequently computed.
As can be seen in the tables, in some of the cases in which both FER and RBER have to be tested on the same channel, the length of time for the FER measurement has been adopted for the RBER measurement. This is longer than that required for the RBER only according to the discussed criteria, but allows the use of a test limit error rate closer to the specified error rate while maintaining the same statistical significance. When, as is normal, it is desired to perform the FER and RBER tests, the closer test limit error rate for the RBER measurement can be achieved without increasing the total test time. It is always possible to extend the length of any test and further improve the statistical significance of that test.
Co-channel rejection tests with a frequency condition noted as "@ndB" are performed with the interfering frequency transmitted with an additional n dB attenuation, see 3GPP TS 45.005.
Table 14-3: Test conditions for GSM 400, GSM 700, T-GSM 810, GSM 850 and GSM 900
Type of test |
Type of channel |
Propagation/ frequency conditions |
Specified FER/ BER % |
Test limit FER/ BER % |
Minimum No of samples |
Prob that good unit will pass % |
Bad unit BER/ FER % |
Risk that bad unit will pass |
---|---|---|---|---|---|---|---|---|
BFI |
TCH/FS |
Static |
0,033 |
0,041 |
492000 |
99,813 |
0,050 |
0,140 |
TCH/FS |
Static / FH |
0,033 |
0,041 |
492000 |
99,813 |
0,050 |
0,140 |
|
TCH/AFS |
Static |
0,033 |
0,041 |
492000 |
99,813 |
0,050 |
0,140 |
|
TCH/AHS |
Static |
0,033 |
0,041 |
492000 |
99,813 |
0,050 |
0,140 |
|
Sensitivity |
TCH/FS |
Static/FH |
0,100* |
0,122* |
164000 |
99,717 |
0,150* |
0,140 |
,, |
TCH/FS Class Ib |
Static/FH |
0,400/ |
0,410/ |
20000000 |
100,000 |
0,600/ |
<0,001 |
,, |
TCH/FS Class II |
Static/FH |
2,000 |
2,439 |
8200 |
99,714 |
3,000 |
0,001 |
,, |
TCH/FS |
TUhigh/No FH |
6,000* |
6,742* |
8900 |
99,825 |
7,560* |
0,162 |
,, |
TCH/FS Class Ib |
TUhigh/No FH |
0,400/ |
0,420/ |
1000000 |
99,919 |
0,504/ |
<0,001 |
,, |
TCH/FS Class II |
TUhigh/No FH |
8,000 |
8,333 |
120000 |
99,999 |
10,080 |
<0,001 |
,, |
TCH/FS Class II |
HT/No FH |
9,000 |
9,333 |
60000 |
99,779 |
11,340 |
<0,001 |
,, |
TCH/FS Class II |
RA/No FH |
7,000 |
7,500 |
24000 |
99,873 |
8,694 |
<0,001 |
,, |
TCH/EFS |
Static/FH |
0,100 |
0,122 |
164000 |
99,758 |
0,150 |
0,171 |
,, |
TCH/EFS Class Ib |
Static/FH |
0,100 |
0,110 |
20000000 |
100 |
0,150 |
<0,001 |
,, |
TCH/EFS Class II |
Static/FH |
2,000 |
2,439 |
8200 |
99,753 |
3,000 |
0,168 |
,, |
TCH/EFS |
TUhigh/No FH |
8,000 |
8,867 |
8900 |
99,808 |
10,080 |
0,016 |
,, |
TCH/EFS Class Ib |
TUhigh/No FH |
0,210 |
0,224 |
1000000 |
99,887 |
0,265 |
<0,001 |
,, |
TCH/EFS Class II |
TUhigh/No FH |
7,000 |
7,500 |
120000 |
99,999 |
8,820 |
<0,001 |
,, |
TCH/EFS Class II |
HT/No FH |
9,000 |
9,350 |
60000 |
99,787 |
11,340 |
<0,001 |
,, |
TCH/EFS Class II |
RA/No FH |
7,000 |
7,500 |
24000 |
99,829 |
8,820 |
<0,001 |
,, |
TCH/HS (FER) |
TUhigh/No FH |
4,100 |
4,598 |
13050 |
99,776 |
6,970 |
<0,001 |
,, |
TCH/HS Class Ib (BFI=0) |
TUhigh/No FH |
0,360 |
0,404 |
148500 |
99,750 |
0,792 |
<0,001 |
,, |
TCH/HS Class II (BFI=0) |
TUhigh/No FH |
6,900 |
7,725 |
25500 |
100,00 |
8,280 |
0,061 |
,, |
TCH/HS Class II (BFI=0) |
HT/No FH |
7,600 |
8,500 |
20000 |
100,00 |
9,120 |
0,110 |
,, |
TCH/HS Class II (BFI=0) |
RA/No FH |
6,800 |
7,600 |
20000 |
100,00 |
8,160 |
0,182 |
,, |
TCH/HS (UFR) |
TUhigh/No FH |
5,600 |
6,250 |
9600 |
99,702 |
11,200 |
<0,001 |
" |
TCH/AFS-INB (FER) |
TUhigh/No FH |
0,034 |
0.047 |
150000 |
99.733 |
0.068 |
0.103 |
" |
TCH/AHS-INB (FER) |
TUhigh/No FH |
0.720 |
0.806 |
74000 |
99.728 |
0.907 |
0.191 |
,, |
FACCH/F |
TUhigh/No FH |
8,000 |
8,961 |
6696 |
99,798 |
10,080 |
0,108 |
,, |
FACCH/H |
TUhigh/No FH |
6,900 |
7,728 |
7764 |
99,785 |
8,694 |
0,115 |
,, |
TCH/F9,6andH4,8 |
HT/No FH |
0,700 |
0,778 |
180000 |
99,995 |
0,882 |
<0,001 |
,, |
TCH/F4,8 |
HT/No FH |
0,010 |
0,011 |
5350000 |
99,732 |
0,013 |
0,197 |
,, |
TCH/F2,4 |
HT/No FH |
0,001 |
0,001 |
11900000 |
99,734 |
0,002 |
<0,001 |
,, |
TCH/H2,4 |
HT/No FH |
0,010 |
0,011 |
5350000 |
99,732 |
0,013 |
0,197 |
Input level |
TCH/FS Class II |
Static<-40dBm |
0,010 |
0,012 |
1640000 |
99,716 |
0,015 |
0,141 |
Input level |
TCH/FS Class II |
Static<-15dBm |
0,100 |
0,122 |
164000 |
99,717 |
0,150 |
0,140 |
range |
TCH/FS Class II |
EQ |
3,000 |
3,250 |
120000 |
100,000 |
3,780 |
<0,001 |
Co-channel |
TCH/FS |
TUlow/No FH |
21,000* |
24,000* |
25000 |
100,000 |
27,720* |
<0,001 |
rejection |
TCH/FS Class Ib |
TUlow/No FH |
2,000/ |
2,091/ |
3300000 |
100,000 |
2,520/ |
<0,001 |
,, |
TCH/FS Class II |
TUlow/No FH |
4,000 |
4,300 |
2000000 |
100,000 |
5,040 |
<0,001 |
,, |
TCH/FS |
TUhigh/FH |
3,000* |
3,371* |
17800 |
99,797 |
3,780* |
0,194 |
,, |
TCH/FS Class Ib |
TUhigh/FH |
0,200/ |
0,215/ |
2000000 |
100,000 |
0,252/ |
<0,001 |
,, |
TCH/FS Class II |
TUhigh/FH |
8,000 |
8,333 |
1200000 |
100,000 |
10,080 |
<0,001 |
,, |
TCH/EFS |
TUlow/No FH |
23,000 |
24,000 |
25000 |
99,951 |
27,720 |
<0,001 |
,, |
TCH/EFS Class Ib |
TUlow/No FH |
0,2000 |
0,209 |
3300000 |
99,987 |
0,252 |
<0,001 |
,, |
TCH/EFS Class II |
TUlow/No FH |
3,000 |
3,039 |
2000000 |
99,927 |
3,780 |
<0,001 |
,, |
TCH/EFS |
TUhigh/FH |
3,000 |
3,357 |
17800 |
99,702 |
3,780 |
0,185 |
,, |
TCH/EFS Class Ib |
TUhigh/FH |
0,100 |
0,115 |
2000000 |
100,00 |
0,126 |
<0,001 |
,, |
TCH/EFS Class II |
TUhigh/FH |
8,000 |
8,333 |
1200000 |
99,998 |
10,08 |
<0,001 |
" |
TCH/AFS-INB (FER) |
TUhigh/FH@-3 dB |
0,160 |
0.189 |
150000 |
99.737 |
0.224 |
0.197 |
" |
TCH/AHS 7.95 (FER) |
TUhigh/NoFH@3dB |
6,700 |
8.44 |
8960 |
|||
" |
TCH/AHS-INB (FER) |
TUhigh/No FH |
0.700 |
0.784 |
76000 |
99.726 |
0.882 |
0.193 |
" |
O-TCH/AHS-INB (FER) |
TUhigh/No FH |
10.500 |
11.760 |
5102 |
99.822 |
13.230 |
0.089 |
,, |
FACCH/F |
TUlow/No FH |
22,000 |
24,000 |
25000 |
100,000 |
27,720 |
<0,001 |
,, |
FACCH/H |
TUlow/No FH |
22,000 |
24,000 |
25000 |
100,000 |
27,720 |
<0,001 |
,, |
TCH/F9,6 or H4,8 |
TUhigh/FH |
0,300 |
0,336 |
178500 |
99,716 |
0,378 |
0,180 |
,, |
TCH/F4,8 |
TUhigh/FH |
0,010 |
0,011 |
5350000 |
99,732 |
0,013 |
0,197 |
,, |
TCH/F2,4 |
TUhigh/FH |
0,001 |
0,001 |
11900000 |
99,734 |
0,002 |
<0,001 |
,, |
TCH/H2,4 |
TUhigh/FH |
0,010 |
0,011 |
5350000 |
99,732 |
0,013 |
0,197 |
Adjacent |
TCH/FS |
TUhigh/No FH |
6,000* |
6,742* |
8900 |
99,825 |
7,560* |
0,162 |
channel |
TCH/FS Class Ib |
TUhigh/No FH |
0,400/ |
0,420/ |
1000000 |
99,919 |
0,504/ |
<0,001 |
200 kHz |
TCH/FS Class II |
TUhigh/No FH |
8,000 |
8,333 |
600000 |
100,000 |
10,080 |
<0,001 |
,, |
TCH/HS (FER) |
TUhigh/FH |
5,000 |
5,607 |
10700 |
99,787 |
8,000 |
<0,001 |
,, |
TCH/HS Class Ib (BFI=0) |
TUhigh/FH |
0,290 |
0,325 |
184700 |
99,711 |
0,522 |
<0,001 |
,, |
TCH/HS Class II (BFI=0) |
TUhigh/FH |
7,100 |
7,961 |
25500 |
100,00 |
8,520 |
0,065 |
,, |
TCH/HS (UFR) |
TUhigh/FH |
6,100 |
6,834 |
8780 |
99,781 |
9,760 |
<0,001 |
,, |
TCH/HS Class Ib (BFI or UFI)=0 |
TUhigh/FH |
0,210 |
0,235 |
255000 |
99,715 |
0,294 |
<0,001 |
,, |
EVSIDR |
TUlow/No FH |
21,900 |
24,000 |
25000 |
100,000 |
26,280 |
<0,001 |
,, |
SID RBER (SID=2 and (BFI or UFI=0) |
TUlow/No FH |
0,020 |
0,022 |
2678500 |
99,705 |
0,026 |
0,010 |
,, |
ESIDR |
TUlow/No FH |
17,100 |
19,152 |
25000 |
100,000 |
22,230 |
<0,001 |
,, |
SID RBER (SID=1 or SID=2) |
TUlow/No FH |
0,500 |
0,560 |
500000 |
100,000 |
0,650 |
<0,001 |
,, |
FACCH/F |
TUhigh/No FH |
9,500 |
10,640 |
5639 |
99,812 |
11,970 |
0,096 |
Adjacent |
TCH/FS |
TUhigh/No FH |
10,200* |
11,461* |
8900 |
99,995 |
12,852* |
0,004 |
channel |
TCH/FS Class Ib |
TUhigh/No FH |
0,720/ |
0,756/ |
1000000 |
99,999 |
0,9077/ |
<0,001 |
400 kHz |
TCH/FS Class II |
TUhigh/No FH |
8,800 |
9,167 |
600000 |
100,000 |
11,088 |
<0,001 |
,, |
FACCH/F |
TUhigh/No FH |
17,100 |
19,152 |
3133 |
99,878 |
21,546 |
<0,052 |
Intermod. |
TCH/FS Class II |
Static |
2,000 |
2,439 |
8200 |
99,741 |
3,000 |
0,122 |
FACCH/F |
TUhigh/No FH |
8,000 |
8,961 |
6696 |
99,798 |
10,080 |
0,108 |
|
Blocking and |
TCH/FS Class II |
Static |
2,000 |
2,439 |
8200 |
99,741 |
4,000 |
<0,001 |
spurious resp. |
FACCH/F |
TUhigh/No FH |
8,000 |
8,961 |
6696 |
99,798 |
10,080 |
0,108 |
Table 14-4: Test conditions for DCS 1 800 DCS 1 800 and PCS 1 900
Type of test |
Type of channel |
Propagation/ Frequency conditions |
Specified |
Test limit FER/BER % |
Mini-mum No of samples |
Prob that good unit will pass % |
Bad unit FER/BER % |
Risk that bad unit will pass |
---|---|---|---|---|---|---|---|---|
BFI |
TCH/FS |
Static |
0,033 |
0,041 |
492000 |
99,813 |
0,050 |
0,140 |
TCH/FS |
Static/FH |
0,033 |
0,041 |
492000 |
99,813 |
0,050 |
0,140 |
|
TCH/AFS |
Static/FH |
0,033 |
0,041 |
492000 |
99,813 |
0,050 |
0,140 |
|
TCH/AHS |
Static/FH |
0,033 |
0,041 |
492000 |
99,813 |
0,050 |
0,140 |
|
Sensitivity |
TCH/FS |
Static/FH |
0,100* |
0,122* |
164000 |
99,717 |
0,150* |
0,140 |
,, |
TCH/FS Class Ib |
Static/FH |
0,400/ |
0,410/ |
20000000 |
100,000 |
0,600/ |
<0,001 |
,, |
TCH/FS Class II |
Static/FH |
2,000 |
2,439 |
8200 |
99,714 |
3,000 |
0,001 |
,, |
TCH/FS |
Tuhigh/No FH |
4,000* |
4,478* |
13400 |
99,743 |
5,040* |
0,133 |
,, |
TCH/FS Class Ib |
Tuhigh/No FH |
0,300/ |
0,320/ |
1500000 |
100,000 |
0,378/ |
<0,001 |
,, |
TCH/FS Class II |
Tuhigh/No FH |
8,000 |
8,333 |
60000 |
99,865 |
10,080 |
<0,001 |
,, |
TCH/FS Class II |
HT/No FH |
9,000 |
9,333 |
30000 |
97,826 |
11,340 |
<0,001 |
,, |
TCH/FS Class II |
RA/No FH |
7,000 |
7,500 |
24000 |
99,873 |
8,820 |
<0,001 |
,, |
TCH/EFS |
Static/FH |
0,100 |
0,122 |
164000 |
99,758 |
0,150 |
0,171 |
,, |
TCH/EFS Class Ib |
Static/FH |
0,100 |
0,110 |
20000000 |
100,00 |
0,150 |
<0,001 |
,, |
TCH/EFS Class II |
Static/FH |
2,000 |
2,439 |
8200 |
99,753 |
3,000 |
0,168 |
,, |
TCH/EFS |
Tuhigh/No FH |
4,000 |
4,475 |
13400 |
99,701 |
5,040 |
0,179 |
,, |
TCH/EFS Class Ib |
Tuhigh/No FH |
0,120 |
0,130 |
1500000 |
99,979 |
0,151 |
<0,001 |
,, |
TCH/EFS Class II |
Tuhigh/No FH |
8,000 |
8,333 |
60000 |
99,804 |
10,080 |
<0,001 |
,, |
TCH/EFS Class II |
HT/No FH |
9,000 |
9,498 |
30000 |
99,798 |
11,340 |
<0,001 |
,, |
TCH/EFS Class II |
RA/No FH |
7,000 |
7,500 |
24000 |
99,829 |
8,820 |
<0,001 |
,, |
TCH/HS (FER) |
Tuhigh/No FH |
4,200 |
4,706 |
12750 |
99,763 |
7,140 |
<0,001 |
,, |
TCH/HS Class Ib (BFI=0) |
Tuhigh/No FH |
0,380 |
0,426 |
141000 |
99,706 |
0,760 |
<0,001 |
,, |
TCH/HS Class II (BFI=0) |
Tuhigh/No FH |
6,900 |
7,725 |
25500 |
100,00 |
8,280 |
0,061 |
,, |
TCH/HS Class II (BFI=0) |
HT/No FH |
7,800 |
8,735 |
20000 |
100,00 |
9,360 |
0,114 |
,, |
TCH/HS Class II (BFI=0) |
RA/No FH |
6,800 |
7,600 |
20000 |
100,00 |
8,160 |
0,182 |
,, |
TCH/HS (UFR) |
Tuhigh/No FH |
5,700 |
6,383 |
9400 |
99,769 |
10,830 |
<0,001 |
,, |
TCH/HS Class Ib |
|||||||
(BFI or UFI0=0) |
Tuhigh/No FH |
0,260 |
0,291 |
206000 |
99,712 |
0,442 |
<0,001 |
|
,, |
TCH/AHS-INB (FER) |
Tuhigh/No FH |
0,640 |
0.717 |
83000 |
99.724 |
0.806 |
0.195 |
,, |
FACCH/F |
TUhigh/No FH |
3,900 |
4,368 |
13736 |
99,752 |
4,914 |
0,140 |
,, |
FACCH/H |
TUhigh/No FH |
7,200 |
7,752 |
7440 |
97,027 |
9,072 |
0,002] |
,, |
TCH/F9,6 |
HT/No FH |
0,700 |
0,784 |
76500 |
99,721 |
0,882 |
0,176 |
,, |
TCH/F4,8 |
HT/No FH |
0,010 |
0,011 |
5350000 |
99,732 |
0,013 |
0,197 |
,, |
TCH/F2,4 |
HT/No FH |
0,001 |
0,001 |
11900000 |
99,734 |
0,002 |
<0,001 |
Input level |
TCH/FS Class II |
Static-23dBm |
0,100 |
0,122 |
164000 |
99,717 |
0,150 |
0,140 |
range |
TCH/FS Class II |
Static<-40dBm |
0,010 |
0,012 |
1640000 |
99,716 |
0,015 |
0,141 |
TCH/FS Class II |
EQ |
3,000 |
3,250 |
60000 |
99,981 |
3,780 |
<0,001 |
|
Co-channel |
TCH/FS |
TUlow/No FH |
21,00* |
24,00* |
25000 |
100,000 |
26,460* |
<0,001 |
rejection |
TCH/FS Class Ib |
TUlow/No FH |
2,000/ |
2,091/ |
3300000 |
100,000 |
2,520/ |
<0,001 |
,, |
TCH/FS Class II |
TUlow/No FH |
4,000 |
4,300 |
2000000 |
100,000 |
5,040 |
<0,001 |
,, |
TCH/FS |
TUhigh/FH |
3,000* |
3,371* |
17800 |
99,797 |
3,780* |
0,194 |
,, |
TCH/FS Class Ib |
TUhigh/FH |
0,200/ |
0,215/ |
2000000 |
100,000 |
0,252/ |
<0,001 |
,, |
TCH/FS Class II |
TUhigh/FH |
8,000 |
8,333 |
1200000 |
100,000 |
10,080 |
<0,001 |
,, |
TCH/EFS |
TUlow/No FH |
23,000 |
24,000 |
25000 |
99,999 |
26,680 |
<0,001 |
,, |
TCH/EFS Class Ib |
TUlow/No FH |
0,200 |
0,209 |
3300000 |
100,000 |
0,252 |
<0,001 |
,, |
TCH/EFS Class II |
TUlow/No FH |
3,000 |
3,039 |
2000000 |
100,000 |
3,780 |
<0,001 |
,, |
TCH/EFS |
TUhigh/FH |
3,000 |
3,357 |
17800 |
99,815 |
3,780 |
0,185 |
,, |
TCH/EFS Class Ib |
TUhigh/FH |
0,100 |
0,115 |
2000000 |
99,999 |
0,126 |
<0,001 |
,, |
TCH/EFS Class II |
TUhigh/FH |
8,000 |
8,333 |
1200000 |
100,00 |
10,08 |
<0,001 |
,, |
TCH/AFS-INB (FER) |
TUlow/No FH@-3 dB |
3.500 |
3.920 |
15000 |
99.744 |
4.410 |
0.173 |
,, |
TCH/AFS-INB (FER) |
TUhigh/FH@-3 dB |
0.120 |
0.145 |
150000 |
99.759 |
0.180 |
0.074 |
,, |
TCH/AHS-INB (FER) |
TUhigh/No FH |
0.710 |
0.795 |
75000 |
99.727 |
0.895 |
0.192 |
,, |
O-TCH/HS-INB (FER) |
Tuhigh/No FH |
11.000 |
12.320 |
4870 |
99.827 |
13.860 |
0.086 |
,, |
FACCH/F |
TUlow/No FH |
22,000 |
24,000 |
25000 |
100,000 |
27,720 |
<0,001 |
,, |
FACCH/H |
TUlow/No FH |
22,000 |
24,000 |
25000 |
100,000 |
27,720 |
<0,001 |
,, |
TCH/F9,6 or H4,8 |
TUhigh/FH |
0,300 |
0,336 |
178500 |
99,716 |
0,378 |
0,180 |
,, |
TCH/F4,8 |
TUhigh/FH |
0,010 |
0,011 |
5350000 |
99,732 |
0,013 |
0,197 |
,, |
TCH/F2,4 |
TUhigh/FH |
0,001 |
0,001 |
11900000 |
99,734 |
0,002 |
<0,001 |
,, |
TCH/H2,4 |
TUhigh/FH |
0,010 |
0,011 |
5350000 |
99,732 |
0,013 |
0,197 |
Adjacent |
TCH/FS |
TUhigh/No FH |
3,000* |
3,371* |
17800 |
99,797 |
3,780* |
0,194 |
channel |
TCH/FS Class Ib |
TUhigh/No FH |
0,250/ |
0,270/ |
2000000 |
100,000 |
0,315/ |
<0,001 |
200 kHz |
TCH/FS Class II |
TUhigh/No FH |
8,100 |
8,333 |
1200000 |
100,000 |
10,206 |
<0,001 |
,, |
TCH/HS (FER) |
TUhigh/FH |
5,000 |
5,607 |
10700 |
99,787 |
8,000 |
<0,001 |
,, |
TCH/HS Class Ib (BFI=0) |
TUhigh/FH |
0,290 |
0,325 |
184700 |
99,711 |
0,522 |
<0,001 |
,, |
TCH/HS Class II (BFI=0) |
TUhigh/FH |
7,200 |
8,078 |
25500 |
100,00 |
8,640 |
0,066 |
,, |
TCH/HS (UFR) |
TUhigh/FH |
6,100 |
6,834 |
8780 |
99,781 |
9,760 |
<0,001 |
,, |
TCH/HS Class Ib ((BFI or UFI)=0) |
TUhigh/FH |
0,210 |
0,235 |
255000 |
99,715 |
0,294 |
<0,001 |
,, |
EVSIDR |
TUlow/No FH |
21,900 |
24,000 |
25000 |
100,000 |
26,280 |
<0,001 |
,, |
SID RBER (SID=2 and (BFI or UFI)=0) |
TUlow/No FH |
0,020 |
0,022 |
2678500 |
99,705 |
0,026 |
0,010 |
,, |
ESIDR |
TUlow/No FH |
17,100 |
19,152 |
25000 |
100,000 |
22,230 |
<0,001 |
,, |
SID RBER (SID=1 or SID=2) |
TUlow/No FH |
0,500 |
0,560 |
500000 |
100,000 |
0,650 |
<0,001 |
,, |
FACCH/F |
TUhigh/No FH |
3,400 |
3,808 |
15756 |
99,746 |
4,284 |
0,145 |
Adjacent |
TCH/FS |
TUhigh/No FH |
5,100* |
5,714* |
10500 |
99,773 |
6,426* |
0,134 |
channel |
TCH/FS Class Ib |
TUhigh/No FH |
0,450/ |
0,483/ |
1200000 |
100,000 |
0,567/ |
<0,001 |
400 kHz |
TCH/FS Class II |
TUhigh/No FH |
8,900 |
9,167 |
720000 |
100,000 |
11,214 |
<0,001 |
,, |
FACCH/F |
TUhigh/No FH |
6,100 |
6,832 |
8782 |
99,777 |
7,686 |
0,122 |
Intermod, |
TCH/FS Class II |
Static |
2,000 |
2,439 |
8200 |
99,741 |
3,000 |
0,122 |
FACCH/F |
TUhigh/No FH |
3,900 |
4,368 |
13736 |
99,752 |
4,914 |
0,140 |
|
Blocking and |
TCH/FS Class II |
Static |
2,000 |
2,439 |
8200 |
99,741 |
4,000 |
<0,001 |
spurious resp. |
FACCH/F |
TUhigh/No FH |
3,900 |
4,368 |
13736 |
99,752 |
4,914 |
0,140 |
NOTE 1: is a parameter which ranges from 1 to 1,6. The value of for a RBER test on TCH/FS class Ib bits under particular measurement conditions shall be the same as that determined in the FER test on TCH/FS under the same conditions. For example, the value of may be different for a TUhigh sensitivity test and an RA sensitivity test. The value of is determined by dividing the measured error rate for the FER test by the value of the test limit error rate listed in the limits section of the test corresponding to =1; if the result of the division is lower than 1, a value of =1 shall be used, if the value of > 1,6 the FER test has failed (the normal treatment of stimulus uncertainties applies). The probabilities that a good unit will pass and the risks that a bad unit will pass, listed in the table are valid for =1, and would be slightly different for other values of .
NOTE 2: In order to save time the sensitivity and co-channel rejection tests for the TCH/F2,4 channel does not comply with the above said constraints.
In fact, a bad unit which performs 2 times (instead of 1,26) worse than that specified is accounted for, so reducing the required number of events to 150, instead of 600. On the other hand, the specified RBER is in this case 10E-5 and, on the basis of simulations and hardware validation results, doubling this RBER results in a drop in performance of less than 1 dB.