H.2 Statistical testing of receiver characteristics

38.521-23GPPNRPart 2: Range 2 StandaloneRadio transmission and receptionRelease 17TSUser Equipment (UE) conformance specification

Tools: ARFCN - Frequency Conversion for 5G NR/LTE/UMTS/GSM

H.2.1 General

The test of receiver characteristics is twofold.

1. A signal or a combination of signals is offered to the RX port(s) of the receiver.

2. The ability of the receiver to demodulate /decode this signal is verified by measuring the throughput.

In (2) is the statistical aspect of the test and is treated here.

The minimum requirement for all receiver tests is >95% of the maximum throughput.

All receiver tests are performed in static propagation conditions. No fading conditions are applied.

H.2.2 Mapping throughput to error ratio

a) The measured information bit throughput R is defined as the sum (in kilobits) of the information bit payloads successfully received during the test interval, divided by the duration of the test interval (in seconds).

b) In measurement practice the UE indicates successfully received information bit payload by signalling an ACK to the SS.
If payload is received, but damaged and cannot be decoded, the UE signals a NACK.

c) Only the ACK and NACK signals, not the data bits received, are accessible to the SS.
The number of bits is known in the SS from knowledge of what payload was sent.

d) For the reference measurement channel, applied for testing, the number of bits is different in different slots, however in a radio frame it is fixed during one test.

e) The time in the measurement interval is composed of successfully received slots (ACK), unsuccessfully received slots (NACK) and no reception at all (DTX-slots).

f) DTX-slots may occur regularly according the applicable reference measurement channel (regDTX).
In real live networks this is the time when other UEs are served. In TDD these are the UL and special slots.
regDTX vary from test to test but are fixed within the test.

g) Additional DTX-slots occur statistically when the UE is not responding ACK or NACK where it should. (statDTX)
This may happen when the UE was not expecting data or decided that the data were not intended for it.

The pass / fail decision is done by observing the:

– number of NACKs

– number of ACKs and

– number of statDTXs (regDTX is implicitly known to the SS)

The ratio (NACK + statDTX)/(NACK+ statDTX + ACK)is the Error Ratio (ER). Taking into account the time consumed by the ACK, NACK, and DTX-TTIs (regular and statistical), ER can be mapped unambiguously to throughput for any single reference measurement channel test.

H.2.3 Design of the test

The test is defined by the following design principles (see clause H.x, Theory….):

1. The early decision concept is applied.

2. A second limit is introduced: Bad DUT factor M>1

3. To decide the test pass:

Supplier risk is applied based on the Bad DUT quality

To decide the test fail

Customer Risk is applied based on the specified DUT quality

The test is defined by the following parameters:

1. Limit ER = 0.05 (Throughput limit = 95%)

2. Bad DUT factor M=1.5 (selectivity)

3. Confidence level CL = 95% (for specified DUT and Bad DUT-quality)

H.2.4 Numerical definition of the pass fail limits

Table H.2.4-1: pass fail limits

ne	ns_p	ns_f	ne	ns_p	ns_f	ne	ns_p	ns_f	ne	ns_p	ns_f
0	67	NA	39	763	500	78	1366	1148	117	1951	1828
1	95	NA	40	778	516	79	1381	1166	118	1965	1845
2	119	NA	41	794	532	80	1396	1183	119	1980	1863
3	141	NA	42	810	548	81	1412	1200	120	1995	1881
4	162	NA	43	826	564	82	1427	1217	121	2010	1899
5	183	NA	44	842	580	83	1442	1234	122	2025	1916
6	202	NA	45	858	596	84	1457	1252	123	2039	1934
7	222	NA	46	873	612	85	1472	1269	124	2054	1952
8	241	NA	47	889	629	86	1487	1286	125	2069	1969
9	259	NA	48	905	645	87	1502	1303	126	2084	1987
10	278	76	49	920	661	88	1517	1321	127	2099	2005
11	296	88	50	936	678	89	1532	1338	128	2113	2023
12	314	100	51	952	694	90	1547	1355	129	2128	2040
13	332	113	52	967	711	91	1562	1373	130	2143	2058
14	349	126	53	983	727	92	1577	1390	131	2158	2076
15	367	140	54	998	744	93	1592	1407	132	2172	2094
16	384	153	55	1014	760	94	1607	1425	133	2187	2111
17	401	167	56	1029	777	95	1623	1442	134	2202	2129
18	418	181	57	1045	793	96	1637	1459	135	2217	2147
19	435	195	58	1060	810	97	1652	1477	136	2231	2165
20	452	209	59	1076	827	98	1667	1494	137	2246	2183
21	469	224	60	1091	844	99	1682	1512	138	2261	2201
22	486	238	61	1106	860	100	1697	1529	139	2275	2218
23	503	253	62	1122	877	101	1712	1547	140	2290	2236
24	519	268	63	1137	894	102	1727	1564	141	2305	2254
25	536	283	64	1153	911	103	1742	1582	142	2320	2272
26	552	298	65	1168	928	104	1757	1599	143	2334	2290
27	569	313	66	1183	944	105	1772	1617	144	2349	2308
28	585	328	67	1199	961	106	1787	1634	145	2364	2326
29	602	343	68	1214	978	107	1802	1652	146	2378	2344
30	618	359	69	1229	995	108	1817	1669	147	2393	2361
31	634	374	70	1244	1012	109	1832	1687	148	2408	2379
32	650	389	71	1260	1029	110	1847	1704	149	2422	2397
33	667	405	72	1275	1046	111	1861	1722	150	2437	2415
34	683	421	73	1290	1063	112	1876	1740	151	2452	2433
35	699	436	74	1305	1080	113	1891	1757	152	2466	2451
36	715	452	75	1321	1097	114	1906	1775	153*)	NA	2469
37	731	468	76	1336	1114	115	1921	1793
38	747	484	77	1351	1131	116	1936	1810	*) note 2 in H.2.5

NOTE 1: The first column is the number of errors (ne = number of NACK + statDTX)

NOTE 2: The second column is the number of samples for the pass limit (ns_p, ns=Number of Samples= number of NACK + statDTX + ACK)

NOTE 3: The third column is the number of samples for the fail limit (ns_f)

H.2.5 Pass fail decision rules

The pass fail decision rules apply for a single test, comprising one component in the test vector. The overall Pass /Fail conditions are defined in clause H.2.6and H.2A.6

Having observed 0 errors, pass the test at 67+ samples, otherwise continue

Having observed 1 error, pass the test at 95+ otherwise continue

Having observed 2 errors, pass the test at 119+ samples, fail the test at 2- samples, otherwise continue

Etc. etc.

Having observed 151 errors, pass the test at 2452+ samples, fail the test at 2433- samples, otherwise continue

Having observed 152 errors, pass the test at 2466+ samples, fail the test at 2451- samples.

Where x+ means: x or more, x- means x or less

NOTE 1: an ideal DUT passes after 67 samples. The maximum test time is 2466 samples.

NOTE 2: It is allowed to deviate from the early decision concept by postponing the decision (pass/fail or continue). Postponing the decision to or beyond the end of Table H.2.4-1 requires a pass fail decision against the test limit: pass the DUT for ER<0.0618, otherwise fail.

Annex I:Void

Annex J (normative):
Test applicability per permitted test method

This annex describes, per test requirement, the permitted test methodologies as a function of DUT antenna configuration.

Table J-1: Test metric applicability per permitted test method

Test Metric	No DUT antenna configuration declaration	DUT antenna configuration declaration
Test Metric		Configuration 1 (one antenna panel with D ≤ 5 cm active at any one time)	Configuration 2 (More than one antenna panel D ≤ 5 cm without phase coherency between panels active at any one time)	Configuration 3 (Any phase coherent antenna panel of any size)
EIRP, TRP	IFF, Enhanced IFF, DFF+IFF (Note 1)	DFF, DFF simplification, IFF, Enhanced IFF, DFF+IFF (Note 2), NFTF	DFF, DFF simplification, IFF, Enhanced IFF, DFF+IFF (Note 2), NFTF	IFF, Enhanced IFF, DFF+IFF (Note 1)
EIS, Frequency Error, EVM, Carrier Leakage, In-Band Emission, EVM SF, OBW	IFF, Enhanced IFF, DFF+IFF (Note 1)	DFF, DFF simplification, IFF, Enhanced IFF, DFF+IFF (Note 2)	DFF, DFF simplification, IFF, Enhanced IFF, DFF+IFF (Note 2)	IFF, Enhanced IFF, DFF+IFF (Note 1)
NOTE: D = DUT radiating aperture declared by UE vendor. Note 1: Only the IFF probe(s) are applicable Note 2: Either DFF or IFF probe(s) are applicable

Annex K (normative):
EIRP, TRP, and EIS measurement procedures

Annex K defines the EIRP, TRP, and EIS measurement procedures which includes Tx and Rx beam peak direction search, spherical coverage procedures and TRP procedures for the permitted testing methodologies defined in [5].

The default value for BEAM_SELECT_WAIT_TIME = 3 sec for all applicable Tx and Rx test cases. The BEAM_SELECT_WAIT_TIME represents a default minimum wait time period required to complete beam selection process at a single position before start of measurement. For a particular EUT, if it is known/determined that a lower wait time than default value is enough to complete beam selection process, then such a lower value may be used by the Test system to achieve test time optimization.