8.3 NB-IoT Test environment for Signalling test
36.5083GPPCommon test environments for User Equipment (UE) conformance testingEvolved Universal Terrestrial Radio Access (E-UTRA) and Evolved Packet Core (EPC)Release 17TS
8.3.1 NB-IoT Requirements of test equipment
The requirements of test equipment specified in this subclause apply to NB-IoT Signalling test cases defined in TS 36.523-1 [18], in addition to the common NB-IoT requirements of test equipment specified in cause 8.1.2 and 8.1.3 of this specification. Test equipment shall be able to simulate NB-IoT cells, based on the E-UTRA platform as Radio Access Technology (RAT), in the following deployment scenarios:
- In-band operation with E-UTRA
- Guard-band operation with E-UTRA
- Standalone operation
Depending on the respective deployment scenario, the overall number and configuration of cells to be simulated simultaneously by test equipment shall not exceed the resources specified in the following Table 8.3.1-1:
Table 8.3.1-1: Maximum resources in terms of number / configuration of Ncells to be simulated simultaneously in a test setup
|
Simulation of |
Max. number / configuration of cells |
|
|
NB-IoT network in standalone operation |
4x cells |
|
|
NB-IoT network in E-UTRA guard-band operation (Note 1) |
4x cells |
|
|
NB-IoT network in E-UTRA in-band operation (Note 1) |
4x cells |
|
|
Note 1: E-UTRA cells are not configured. |
||
Exceptions to the requirements outlined above are possible but need special evidence to be provided explicitly in the test case prose and should be allowed only if the test case purpose cannot be met otherwise.
8.3.2 NB-IoT Reference test conditions
8.3.2.1 NB-IoT Physical channel allocations
As defined in clause 8.1.3.3.
8.3.2.2 NB-IoT Signal levels
8.3.2.2.1 NB-IoT Downlink signal levels
The default settings of suitable cells and non-suitable cells for NB-IoT are specified in table 8.3.2.2.1-1. Cells which are expected to be undetectable for UE under test shall fulfil the condition of non-suitable "Off" cell.
Table 8.3.2.2.1-1: Default settings of suitable / non-suitable cells
|
Power level type |
NB-IoT |
||||
|
Unit |
Power level |
||||
|
Serving cell |
dBm/15kHz |
-85 |
|||
|
Suitable neighbour intra-frequency cell |
dBm/15kHz |
-91 |
|||
|
Suitable neighbour inter-frequency cell |
dBm/15kHz |
-97 |
|||
|
Non-suitable cell |
dBm/15kHz |
-120 (Note 4) |
|||
|
Non-suitable "Off" cell |
dBm/15kHz |
≤ -150 |
|||
|
Note 1: The power level is specified in terms of cell-specific NRS EPRE. Note 2: Power levels are specified based on the precondition that q-Hyst, a3-Offset and hysteresis are 0 dB. Note 3: The power level is specified at the UE Rx antenna (assumption = single UE Rx antenna). Note 4: Calculation of non-suitable cell power level is based on the reference sensitivity (without repetitions) |
|||||
The default signal level uncertainty is specified in table 8.3.2.2.1-2 for any level specified, unless a tighter uncertainty is specified by a test case in TS 36.523-1 [18].
Table 8.3.2.2.1-2: SS signal level uncertainty
|
Absolute signal level uncertainty for each cell |
Relative signal level uncertainty between multiple cells |
|
|
Intra-frequency |
+/-3 dB at each test port |
+/-3 dB |
|
Inter-frequency |
+/-3 dB at each test port |
See Note 1 |
|
Note 1: For Inter-frequency cells the relative signal level uncertainty between multiple cells is determined by the absolute uncertainty of each cell, and does not have any additional constraint. |
||
8.3.2.3 NB-IoT Default test frequencies
The default channel bandwidth of 200 kHz is applied to the signalling test. The test frequencies are defined so that no frequency overlapping takes place, in order to avoid unnecessary inter-frequency interference.
All operating bands can accommodate at least three test frequencies f1, f2 and f3 (f3<f1<f2).
For NB-IoT in-band and guard-band signalling testing, the NB-IoT frequency to be tested are low/mid/high range and are associated to the LTE frequency low/mid/high range as specified in tables 4.3.1.1.x. The E-UTRA channel bandwidth to be tested is 10MHz and NB-IoT PRB 30 for in-band and 5 MHz for guard-band for all operating bands for all test cases; unless the specific channel bandwidth is specified for the operating band below:
For Band 31 in-band testing, the E-UTRA channel bandwidth to be tested is 5 MHz.
8.3.2.3.1 NB-IoT FDD Mode Test frequencies for signalling test
Test frequencies for signalling test are specified in table 8.3.2.3.1-1 for FDD in terms of Low, Mid and High which are referred to the Low Range, Mid Range and High Range in clause 8.1.3.1.1.
Table 8.3.2.3.1-1: Test frequencies for NB-IoT FDD (200 kHz)
|
NB-IoT Operating Band |
Bandwidth [MHz] |
f1, f5 |
f2 |
f3 |
|||||||||||
|
NUL |
NDL |
NUL |
NDL |
NUL |
NDL |
||||||||||
|
1 |
60 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
2 |
60 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
3 |
75 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
4 |
45 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
5 |
25 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
… |
|||||||||||||||
|
7 |
70 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
8 |
35 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
… |
|||||||||||||||
|
11 |
20 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
12 |
17 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
13 |
10 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
14 |
10 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
… |
|||||||||||||||
|
17 |
12 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
18 |
15 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
19 |
15 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
20 |
30 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
21 |
15 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
… |
|||||||||||||||
|
25 |
65 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
26 |
35 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
… |
|||||||||||||||
|
28 |
45 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
… |
|||||||||||||||
|
31 |
5 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
… |
|||||||||||||||
|
65 |
90 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
66 |
70+901 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
70 |
15 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
71 |
35 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
… |
|||||||||||||||
|
73 |
5 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
… |
|||||||||||||||
|
85 |
18 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
… |
|||||||||||||||
|
87 |
5 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
88 |
5 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
103 |
1 |
Mid |
Mid |
High |
High |
Low |
Low |
||||||||
|
NOTE 1: Asymmetric operating band (UL + DL). |
|||||||||||||||
Test frequencies for signalling test of MFBI are specified in Table 8.3.2.3.1-1a for FDD in terms of Low, Mid and High which are referred to as Low Range, Mid Range and High range in clause 8.1.3.1.1.
Table 8.3.2.3.1-1a: Test frequencies for NB-IoT FDD MFBI (200 kHz)
|
NB-IoT Operating Band |
MFBI Overlapping Band |
Bandwidth [MHz] |
f1, f5 |
f2 |
f3 |
||||||||||||
|
NUL |
NDL |
NUL |
NDL |
NUL |
NDL |
||||||||||||
|
2 |
25 |
60 |
Mid |
Mid |
High |
High |
Low |
Low |
|||||||||
|
4 |
10 |
45 |
Mid |
Mid |
High |
High |
Low |
Low |
|||||||||
|
4 |
66 |
45 |
Mid |
Mid |
High |
High |
Low |
Low |
|||||||||
|
5 |
18 |
15 |
Mid |
Mid |
23999 |
5999 |
Low |
Low |
|||||||||
|
5 |
19 |
15 |
Mid |
Mid |
20609 |
2609 |
Low |
Low |
|||||||||
|
5 |
26 |
25 |
Mid |
Mid |
High |
High |
Low |
Low |
|||||||||
|
12 |
17 |
12 |
Mid |
Mid |
High |
High |
Low |
Low |
|||||||||
|
17 |
12 |
12 |
Mid |
Mid |
High |
High |
Low |
Low |
|||||||||
|
19 |
5 |
15 |
Mid |
Mid |
High |
High |
Low |
Low |
|||||||||
|
19 |
26 |
15 |
Mid |
Mid |
High |
High |
Low |
Low |
|||||||||
|
25 |
2 |
60 |
Mid |
Mid |
26638 |
8638 |
Low |
Low |
|||||||||
|
26 |
5 |
25 |
Mid |
Mid |
High |
High |
Low |
Low |
|||||||||
|
26 |
18 |
15 |
Mid |
Mid |
High |
High |
Low |
Low |
|||||||||
|
26 |
19 |
15 |
Mid |
Mid |
High |
High |
Low |
Low |
|||||||||
|
66 |
4 |
45 |
Mid |
Mid |
132421 |
66885 |
Low |
Low |
|||||||||
|
66 |
10 |
60 |
Mid |
Mid |
132571 |
67035 |
Low |
Low |
|||||||||
Test frequencies for signalling test are specified in table 8.3.2.3.1-2 for TDD in terms of Low, Mid and High which are referred to the Low Range, Mid Range and High Range in clause 8.1.3.1.
Table 8.3.2.3.1-2: Test frequencies for NB-IoT TDD (200 kHz)
|
NB-IoT Operating Band |
Bandwidth [MHz] |
f1, f5 |
f2 |
f3 |
|||
|
41 |
60 |
Mid |
Mid |
High |
High |
Low |
Low |
8.3.2.3.2 NB-IoT TDD Mode Test frequencies for signalling test
Test frequencies for signalling test are specified in table 8.3.2.3.2-1 in terms of Low, Mid and High which are referred to the Low Range, Mid Range and High Range in clause 8.1.3.1.2
Table 8.3.2.3.2-1: Test frequencies for NB-IoT TDD (200 kHz)
|
NB-IoT Operating Band |
Bandwidth [MHz] |
f1, f5 |
f2 |
f3 |
|||
|
NUL |
NDL |
NUL |
NDL |
NUL |
NDL |
||
|
41 |
194 |
Mid |
Mid |
High |
High |
Low |
Low |
|
42 |
200 |
Mid |
Mid |
High |
High |
Low |
Low |
|
43 |
200 |
Mid |
Mid |
High |
High |
Low |
Low |
Test frequencies for signalling test of MFBI are specified in Table 8.3.2.3.2-1a for TDD in terms of Low, Mid and High which are referred to as Low Range, Mid Range and High range in clause 8.1.3.1.2.
Table 8.3.2.3.2-1a: Test frequencies for NB-IoT TDD MFBI (200 kHz)
|
NB-IoT Operating Band |
MFBI Overlapping Band |
Bandwidth [MHz] |
f1, f5 |
f2 |
f3 |
|||
|
NUL |
NDL |
NUL |
NDL |
NUL |
NDL |
|||
|
41 |
38 |
50 |
Mid |
Mid |
High |
High |
Low |
Low |
8.3.3 NB-IoT Reference system configurations
The reference system configurations specified in this subclause apply to all Signalling test cases defined in TS 36.523-1 [18] unless otherwise specified, in addition to the common reference system configurations specified in subclause 8.1.4 of this specification.
Only one SS Tx antenna is used.
One UE antenna is used for all signalling test cases.
8.3.3.1 NB-IoT Default parameters specific for simulated cells
Default parameters specific for simulated cells are specified in this subclause.
8.3.3.1.1 Intra-frequency neighbouring cell list in SIB4-NB for NB-IoT cells
Intra-frequency neighbouring cell list for signalling test cases is defined in table 8.3.3.1.1-1. This table is referred to in the default contents of IE intraFreqNeighbouringCellList in SystemInformationBlockType4-NB defined in table 8.1.4.3.3-3.
Table 8.3.3.1.1-1: Intra-frequency neighbouring cell lists for NB-IoT cells
|
cell ID |
Test Frequency |
intra-frequency neighbouring cell list |
||||||
|
number of entries |
physCellId[n] |
q-OffsetCell[n] |
||||||
|
1 |
2 |
3 |
1 |
2 |
3 |
|||
|
Ncell 1 |
f1 |
3 |
Ncell 2 |
Ncell 4 |
Ncell 11 |
dB0 |
dB0 |
dB0 |
|
Ncell 2 |
f1 |
3 |
Ncell 1 |
Ncell 4 |
Ncell 11 |
dB0 |
dB0 |
dB0 |
|
Ncell 4 |
f1 |
3 |
Ncell 1 |
Ncell 2 |
Ncell 11 |
dB0 |
dB0 |
dB0 |
|
Ncell 11 |
f1 |
3 |
Ncell 1 |
Ncell 2 |
Ncell 4 |
dB0 |
dB0 |
dB0 |
|
Ncell 3 |
f2 |
1 |
Ncell 23 |
– |
– |
dB0 |
– |
– |
|
Ncell 23 |
f2 |
1 |
Ncell 3 |
– |
– |
dB0 |
– |
– |
Intra-frequency neighbouring cell list of the same PLMN for the NAS signalling test is defined in table 8.3.3.1.1-2 when SIB4-NB is broadcast.
Table 8.3.3.1.1-2: Intra-freq. lists in SIB4 for NAS test cases (same PLMN)
|
NAS cell ID |
Test Frequency |
Intra-frequency neighbouring cell list |
||
|
number of entries |
physCellId[n] |
|||
|
1 |
2 |
|||
|
Ncell 50 |
f1 |
2 |
Ncell 51 |
Ncell 53 |
|
Ncell 51 |
f1 |
2 |
Ncell 50 |
Ncell 53 |
|
Ncell 53 |
f1 |
2 |
Ncell 50 |
Ncell 51 |
|
Ncell 52 |
f2 |
1 |
Ncell 61 |
N/A |
|
Ncell 61 |
f2 |
1 |
Ncell 52 |
N/A |
8.3.3.1.2 Inter-frequency carrier frequency list in SIB5-NB for NB-IoT cells
Inter-frequency E-UTRA carrier frequency list for signalling test cases is defined in table 8.3.3.1.2-1. This table is referred to in the default contents of IE interFreqCarrierFreqList in SystemInformationBlockType5-NB defined in table 8.1.4.3.3-4.
Table 8.3.3.1.2-1: Inter-frequency carrier frequency lists for NB-IoT cells
|
cell ID |
Test Frequency |
interFreqCarrierFreqList |
|||
|
number of entries |
dl-CarrierFreq[n] |
||||
|
1 |
2 |
3 |
|||
|
Ncell 1 Ncell 2 Ncell 4 Ncell 11 |
f1 |
3 |
f2 |
f3 |
f5 |
|
Ncell 3 Ncell 23 |
f2 |
3 |
f1 |
f3 |
f5 |
|
Ncell 6 |
f3 |
3 |
f1 |
f2 |
f5 |
|
Ncell 10 |
f5 |
3 |
f1 |
f2 |
f3 |
|
Note 1: The inter-frequency carrier frequency list for signalling NAS test cases when cells are on same PLMN is defined in table 8.3.3.1.2-2. Note 2: In case of Test frequency f1, f2 and f3, dl-CarrierFreq f5 as part of inter-frequency list is applicable only in case of multi-band scenarios. Note 3: In case of Test frequency f5, dl-CarrierFreq f1 as part of inter-frequency list is applicable only in case of multi-band scenarios. |
|||||
Inter-frequency neighbouring carrier and cell lists for NAS signalling test cases are defined in table 8.3.3.1.2-2 for same PLMN and table 8.3.3.1.2-3 for different PLMN.
Table 8.3.3.1.2-2: Inter-freq. lists in SIB5-NB for NAS test cases (same PLMN)
|
NAS cell ID |
Test Frequency |
interFreqCarrierFreqList |
||
|
number of entries |
dl-CarrierFreq[n] |
|||
|
1 |
2 |
|||
|
Ncell 50 Ncell 51 Ncell 53 |
f1 |
1 |
f2 |
NA |
|
Ncell 52 Ncell 61 |
f2 |
1 |
f1 |
NA |
Table 8.3.3.1.2-3: Inter-freq. lists in SIB5-NB for NAS test cases (different PLMN)
|
NAS cell ID |
Test Frequency |
interFreqCarrierFreqList |
Condition |
||
|
number of entries |
dl-CarrierFreq[n] |
||||
|
1 |
2 |
||||
|
Ncell 50 Ncell 51 Ncell 52 Ncell 53 Ncell 62 |
f1 |
0 |
NA |
NA |
|
|
Ncell 55 Ncell 56 |
f2 |
0 |
NA |
NA |
|
|
Ncell 57 Ncell 59 Ncell 60 |
f3 |
0 |
NA |
NA |
54-NOT-CONF |
|
1 |
f2 |
54-CONF |
|||
|
Ncell 54 |
f2 |
1 |
f3 |
NA |
|
|
Condition |
Explanation |
|
54-NOT-CONF |
Ncell 54 is not configured in the test |
|
54-CONF |
Ncell 54 is configured in the test |
8.3.3.2 NB-IoT Default configurations for NAS test cases
As defined in clause 8.1.4.
8.3.3.3 NB-IoT Cell configurations
All Ncells are assumed to be full cells unless specified otherwise in a test case defined in TS 36.523-1 [18].
8.3.4 NB-IoT Generic signalling procedures
8.3.4.1 NB-IoT Initial UE states and setup procedures
As defined in clause 8.1.5.
8.3.4.2 NB-IoT Reference procedures and test procedures for TTCN development
As defined in clause 8.1.5A.
8.3.4.3 NB-IoT Test case postambles for TTCN development
As defined in clause 10.5 of TS 36.523-3 [20].
8.3.5 NB-IoT Default RRC message and information element contents
As defined in clause 8.1.6.
8.3.6 NB-IoT Default NAS message and information element contents
As defined in clause 8.1.7.
8.3.7 NB-IoT Timer tolerances
The timer tolerances specified for the test environment in this subclause apply to all Signalling test cases defined in TS 36.523-1 [18] unless otherwise specified.
All the timers used during testing are within a tolerance margin given in Table 8.3.7.-1 below. For NB-IoT and its typically longer timer values across all protocol layers, common timer tolerances are applicable independently from protocol layer resp. test case group. If for a specific test a different tolerance value is required then this should be specified in the relevant test document (i.e. the document where the test is described).
Table 8.3.7-1: Timer tolerances for protocol timers
|
timer value |
< 500 ms |
not applicable |
|
|
500 ms ≤ |
timer value |
< 10000 ms |
timer tolerance = 10 % |
|
10000 ms ≤ |
timer value |
< 40000 ms |
timer tolerance = 5 % |
|
40000 ms ≤ |
timer value |
timer tolerance = 2.5 % |