6.5 Output RF spectrum emissions

38.521-23GPPNRPart 2: Range 2 StandaloneRadio transmission and receptionRelease 17TSUser Equipment (UE) conformance specification

Unwanted emissions are divided into "Out-of-band emission" and "Spurious emissions" in 3GPP RF specifications. This notation is in line with ITU-R recommendations such as SM.329 ‎‎[7] and the Radio Regulations ‎[TBD].

ITU defines:

Out-of-band emission = Emission on a frequency or frequencies immediately outside the necessary bandwidth which results from the modulation process, but excluding spurious emissions.

Spurious emission = Emission on a frequency, or frequencies, which are outside the necessary bandwidth and the level of which may be reduced without affecting the corresponding transmission of information. Spurious emissions include harmonic emissions, parasitic emissions, intermodulation products and frequency conversion products but exclude out-of-band emissions.

Unwanted emissions = Consist of spurious emissions and out-of-band emissions.

The UE transmitter spectrum emission consists of the three components; the occupied bandwidth (channel bandwidth), the Out Of Band (OOB) emissions and the far out spurious emission domain.

Figure 6.5-1: Transmitter RF spectrum

6.5.1 Occupied bandwidth

Editor’s note: The following aspects are either missing or not yet determined:

– Measurement Uncertainty is FFS for n259.

– Measurement Uncertainties and Test Tolerances are FFS for power class 1, 2, and 4.

6.5.1.1 Test purpose

To verify that the UE occupied bandwidth for all transmission bandwidth configurations supported by the UE are less than their specific limits

6.5.1.2 Test applicability

This test applies to all types of NR UE release 15 and forward.

6.5.1.3 Minimum conformance requirements

Occupied bandwidth is defined as the bandwidth containing 99 % of the total integrated mean power of the transmitted spectrum on the assigned channel. The occupied bandwidth for all transmission bandwidth configurations (Resources Blocks) shall be less than the channel bandwidth specified in Table 6.5.1.3-1.

The occupied bandwidth is defined as a directional requirement. The requirement is verified in beam locked mode with the test metric of OBW (Link=TX beam peak direction, Meas=Link angle).

Table 6.5.1.3-1: Occupied channel bandwidth

Occupied channel bandwidth / Channel bandwidth

50

MHz

100

MHz

200

MHz

400

MHz

Channel bandwidth (MHz)

50

100

200

400

The normative reference for this requirement is TS 38.101-2 [3] clause 6.5.1.

6.5.1.4 Test description

6.5.1.4.1 Initial conditions

Initial conditions are a set of test configurations the UE needs to be tested in and the steps for the SS to take with the UE to reach the correct measurement state.

The initial test configurations consist of environmental conditions, test frequencies, and channel bandwidths based on NR operating bands specified in Table 5.3.5-1. All of these configurations shall be tested with applicable test parameters for each channel bandwidth and subcarrier spacing, are shown in Table 6.5.1.4.1-1. The details of the uplink reference measurement channels (RMCs) are specified in Annexes A.2. Configurations of PDSCH and PDCCH before measurement are specified in Annex C.2.

Table 6.5.1.4.1-1: Test Configuration Table

Initial Conditions

Test Environment as specified in TS 38.508-1 [10] clause 4.1

Normal

Test Frequencies as specified in TS 38.508-1 [10] clause 4.3.1

Low range, Mid range, High range

Test Channel Bandwidths as specified in TS 38.508-1 [10] clause 4.3.1

All

Test SCS as specified in Table 5.3.5-1

Lowest

Test Parameters

Test ID

Downlink Configuration

Uplink Configuration

–

Modulation

RB allocation (NOTE 1)

1

DFT-s-OFDM QPSK

Outer_full

NOTE 1: The specific configuration of each RB allocation is defined in Table 6.1-1 for PC2, PC3 and PC4 or Table 6.1-2 for PC1.

1. Connection between SS and UE is shown in TS 38.508-1 [10] Annex A, Figure A.3.3.1.1 for TE diagram and clause A.3.4.1.1 for UE diagram.

2. The parameter settings for the cell are set up according to TS 38.508-1 [10] clause 4.4.3.

3. Downlink signals are initially set up according to Annex C, and uplink signals according to Annex G.

4. The UL Reference Measurement channels are set according to Table 6.5.1.4.1-1.

5. Propagation conditions are set according to Annex B.0

6. Ensure the UE is in state RRC_CONNECTED with generic procedure parameters Connectivity NR, Connected without release On, Test Mode On and Test Loop Function On according to TS 38.508-1 [10] clause 4.5. Message contents are defined in clause 6.5.1.4.3

6.5.1.4.2 Test procedure

1. SS sends uplink scheduling information for each UL HARQ process via PDCCH DCI format 0_1 for C_RNTI to schedule the UL RMC according to Table 6.5.1.4.1-1. Since the UL has no payload and no loopback data to send the UE sends uplink MAC padding bits on the UL RMC.

2. Set the UE in the Tx beam peak direction found with a 3D EIRP scan as performed in Annex K.1.1. Allow at least BEAM_SELECT_WAIT_TIME (Note 1) for the UE Tx beam selection to complete.

3. Send continuously uplink power control "up" commands in every uplink scheduling information to the UE; allow at least 200 ms for the UE to reach maximum output power. Allow at least BEAM_SELECT_WAIT_TIME (Note 1) for the UE Tx beam selection to complete.

4. SS activates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.2 using condition Tx only.

5. Measure the EIRP spectrum distribution within 1.5-times or more frequency range over the requirement for Occupied Bandwidth specification centring on the current carrier frequency. The characteristics of the filter shall be approximately Gaussian (typical spectrum analyser filter). The measuring duration is one active uplink subframe. EIRP is captured from both polarizations, theta and phi.

6. Calculate the total EIRP from both polarizations, theta and phi, within the range of all frequencies measured in step 5 and save this value as "Total EIRP". EIRP measurement procedure is defined in Annex K.

7. Identify the measurement window whose centre is aligned on the centre of the channel for which the sum of the power measured in theta and phi polarization is 99% of the “Total EIRP”.

8. The “Occupied Bandwidth” is the width of the measurement window obtained in step 7.

6.5.1.4.3 Message contents

Message contents are according to TS 38.508-1 [10] subclause 4.6 with TRANSFORM_PRECODER_ENABLED condition in Table 4.6.3-118 PUSCH-Config.

6.5.1.5 Test requirement

The measured Occupied Bandwidth shall not exceed values in Table 6.5.1.5-1.

Table 6.5.1.5-1: Occupied channel bandwidth

Occupied channel bandwidth / Channel bandwidth

50

MHz

100

MHz

200

MHz

400

MHz

Channel bandwidth (MHz)

50 + R

100 + R

200 + R

400 + R

NOTE 1: R is relaxation : R for each frequency and channel bandwidth is specified in Table 6.5.1.5-2.

Table 6.5.1.5-2: Relaxation due to testability limit (Occupied channel bandwidth)

Occupied channel bandwidth / Channel bandwidth

50

MHz

100

MHz

200

MHz

400

MHz

n257, n258, n261

0

0

0

0

n260

0

0

0

0

n259

TBD

TBD

TBD

TBD

6.5.2 Out of band emission

The Out of band emissions are unwanted emissions immediately outside the assigned channel bandwidth resulting from the modulation process and non-linearity in the transmitter but excluding spurious emissions. This out of band emission limit is specified in terms of a spectrum emission mask and an Adjacent Channel Leakage power Ratio. Additional requirements to protect specific bands are also considered.

The requirements in clause 6.5.2.1 only apply when both UL and DL of a UE are configured for single CC operation, and they are of the same bandwidth. For a UE that is configured for single CC operation with different channel bandwidths in UL and DL, the requirements in clause 6.5A.2.1 apply.

All out of band emissions for range 2 are TRP.

6.5.2.1 Spectrum Emission Mask

Editor’s note: The following aspects are either missing or not yet determined:

  • Measurement Uncertainties and Test Tolerances are FFS for power class 1, 2, and 4.

6.5.2.1.1 Test purpose

To verify that the power of any UE emission shall not exceed specified lever for the specified channel bandwidth.

6.5.2.1.2 Test applicability

This test case applies to all types of NR UE release 15 and forward.

6.5.2.1.3 Minimum conformance requirements

The spectrum emission mask of the UE applies to frequencies (ΔfOOB) starting from the ± edge of the assigned NR channel bandwidth. For frequencies offset greater than FOOB as specified in Table 6.5.2.1.3-1 the spurious requirements in clause 6.5.3 are applicable.

The power of any UE emission shall not exceed the levels specified in Table 6.5.2.1.3-1 for the specified channel bandwidth. The requirement is verified in beam locked mode with the test metric of TRP (Link=TX beam peak direction, Meas=TRP grid).

Table 6.5.2.1.3-1: General NR spectrum emission mask for Range 2.

Spectrum emission limit (dBm)/ Channel bandwidth

ΔfOOB

(MHz)

50

MHz

100

MHz

200

MHz

400

MHz

Measurement bandwidth

± 0-5

-5

-5

-5

-5

1 MHz

± 5-10

-13

-5

-5

-5

1 MHz

± 10-20

-13

-13

-5

-5

1 MHz

± 20-40

-13

-13

-13

-5

1 MHz

± 40-100

-13

-13

-13

-13

1 MHz

± 100-200

-13

-13

-13

1 MHz

± 200-400

-13

-13

1 MHz

± 400-800

-13

1 MHz

The normative reference for this requirement is TS 38.101-2 [3] clause 6.5.2.1.

6.5.2.1.4 Test description

6.5.2.1.4.1 Initial conditions

Initial conditions are a set of test configurations the UE needs to be tested in and the steps for the SS to take with the UE to reach the correct measurement state.

The initial test configurations consist of environmental conditions, test frequencies, and channel bandwidths based on NR operating bands specified in Table 5.3.5-1. All of these configurations shall be tested with applicable test parameters for each channel bandwidth and subcarrier spacing, are shown in Table 6.5.2.1.4.1-1. The details of the uplink reference measurement channels (RMCs) are specified in Annexes A.2. Configurations of PDSCH and PDCCH before measurement are specified in Annex C.2.

Table 6.5.2.1.4.1-1: Test Configuration Table

Initial Conditions

Test Environment as specified in TS 38.508-1 [10] subclause 4.1

Normal

Test Frequencies as specified in TS 38.508-1 [10] subclause 4.3.1

Mid range

Test Channel Bandwidths as specified in TS 38.508-1 [10] subclause 4.3.1

Lowest, Highest

Test SCS as specified in Table 5.3.5-1

Highest

Test Parameters

Test ID

Downlink Configuration

Uplink Configuration

–

Modulation

RB allocation (NOTE 1)

1

DFT-s-OFDM PI/2 BPSK

Outer_Full

2

DFT-s-OFDM QPSK

Outer_Full

3

DFT-s-OFDM 16 QAM

Outer_Full

4

DFT-s-OFDM 64 QAM

Outer_Full

5

CP-OFDM QPSK

Outer_Full

NOTE 1: The specific configuration of each RF allocation is defined in Table 6.1-1 for PC2, PC3 and PC4 or Table 6.1-2 for PC1.

NOTE 2: All test points in this table must also exist in Table 6.2.2.4.1-1, Table 6.2.2.4.1-2, Table 6.2.2.4.1-3 (MPR) for PC1 or Table 6.2.2.4.1-7, Table 6.2.2.4.1-8, Table 6.2.2.4.1-9 (MPR) for PC2, PC3 and PC4.

1. Connection between SS and UE is shown in TS 38.508-1 [10] Annex A, Figure A.3.3.1.1 for TE diagram and clause A.3.4.1.1 for UE diagram.

2. The parameter settings for the cell are set up according to TS 38.508-1 [10] subclause 4.4.3.

3. Downlink signals are initially set up according to Annex C, and uplink signals according to Annex G.

4. The UL Reference Measurement channels are set according to Table 6.5.2.1.4.1-1.

5. Propagation conditions are set according to Annex B.0

6. Ensure the UE is in state RRC_CONNECTED with generic procedure parameters Connectivity NR, Connected without release On, Test Mode On and Test Loop Function On according to TS 38.508-1 [10] clause 4.5. Message contents are defined in clause 6.5.2.1.4.3

6.5.2.1.4.2 Test procedure

1. SS sends uplink scheduling information for each UL HARQ process via PDCCH DCI format 0_1 for C_RNTI to schedule the UL RMC according to Table 6.5.2.1.4.1-1. Since the UL has no payload and no loopback data to send the UE sends uplink MAC padding bits on the UL RMC.

2. Set the UE in the Tx beam peak direction found with a 3D EIRP scan as performed in Annex K.1.1. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 2) for the UE Tx beam selection to complete.

3. Send continuously uplink power control "up" commands in every uplink scheduling information to the UE; allow at least 200 ms for the UE to reach maximum output power. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 2) for the UE Tx beam selection to complete.

4. SS activates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.2 using condition Tx only.

5. Measure the TRP of the transmitted signal with a measurement filter of bandwidths according to Table 6.5.2.1.5-1. The centre frequency of the filter shall be stepped in continuous steps according to the same table. TRP shall be recorded for each step. The measurement period shall capture the active time slots. Total radiated power is measured according to TRP measurement procedure defined in Annex K. The measurement grid used for TRP measurement defined in Annex M. TRP is calculated considering both polarizations, theta and phi.

NOTE 1: When switching to DFT-s-OFDM waveform, as specified in Table 6.5.2.1.4.1-1, send an NR RRCReconfiguration message according to TS 38.508-1 [10] clause 4.6.3 Table 4.6.3-118 PUSCH-Config with TRANSFORM_PRECODER_ENABLED condition.

NOTE 2: The BEAM_SELECT_WAIT_TIME default value is defined in Annex K.1.1.

6.5.2.1.4.3 Message contents

Message contents are according to TS 38.508-1 [10] subclause 4.6.

6.5.2.1.5 Test requirement

The measured TRP of any UE emission derived in step 5, shall fulfil requirements in Table.6.5.2.1.5-1.

Table 6.5.2.1.5-1: General NR spectrum emission mask for Range 2

Spectrum emission limit (dBm)/ Channel bandwidth

ΔfOOB

(MHz)

50

MHz

100

MHz

200

MHz

400

MHz

Measurement bandwidth

± 0-5

-5 + TT

-5 + TT

-5 + TT

-5 + TT

1 MHz

± 5-10

-13 + TT

-5 + TT

-5 + TT

-5 + TT

1 MHz

± 10-20

-13 + TT

-13 + TT

-5 + TT

-5 + TT

1 MHz

± 20-40

-13 + TT

-13 + TT

-13 + TT

-5 + TT

1 MHz

± 40-100

-13 + TT

-13 + TT

-13 + TT

-13 + TT

1 MHz

± 100-200

-13 + TT

-13 + TT

-13 + TT

1 MHz

± 200-400

-13 + TT

-13 +TT

1 MHz

± 400-800

-13 + TT

1 MHz

NOTE 1: TT for each frequency and channel bandwidth is specified in Table 6.5.2.1.5-1a

NOTE 2: At the boundary of spectrum emission limit, the first and last measurement position with a 1 MHz filter is the inside of +0.5MHz and -0.5MHz, respectively.

NOTE 3: The measurements are to be performed above the upper edge of the channel and below the lower edge of the channel.

Table 6.5.2.1.5-1a: Test Tolerance (Spectrum emission mask)

Test Metric

23.45GHz ≤ f ≤ 32.125GHz

32.125GHz < f ≤ 40.8GHz

IFF (Max device size ≤ 30 cm)

3.21 dB

3.46 dB

NOTE: As a general rule, the resolution bandwidth of the measuring equipment should be equal to the measurement bandwidth. However, to improve measurement accuracy, sensitivity and efficiency, the resolution bandwidth may be smaller than the measurement bandwidth. When the resolution bandwidth is smaller than the measurement bandwidth, the result should be integrated over the measurement bandwidth in order to obtain the equivalent noise bandwidth of the measurement bandwidth.

6.5.2.2 Void

6.5.2.3 Adjacent channel leakage ratio

Editor’s note: The following aspects are either missing or not yet determined:

  • Measurement Uncertainties and Test Tolerances are FFS for power class 1, 2, and 4.
  • Testability for power class 1, 2 and 4 are FFS.

6.5.2.3.1 Test purpose

To verify that UE transmitter does not cause unacceptable interference to adjacent channels in terms of Adjacent Channel Leakage power Ratio (ACLR).

6.5.2.3.2 Test applicability

This test case applies to all types of NR UE release 15 and forward.

6.5.2.3.3 Minimum conformance requirements

Adjacent Channel Leakage power Ratio (ACLR) is the ratio of the filtered mean power centred on the assigned channel frequency to the filtered mean power centred on an adjacent channel frequency. ACLR requirement is specified for a scenario in which adjacent carrier is another NR channel.

NR Adjacent Channel Leakage power Ratio (NRACLR) is the ratio of the filtered mean power centred on the assigned channel frequency to the filtered mean power centred on an adjacent channel frequency at nominal channel spacing. The assigned NR channel power and adjacent NR channel power are measured with rectangular filters with measurement bandwidths specified in Table 6.5.2.3.3-1.

If the measured adjacent channel power is greater than –35 dBm then the NRACLR shall be higher than the value specified in Table 6.5.2.3.3-1. The requirement is verified in beam locked mode with the test metric of TRP (Link=TX beam peak direction, Meas=TRP grid).

Table 6.5.2.3.3-1: General requirements for NRACLR

Channel bandwidth / NRACLR / Measurement bandwidth

50

MHz

100

MHz

200

MHz

400

MHz

NRACLR for band n257, n258, n261

17 dB

17 dB

17 dB

17 dB

NRACLR for band n260

16 dB

16 dB

16 dB

16 dB

NR channel Measurement bandwidth (MHz)

47.58

95.16

190.20

380.28

Adjacent channel centre frequency offset [MHz]

+50

/

-50

+100

/

-100

+200

/

-200

+400

/

-400

The normative reference for this requirement is TS 38.101-2 [3] clause 6.5.2.3.

6.5.2.3.4 Test description

6.5.2.3.4.1 Initial conditions

Initial conditions are a set of test configurations the UE needs to be tested in and the steps for the SS to take with the UE to reach the correct measurement state.

The initial test configurations consist of environmental conditions, test frequencies, and channel bandwidths based on NR operating bands specified in Table 5.3.5-1. All of these configurations shall be tested with applicable test parameters for each channel bandwidth and subcarrier spacing, are shown in Table 6.5.2.3.4.1-1 and Table 6.5.2.3.4.1-2. The details of the uplink reference measurement channels (RMCs) are specified in Annexes A.2. Configurations of PDSCH and PDCCH before measurement are specified in Annex C.2.

Table 6.5.2.3.4.1-1: Test Configuration Table (Power Class 1)

Default Conditions

Test Environment as specified in TS 38.508-1 [10] subclause 4.1

Normal, TL, TH

Test Frequencies as specified in TS 38.508-1 [10] subclause 4.3.1

Low range, Mid range, High range

Test Channel Bandwidths as specified in TS 38.508-1 [10] subclause 4.3.1

Lowest, Highest

Test SCS as specified in Table 5.3.5-1

Lowest, Highest

Test Parameters

Test ID

Freq

ChBw

SCS

Downlink Configuration

Uplink Configuration

Default

Default

–

Modulation

RB allocation (NOTE 1)

1

Low

DFT-s-OFDM PI/2 BPSK

8@0

2

High

DFT-s-OFDM PI/2 BPSK

8@NRB-8

3

Mid

DFT-s-OFDM PI/2 BPSK

Outer_Full

4

Low

DFT-s-OFDM QPSK

8@0

5

High

DFT-s-OFDM QPSK

8@NRB-8

6

Mid

DFT-s-OFDM QPSK

Outer_Full

7

Low

DFT-s-OFDM 16 QAM

8@0

8

High

DFT-s-OFDM 16 QAM

8@NRB-8

9

Mid

DFT-s-OFDM 16 QAM

Outer_Full

10

Low

DFT-s-OFDM 64 QAM

8@0

11

High

DFT-s-OFDM 64 QAM

8@NRB-8

12

Mid

DFT-s-OFDM 64 QAM

Outer_Full

13

Low

CP-OFDM QPSK

8@0

14

High

CP-OFDM QPSK

8@NRB-8

15

Mid

CP-OFDM QPSK

Outer_Full

NOTE 1: The specific configuration of each RF allocation is defined in Table 6.1-2 for PC1.

NOTE 2: Following Test IDs shall be skipped for FR2b
– FFS

NOTE 3: All test points in this table must also exist in Table 6.2.2.4.1-1, Table 6.2.2.4.1-2, Table 6.2.2.4.1-3 (MPR).

Table 6.5.2.3.4.1-2: Test Configuration Table (Power Class 2, 3 and 4)

Default Conditions

Test Environment as specified in TS 38.508-1 [10] subclause 4.1

Normal, TL, TH

Test Frequencies as specified in TS 38.508-1 [10] subclause 4.3.1

Low range, Mid range, High range

Test Channel Bandwidths as specified in TS 38.508-1 [10] subclause 4.3.1

Lowest, Highest

Test SCS as specified in Table 5.3.5-1

Lowest, Highest

Test Parameters

Test ID

Freq

ChBw

SCS

Downlink Configuration

Uplink Configuration

Default

Default

–

Modulation

RB allocation (NOTE 1)

1

Low

DFT-s-OFDM PI/2 BPSK

Outer_1RB_Left

2

High

DFT-s-OFDM PI/2 BPSK

Outer_1RB_Right

3

Mid

DFT-s-OFDM PI/2 BPSK

Outer_Full

4

Low

DFT-s-OFDM QPSK

Outer_1RB_Left

5

High

DFT-s-OFDM QPSK

Outer_1RB_Right

6

Mid

DFT-s-OFDM QPSK

Outer_Full

7

Low

DFT-s-OFDM 16 QAM

Outer_1RB_Left

8

High

DFT-s-OFDM 16 QAM

Outer_1RB_Right

9

Mid

DFT-s-OFDM 16 QAM

Outer_Full

10

Low

DFT-s-OFDM 64 QAM

Outer_1RB_Left

11

High

DFT-s-OFDM 64 QAM

Outer_1RB_Right

12

Mid

DFT-s-OFDM 64 QAM

Outer_Full

13

Low

CP-OFDM QPSK

Outer_1RB_Left

14

High

CP-OFDM QPSK

Outer_1RB_Right

15

Mid

CP-OFDM QPSK

Outer_Full

NOTE 1: The specific configuration of each RF allocation is defined in Table 6.1-1 for PC2, PC3 and PC4.

NOTE 2: Following Test IDs shall be skipped for FR2b and PC3
– All Test IDs for FR2b 400MHz Channel Bandwidth
– Test ID 10-15 for FR2b 200MHz Channel Bandwidth
– Test ID 10-12 for FR2b 100MHz Channel Bandwidth

NOTE 3: All test points in this table must also exist in Table 6.2.2.4.1-7, Table 6.2.2.4.1-8, Table 6.2.2.4.1-9 (MPR).

1. Connection between SS and UE is shown in TS 38.508-1 [10] Annex A, Figure A.3.3.1.1 for TE diagram and section A.3.4.1.1 for UE diagram.

2. The parameter settings for the cell are set up according to TS 38.508-1 [10] subclause 4.4.3.

3. Downlink signals are initially set up according to Annex C, and uplink signals according to Annex G.

4. The UL Reference Measurement channels are set according to Table 6.5.2.3.4.1-1 and Table 6.5.2.3.4.1-2.

5. Propagation conditions are set according to Annex B.0.

6. Ensure the UE is in state RRC_CONNECTED with generic procedure parameters Connectivity NR, Connected without release On, Test Mode On and Test Loop Function On according to TS 38.508-1 [10] clause 4.5. Message contents are defined in clause 6.5.2.3.4.3

6.5.2.3.4.2 Test procedure

1. SS sends uplink scheduling information for each UL HARQ process via PDCCH DCI format 0_1 for C_RNTI to schedule the UL RMC according to Table 6.5.2.3.4.1-1 and Table 6.5.2.3.4.1-2. Since the UL has no payload and no loopback data to send the UE sends uplink MAC padding bits on the UL RMC.

2. Set the UE in the Tx beam peak direction found with a 3D EIRP scan as performed in Annex K.1.1. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 2) for the UE Tx beam selection to complete.

3. Send continuously uplink power control "up" commands in every uplink scheduling information to the UE; allow at least 200 ms for the UE to reach maximum output power. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 2) for the UE Tx beam selection to complete.

4. SS activates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.2 using condition Tx only.

5. Measure EIRP of the transmitted signal in the Tx beam peak direction for the assigned NR channel with a rectangular measurement filter with bandwidths according to Table 6.5.2.3.5-1. EIRP measurement procedure defined in Annex K. EIRP is calculated considering both polarizations, theta and phi.

6. Measure EIRP of the first NR adjacent channel on both lower and upper side of the assigned NR channel, respectively using a rectangular measurement filter with bandwidths according to Table 6.5.2.3.5-1. EIRP measurement procedure defined in Annex K. EIRP is calculated considering both polarizations, theta and phi.

7. Calculate the ratios of the power between the values measured in step 5 over step 6 for lower and upper NR ACLR, respectively.

NOTE 1: When switching to DFT-s-OFDM waveform, as specified in the Table 6.5.2.3.4.1-1 and Table 6.5.2.3.4.1-2, send an NR RRCReconfiguration message according to TS 38.508-1 [10] clause 4.6.3 Table 4.6.3-118 PUSCH-Config with TRANSFORM_PRECODER_ENABLED condition.

NOTE 2: The BEAM_SELECT_WAIT_TIME default value is defined in Annex K.1.1.

6.5.2.3.4.3 Message contents

Message contents are according to TS 38.508-1 [10] subclause 4.6.

6.5.2.3.5 Test requirement

The measured NR ACLR, derived in step 7, shall be higher than the limits in Table 6.5.2.3.5-1.

Table 6.5.2.3.5-1: General requirements for NRACLR

Channel bandwidth / NRACLR / Measurement bandwidth

50

MHz

100

MHz

200

MHz

400

MHz

NRACLR for band n257, n258, n261

17 – TT – R dB

17 – TT – R dB

17 – TT – R dB

17 – TT – R dB

NRACLR for band n260

16 – TT dB

16 – TT dB

16 – TT dB

16 – TT dB

NR channel Measurement bandwidth

(MHz)

47.58

95.16

190.20

380.28

Adjacent channel centre frequency offset [MHz]

+50

/

-50

+100

/

-100

+200

/

-200

+400

/

-400

NOTE 1: TT for each frequency and channel bandwidth is specified in Table 6.5.2.3.5-1a

NOTE 2: R for each frequency, channel bandwidth and test point is specified in Table 6.5.2.3.5-1b

Table 6.5.2.3.5-1a: Test Tolerance (Adjacent channel leakage ratio)

Channel bandwidth / NRACLR / Measurement bandwidth

Test ID

50

MHz

100

MHz

200

MHz

400

MHz

NRACLR for band n257, n258, n261

1-2, 4-5

4.10

4.49

4.66

5.06

3, 6

4.08

4.45

4.59

5.06

7-9

4.15

4.59

4.85

3.34

10-12

4.36

4.98

4.06

1.46

13-15

4.17

4.62

4.91

2.99

NRACLR for band n260

1-2, 4-5

4.48

4.65

4.97

–

3, 6

4.45

4.58

4.84

–

7-9

4.58

4.84

5.31

–

10-12

4.97

–

–

–

13-15

4.62

4.90

–

–

Table 6.5.2.3.5-1b: Relaxation due to testability limit (Adjacent channel leakage ratio)

Channel bandwidth / NRACLR / Measurement bandwidth

Test ID

50

MHz

100

MHz

200

MHz

400

MHz

NRACLR for band n257, n258, n261

1-6

0

0

0

0

7

0

0

0

2.5

8

0

0

0

2.5

9

0

0

0

2.5

10

0

0

1.5

5.5

11

0

0

1.5

5.5

12

0

0

1.5

5.5

13

0

0

0

3

14

0

0

0

3

15

0

0

0

3

NOTE 1: Relaxation value is derived by Table 6.5.2.3.5-1c for FR2a.

NOTE 2: Relaxation value is 0 for FR2b.

Table 6.5.2.3.5-1c: Relaxation value for FR2a ACLR

CA bandwidth class

MPR

100 MHz

200 MHz

400 MHz

0

0

0

0

0.5

0

0

0

1

0

0

0

1.5

0

0

0

2

0

0

0

2.5

0

0

0

3

0

0

0

3.5

0

0

0.5

4

0

0

1

4.5

0

0

2.5

5

0

0

3

5.5

0

1.5

4.5

6

0

2

5

6.5

0

2.5

5.5

7

0

3

6

7.5

0.5

3.5

6.5

8

1

4

7

8.5

1.5

4.5

7.5

9

2

5

8

6.5.3 Spurious emissions

Spurious emissions are emissions which are caused by unwanted transmitter effects such as harmonics emission, parasitic emissions, intermodulation products and frequency conversion products, but exclude out of band emissions. The spurious emission limits are specified in terms of general requirements in line with SM.329 [7] and NR operating band requirement to address UE co-existence. Spurious emissions are measured as TRP.

To improve measurement accuracy, sensitivity and efficiency, the resolution bandwidth may be smaller than the measurement bandwidth. When the resolution bandwidth is smaller than the measurement bandwidth, the result should be integrated over the measurement bandwidth in order to obtain the equivalent noise bandwidth of the measurement bandwidth.

6.5.3.1 Transmitter Spurious emissions

Editor’s Note: This clause is complete for Band n257, n258, n260 and n261 and PC3. The following aspects of the clause are for future consideration:

– TRP Measurement uncertainty is TBD for above 80 GHz.

– Connection diagram between SS and UE in TS 38.508-1 [10] Annex A is FFS.

– Test procedure only includes the testing of smartphone and is FFS for laptop and FWA.

6.5.3.1.1 Test purpose

To verify that UE transmitter does not cause unacceptable interference to other channels or other systems in terms of transmitter spurious emissions.

6.5.3.1.2 Test applicability

This test case applies to all types of NR UE release 15 and forward.

6.5.3.1.3 Minimum conformance requirements

Unless otherwise stated, the spurious emission limits apply for the frequency ranges that are more than FOOB (MHz) in Table 6.5.3.1.3-1 starting from the edge of the assigned NR channel bandwidth. The spurious emission limits in Table 6.5.3.1.3-2 apply for all transmitter band configurations (NRB) and channel bandwidths. The requirement is verified in beam locked mode with the test metric of TRP (Link=TX beam peak direction, Meas=TRP grid).

NOTE: For measurement conditions at the edge of each frequency range, the lowest frequency of the measurement position in each frequency range should be set at the lowest boundary of the frequency range plus MBW/2. The highest frequency of the measurement position in each frequency range should be set at the highest boundary of the frequency range minus MBW/2. MBW denotes the measurement bandwidth defined for the protected band.

Table 6.5.3.1.3-1: Boundary between NR out of band and spurious emission domain

Channel bandwidth

50 MHz

100 MHz

200
MHz

400 MHz

OOB boundary FOOB (MHz)

100

200

400

800

The spurious emission limits in table 6.5.3.1.3-2 apply for all transmitter band configurations (RB) and channel bandwidths.

Table 6.5.3.1.3-2: Spurious emissions limits

Frequency Range

Maximum
Level

Measurement
bandwidth

NOTE

30 MHz ≤ f < 1000 MHz

-36 dBm

100 kHz

1 GHz ≤ f < 12.75 GHz

-30 dBm

1 MHz

12.75 GHz ≤ f ≤ 2nd harmonic of the upper frequency edge of the UL operating band in GHz

-13 dBm

1 MHz

The normative reference for this requirement is TS 38.101-2 subclause 6.5.3.

6.5.3.1.4 Test description

6.5.3.1.4.1 Initial conditions

Initial conditions are a set of test configurations the UE needs to be tested in and the steps for the SS to take with the UE to reach the correct measurement state.

The initial test configurations consist of environmental conditions, test frequencies, and channel bandwidths based on NR operating bands specified in Table 5.3.5-1. All of these configurations shall be tested with applicable test parameters for each channel bandwidth and subcarrier spacing, are shown in Table 6.5.3.1.4.1-1. The details of the uplink reference measurement channels (RMCs) are specified in Annexes A.2. Configurations of PDSCH and PDCCH before measurement are specified in Annex C.2.

Table 6.5.3.1.4.1-1: Test Configuration Table

Initial Conditions

Test Environment as specified in TS 38.508-1 [10] subclause 4.1

Normal

Test Frequencies as specified in TS 38.508-1 [10] subclause 4.3.1

Low range, High range (NOTE 2)

Test Channel Bandwidths as specified in TS 38.508-1 [10] subclause 4.3.1

Highest

Test SCS as specified in Table 5.3.5-1

120kHz

Test Parameters

Test ID

Downlink Configuration

Uplink Configuration

–

Modulation

RB allocation

(NOTE 1)

1

DFT-s -OFDM QPSK

Inner_Full for PC2, PC3 and PC4

Inner_Full_Region1 for PC1

2

DFT-s -OFDM QPSK

Inner_1RB for PC2, PC3 and PC4

Inner_Partial for PC1

(NOTE 3)

NOTE 1: The specific configuration of each RB allocation is defined in Table 6.1-1 for PC2, PC3 and PC4 or Table 6.1-2 for PC1.

NOTE 2: When testing Low range test only in Frequency Range lower than (FUL_low – ΔfOOB) and when testing High range test only in Frequency Range higher than (FUL_high + ΔfOOB).

NOTE 3: When testing Low range configure uplink RB to Inner_1RB_Left for PC2, PC3 and PC4 or Inner_Partial_Left_Region1 for PC1 and when testing High range configure uplink RB to Inner_1RB_Right for PC2, PC3 and PC4 or Inner_Partial_Right_Region1 for PC1.

1. Connection between SS and UE is shown in TS 38.508-1 [10] Annex A, Figure [TBD] for TE diagram and Figure [TBD] for UE diagram.

2. The parameter settings for the cell are set up according to TS 38.508-1 [10] subclause 4.4.3.

3. Downlink signals are initially set up according to Annex C, and uplink signals according to Annex G.

4. The UL Reference Measurement channels are set according to Table 6.5.3.1.4.1-1.

5. Propagation conditions are set according to Annex B.0.

6. Ensure the UE is in state RRC_CONNECTED with generic procedure parameters Connectivity NR, Connected without release On, Test Mode On and Test Loop Function On according to TS 38.508-1 [10] clause 4.5. Message contents are defined in clause 6.5.3.1.4.3.

6.5.3.1.4.2 Test procedure

1. Select any of the three Alignment Options (1, 2, or 3) from Tables N.2-1 through N.2-3 to mount the DUT inside the QZ.

2. If the re-positioning concept is applied, position the device in DUT Orientation 1 if the maximum beam peak direction is within zenith angular range 0o≤≤90o for the alignment option selected in step 1; position the device in DUT Orientation 2 (either Options 1 or 2) if the maximum beam peak direction is within zenith angular range 90o<≤180o for DUT Orientation 1 for the alignment option selected in step 1. If the re-positioning concept is not applied, position the device in DUT Orientation 1.

3. SS sends uplink scheduling information for each UL HARQ process via PDCCH DCI format 0_1 for C_RNTI to schedule the UL RMC according to Table 6.5.3.1.4.1-1. Since the UL has no payload and no loopback data to send the UE sends uplink MAC padding bits on the UL RMC.

4. Set the UE in the Inband Tx beam peak direction found with a 3D EIRP scan as performed in Annex K.1.1. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 3) for the UE Tx beam selection to complete.

5. Send continuously uplink power control "up" commands in every uplink scheduling information to the UE; allow at least 200msec for the UE to reach PUMAX. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 3) for the UE Tx beam selection to complete.

6. SS activates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.2 using condition Tx only.

7. Measure the spurious emissions as per steps outlined below with an exception to the procedure in Annex K if the re-positioning concept is applied (NOTE 4). Step (a) is optional and applicable only if SNR (test requirement level in Table 6.5.3.1.5-1 minus offset value minus noise floor of the test system) ≥ 0 dB is guaranteed.

(a) Perform coarse TRP measurements to identify spurious emission frequencies and corresponding power level according to the procedures in Annex K, using coarse TRP measurement grid selection criteria as per Table M.4.5-3 in Annex M. The measurement is completed in both polarizations θ and φ over frequency range and measurement bandwidth according to Table 6.5.3.1.5-1. Optionally, a larger and non-constant measurement bandwidth than that of Table 6.5.3.1.5-1 may be applied. The measurement period shall capture the active time slots. For each spurious emission frequency with coarse TRP identified to be less than an offset dB from the TRP limit according to Table 6.5.3.1.5-1, continue with fine TRP procedures according to step (b).

The offset value shall be the TRP measurement uncertainty at 95% confidence level including the effect of coarse grid measurement uncertainty element, excluding the influence of noise. Different coarse TRP grids and corresponding offset values may be used for different frequencies. The coarse TRP grid and offset values used shall be recorded in the test report.

Table 6.5.3.1.4.2-1: Typical offset values for coarse TRP measurement step 7(a)

Grid

Frequency Range

Offset Value

Constant Density

6 GHz ≤ f < 12.75 GHz

5.13

12.75 GHz ≤ f < 23.45GHz

5.09

23.45 GHz ≤ f < 40.8GHz

5.38

40.8 GHz ≤ f < 66GHz

7.31

66 GHz ≤ f ≤ 80GHz

7.61

Constant-Step Size

6 GHz ≤ f < 12.75 GHz

5.26

12.75 GHz ≤ f < 23.45GHz

5.23

23.45 GHz ≤ f < 40.8GHz

5.52

40.8 GHz ≤ f < 66GHz

7.43

66 GHz ≤ f ≤ 80GHz

7.73

NOTE 1: These offset values are the upper limit values when fine TRP measurement uncertainty of the test system is same as maximum test system uncertainty in Annex F and when using the coarse measurement grid with minimum number of points as specified in Table M.4.5-3.

NOTE 2: It is allowed to use the offset values derived based on test system’s actual measurement uncertainty budget and denser measurement grid as specified in Table M.4.5-3.

(b) Measure fine TRP measurements according to procedures in Annex K, using fine TRP measurement grid selection criteria as per Table M.4.5-3 in Annex M, for each of the spurious emission frequency identified in step (a). Apply a measurement bandwidth according to Table 6.5.3.1.5-1.

8. SS deactivates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.3.

NOTE 1: The frequency range defined in Table 6.5.3.1.5-1 may be split into ranges. For each range a different test system, e.g. antenna and/or chamber, may be used. To pass the test case all verdicts of the frequency ranges must pass.

NOTE 2: Void.

NOTE 3: The BEAM_SELECT_WAIT_TIME default value is defined in Annex K.1.1.

NOTE 4: If the (in-band) beam peak is within 0o≤≤90o: perform first hemispherical TRP scan (0o≤≤90o) in DUT Orientation 1 and second hemispherical TRP scan (90o>≥0o) in DUT Orientation 2. If the (in-band) beam peak is within 90o<≤180o: perform first hemispherical TRP scan (0o≤≤90o) in DUT Orientation 2 and second hemispherical TRP scan (90o>≥0o) in DUT Orientation 1. The DUT with UBF activated needs to be re-positioned during the test.

NOTE 5: The coarse TRP measurement grid and corresponding offset dB value referred in step 7(a) above, for some valid grids can be found in TR 38.903[20] section B.18.

6.5.3.1.4.3 Message contents

Message contents are according to TS 38.508-1 [10] subclause 4.6 with TRANSFORM_PRECODER_ENABLED condition in Table 4.6.3-118 PUSCH-Config.

6.5.3.1.5 Test requirement

This clause specifies the requirements for the specified NR band for Transmitter Spurious emissions requirement with frequency range as indicated in Table 6.5.3.1.5-1.

The maximum TRP power of spurious emission, measured using RMS detector, shall not exceed the described value in Table 6.5.3.1.5-1.

Unless otherwise stated, the spurious emission limits apply for the frequency ranges that are more than FOOB (MHz) in Table 6.5.3.1.3-1 starting from the edge of the assigned NR channel bandwidth. The spurious emission limits in Table 6.5.3.1.5-1 apply for all transmitter band configurations (NRB) and channel bandwidths.

NOTE: For measurement conditions at the edge of each frequency range, the lowest frequency of the measurement position in each frequency range should be set at the lowest boundary of the frequency range plus MBW/2. The highest frequency of the measurement position in each frequency range should be set at the highest boundary of the frequency range minus MBW/2. MBW denotes the measurement bandwidth defined for the protected band.

Table 6.5.3.1.5-1: Spurious emissions test requirements

Frequency Range

Maximum
Level

Measurement
bandwidth

NOTE

6 GHz ≤ f < 12.75 GHz

-30 dBm

1 MHz

12.75 GHz ≤ f ≤ 2nd harmonic of the upper frequency edge of the UL operating band in GHz

-13 dBm

1 MHz

NOTE 1: Applies for Band n257, n258, n260, n261

6.5.3.2 Spurious emission band UE co-existence

Editor’s note: This clause is complete for Band n257, n258, n260 and n261 and PC3. The following aspects of the clause are for future consideration:

  • TRP Measurement uncertainty is TBD for PC1, PC2 and PC4.

– Connection diagram between SS and UE in TS 38.508-1 [10] Annex A is FFS.

  • Test procedure only includes the testing of smartphone and is FFS for laptop and FWA.

6.5.3.2.1 Test purpose

To verify that UE transmitter does not cause unacceptable interference when in co-existence with protected bands in terms of transmitter spurious emissions.

6.5.3.2.2 Test applicability

This test case applies to all types of NR UE release 15 and forward.

6.5.3.2.3 Minimum conformance requirements

This clause specifies the requirements for the specified NR band, for co-existence with protected bands. The requirement is verified in beam locked mode with the test metric of TRP (Link=TX beam peak direction, Meas=TRP grid).

NOTE: For measurement conditions at the edge of each frequency range, the lowest frequency of the measurement position in each frequency range should be set at the lowest boundary of the frequency range plus MBW/2. The highest frequency of the measurement position in each frequency range should be set at the highest boundary of the frequency range minus MBW/2. MBW denotes the measurement bandwidth defined for the protected band.

The spurious emission UE co-existence limits in Table 6.5.3.2.3-1 apply for all transmitter band configurations (RB) and channel bandwidths.

Table 6.5.3.2.3-1: Spurious emissions UE co-existence limits

NR Band

Spurious emission

Protected band/frequency range

Frequency range (MHz)

Maximum Level (dBm)

MBW (MHz)

NOTE

n257

NR Band n260

FDL_low

–

FDL_high

-2

100

Frequency range

57000

–

66000

2

100

Frequency range

23600

–

24000

1

200

3

n258

Frequency range

57000

–

66000

2

100

n259

NR Band 257

FDL_low

–

FDL_high

-5

100

n259

NR Band 261

FDL_low

–

FDL_high

-5

100

Frequency range

36000

–

37000

7

1000

Frequency range

57000

–

66000

2

100

n260

NR Band 257

FDL_low

–

FDL_high

-5

100

NR Band 261

FDL_low

–

FDL_high

-5

100

Frequency range

57000

–

66000

2

100

n261

NR Band 260

FDL_low

–

FDL_high

-2

100

Frequency range

57000

–

66000

2

100

NOTE 1: FDL_low and FDL_high refer to each NR frequency band specified in Table 5.2-1.

NOTE 2: Void.

NOTE 3: The protection of frequency range 23600-24000 MHz is meant for protection of satellite passive services.

The normative reference for this requirement is TS 38.101-2 subclause 6.5.3.1.

6.5.3.2.4 Test description

6.5.3.2.4.1 Initial conditions

Initial conditions are a set of test configurations the UE needs to be tested in and the steps for the SS to take with the UE to reach the correct measurement state.

The initial test configurations consist of environmental conditions, test frequencies, and channel bandwidths based on NR operating bands specified in Table 5.3.5-1. All of these configurations shall be tested with applicable test parameters for each channel bandwidth and subcarrier spacing, are shown in Table 6.5.3.2.4.1-1. The details of the uplink reference measurement channels (RMCs) are specified in Annexes A.2. Configurations of PDSCH and PDCCH before measurement are specified in Annex C.2.

Table 6.5.3.2.4.1-1: Test Configuration Table

Initial Conditions

Test Environment as specified in TS 38.508-1 [10] subclause 4.1

Normal

Test Frequencies as specified in TS 38.508-1 [10] subclause 4.3.1

Low range, High range (NOTE 2)

Test Channel Bandwidths as specified in TS 38.508-1 [10] subclause 4.3.1

Highest

Test SCS as specified in Table 5.3.5-1

120kHz

Test Parameters

Test ID

Downlink Configuration

Uplink Configuration

–

Modulation

RB allocation

(NOTE 1)

1

DFT-s-OFDM QPSK

Inner_Full for PC2, PC3 and PC4

Inner_Full_Region1 for PC1

2

DFT-s-OFDM QPSK

Inner_1RB for PC2, PC3 and PC4

Inner_Partial for PC1

(NOTE 3)

NOTE 1: The specific configuration of each RB allocation is defined in Table 6.1-1 for PC2, PC3 and PC4 or Table 6.1-2 for PC1.

NOTE 2: When testing Low range test only in Frequency Range lower than (FUL_low – ΔfOOB) and when testing High range test only in Frequency Range higher than (FUL_high + ΔfOOB).

NOTE 3: When testing Low range configure uplink RB to Inner_1RB_Left for PC2, PC3 and PC4 or Inner_Partial_Left_Region1 for PC1 and when testing High range configure uplink RB to Inner_1RB_Right for PC2, PC3 and PC4 or Inner_Partial_Right_Region1 for PC1.

1. Connection between SS and UE is shown in TS 38.508-1 [10] Annex A, Figure [TBD] for TE diagram and Figure [TBD] for UE diagram.

2. The parameter settings for the cell are set up according to TS 38.508-1 [10] subclause 4.4.3.

3. Downlink signals are initially set up according to Annex C, and uplink signals according to Annex G.

4. The UL Reference Measurement channels are set according to Table 6.5.3.2.4.1-1

5. Propagation conditions are set according to Annex B.0.

6. Ensure the UE is in state RRC_CONNECTED with generic procedure parameters Connectivity NR, Connected without release On, Test Mode On and Test Loop Function On according to TS 38.508-1 [10] clause 4.5. Message contents are defined in clause 6.5.3.2.4.3.

6.5.3.2.4.2 Test procedure

1. Select any of the three Alignment Options (1, 2, or 3) from Tables N.2-1 through N.2-3 to mount the DUT inside the QZ.

2. If the re-positioning concept is applied, position the device in DUT Orientation 1 if the maximum beam peak direction is within zenith angular range 0o≤≤90o for the alignment option selected in step 1; position the device in DUT Orientation 2 (either Options 1 or 2) if the maximum beam peak direction is within zenith angular range 90o<≤180o for DUT Orientation 1 for the alignment option selected in step 1. If the re-positioning concept is not applied, position the device in DUT Orientation 1.

3. SS sends uplink scheduling information for each UL HARQ process via PDCCH DCI format 0_1 for C_RNTI to schedule the UL RMC according to Table 6.5.3.2.4.1-1. Since the UL has no payload and no loopback data to send the UE sends uplink MAC padding bits on the UL RMC.

4. Set the UE in the Inband Tx beam peak direction found with a 3D EIRP scan as performed in Annex K.1.1. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 3) for the UE Tx beam selection to complete.

5. Send continuously uplink power control "up" commands in every uplink scheduling information to the UE; allow at least 200msec for the UE to reach PUMAX. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 3) for the UE Tx beam selection to complete.

6. SS activates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.2 using condition Tx only.

7. Measure the spurious emissions as per steps outlined below with an exception to the procedure in Annex K if the re-positioning concept is applied (NOTE 4):

(a) Perform coarse TRP measurements to identify spurious emission frequencies and corresponding power level according to the procedures in Annex K, using coarse TRP measurement grid selection criteria as per Table M.4.5-3 in Annex M. The measurement is completed in both polarizations θ and φ over frequency range and measurement bandwidth according to Table 6.5.3.2.3-1. Optionally, a larger and non-constant measurement bandwidth than that of Table 6.5.3.2.3-1 may be applied as long as the SNR (ratio of test limit to floor noise of test equipment) ≥ 10dB is guaranteed. The measurement period shall capture the active time slots. For each spurious emission frequency with coarse TRP identified to be less than an offset dB (NOTE 2) from the TRP limit according to Table 6.5.3.2.3-1, continue with fine TRP procedures according to step (b).

The offset value shall be the TRP measurement uncertainty at 95% confidence level including the effect of coarse grid measurement uncertainty element. Different coarse TRP grids and corresponding offset values may be used for different frequencies. The coarse TRP grid and offset values used shall be recorded in the test report.

(b) Measure fine TRP measurements according to procedures in Annex K, using fine TRP measurement grid selection criteria as per Table M.4.5-3 in Annex M, for each of the spurious emission frequency identified in step (a). Apply a measurement bandwidth according to Table 6.5.3.2.3-1.

8. SS deactivates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.3.

NOTE 1: The frequency range defined in Table 6.5.3.2.3-1 may be split into ranges. For each range a different test system, e.g. antenna and/or chamber, may be used. To pass the test case all verdicts of the frequency ranges must pass.

NOTE 2: The coarse TRP measurement grid and corresponding offset dB value referred in step 7(a) above, for some valid grids can be found in TR 38.903 section B.18.

NOTE 3: The BEAM_SELECT_WAIT_TIME default value is defined in Annex K.1.1.

NOTE 4: If the (in-band) beam peak is within 0o≤≤90o: perform first hemispherical TRP scan (0o≤≤90o) in DUT Orientation 1 and second hemispherical TRP scan (90o>≥0o) in DUT Orientation 2. If the (in-band) beam peak is within 90o<≤180o: perform first hemispherical TRP scan (0o≤≤90o) in DUT Orientation 2 and second hemispherical TRP scan (90o>≥0o) in DUT Orientation 1. The DUT with UBF activated needs to be re-positioned during the test.

6.5.3.2.4.3 Message contents

Message contents are according to TS 38.508-1 [10] subclause 4.6 with TRANSFORM_PRECODER_ENABLED condition in Table 4.6.3-118 PUSCH-Config.

6.5.3.2.5 Test requirement

This clause specifies the requirements for the specified NR band for Transmitter Spurious emissions for UE co-existence requirement with frequency range as indicated in Table 6.5.3.2.5-1.

The maximum TRP power of spurious emission for UE co-existence, measured using RMS detector, shall not exceed the described value in Table 6.5.3.2.5-1.

The spurious emission UE co-existence limits in Table 6.5.3.2.5-1 apply for all transmitter band configurations (NRB) and channel bandwidths.

NOTE: For measurement conditions at the edge of each frequency range, the lowest frequency of the measurement position in each frequency range should be set at the lowest boundary of the frequency range plus MBW/2. The highest frequency of the measurement position in each frequency range should be set at the highest boundary of the frequency range minus MBW/2. MBW denotes the measurement bandwidth defined for the protected band.

Table 6.5.3.2.5-1: Spurious emissions UE co-existence test requirements

NR Band

Spurious emission

Protected band/frequency range

Frequency range (MHz)

Maximum Level (dBm)

MBW (MHz)

NOTE

n257

NR Band n260

FDL_low

–

FDL_high

-2 + 5.0

100

NOTE 3

Frequency range

57000

–

66000

2

100

Frequency range

23600

–

24000

1 + 0.3

200

NOTE 6

n258

Frequency range

57000

–

66000

2

100

n259

NR Band 257

FDL_low

–

FDL_high

-5 + 3.3

100

n259, NOTE 4

NR Band 261

FDL_low

–

FDL_high

-5 + 3.3

100

NOTE 4

Frequency range

36000

–

37000

7 + 6.0

1000

NOTE 5

Frequency range

57000

–

66000

2

100

n260

NR Band 257

FDL_low

–

FDL_high

-5 + 3.3

100

NOTE 4

NR Band 261

FDL_low

–

FDL_high

-5 + 3.3

100

NOTE 4

Frequency range

57000

–

66000

2

100

n261

NR Band 260

FDL_low

–

FDL_high

-2 + 5.0

100

NOTE 3

Frequency range

57000

–

66000

2

100

NOTE 1: FDL_low and FDL_high refer to each NR frequency band specified in Table 5.2-1.

NOTE 2: Void.

NOTE 3: 5.0 dB relaxation due to testability limit

NOTE 4: 3.3 dB relaxation due to testability limit

NOTE 5: 6.0 dB relaxation due to testability limit

NOTE 6: 0.3 dB relaxation due to testability limit

6.5.3.3 Additional spurious emissions

Editor’s note: This clause is complete for Band n257 and n258 and PC3. The following aspects of the clause are for future consideration:

  • Connection diagram between SS and UE in TS 38.508-1 [10] Annex A is FFS.
  • Test procedure only includes the testing of smartphone and is FFS for laptop and FWA.

6.5.3.3.1 Test purpose

Additional spurious emission requirements are signalled by the network to indicate that the UE shall meet an additional requirement for a specific deployment scenario as part of the cell handover/broadcast message.

6.5.3.3.2 Test applicability

This test case applies to all types of NR UE release 15 and forward.

6.5.3.3.3 Minimum conformance requirements

The additional spurious emission limits in Table 6.5.3.3.3-2 through Table 6.5.3.3.3-3 apply for all transmitter band configurations (RB) and channel bandwidths. The requirement is verified in beam locked mode with the test metric of TRP (Link=TX beam peak direction, Meas=TRP grid).

NOTE: For measurement conditions at the edge of each frequency range, the lowest frequency of the measurement position in each frequency range should be set at the lowest boundary of the frequency range plus MBW/2. The highest frequency of the measurement position in each frequency range should be set at the highest boundary of the frequency range minus MBW/2. MBW denotes the measurement bandwidth defined for the protected band.

Table 6.5.3.3.3-1: Void

When "NS_202" is indicated in the cell, the power of any UE emission shall not exceed the levels specified in Table 6.5.3.3.3-2.

Table 6.5.3.3.3-2: Additional spurious emissions (NS_202) test limits

Frequency Range

Maximum Level

Measurement bandwidth

7.25 GHz ≤ f ≤ 2nd harmonic of the upper frequency edge of the UL operating band

-10 dBm

100 MHz

23.6 GHz  f 24.0 GHz

+1 dBm

200 MHz

NOTE 1: This requirement also applies for the frequency ranges that are less than FOOB (MHz) in Table 6.5.3.1.3-1 from the edge of the channel bandwidth. The protection of frequency range 23600 – 24000 MHz is meant for protection of satellite passive services.

When "NS_203" is indicated in the cell, the power of any UE emission shall not exceed the levels specified in Table 6.5.3.3.3-3. This requirement also applies for the frequency ranges that are less than FOOB (MHz) in Table 6.5.3.1.3-1 from the edge of the channel bandwidth.

Table 6.5.3.3.3-3: Additional spurious emissions (NS_203) test limits

Frequency band

(GHz)

Spectrum emission limit (dBm)

Measurement bandwidth

23.6 f 24.0

+1

200 MHz

The normative reference for this requirement is TS 38.101-2 subclause 6.5.3.2.

6.5.3.3.4 Test description

6.5.3.3.4.1 Initial conditions

Initial conditions are a set of test configurations the UE needs to be tested in and the steps for the SS to take with the UE to reach the correct measurement state.

The initial test configurations consist of environmental conditions, test frequencies, and channel bandwidths based on NR operating bands specified in Table 5.3.5-1. All of these configurations shall be tested with applicable test parameters for each channel bandwidth and subcarrier spacing, are shown in Table 6.5.3.3.4.1-1. The details of the uplink reference measurement channels (RMCs) are specified in Annexes A.2. Configurations of PDSCH and PDCCH before measurement are specified in Annex C.2.

Table 6.5.3.3.4.1-1: Test Configuration Table for NS_202

Initial Conditions

Test Environment as specified in TS 38.508-1 [10] subclause 4.1

Normal

Test Frequencies as specified in TS 38.508-1 [10] subclause 4.3.1

Low range, High range (NOTE 2)

Test Channel Bandwidths as specified in TS 38.508-1 [10] subclause 4.3.1

Highest

Test SCS as specified in Table 5.3.5-1

120kHz

Test Parameters

Test ID

Downlink Configuration

Uplink Configuration

–

Modulation

RB allocation

(NOTE 1)

1 (NOTE 5)

DFT-s-OFDM QPSK

Inner_Full

2

DFT-s-OFDM QPSK

Inner_1RB_Left for PC2, PC3 and PC4

Inner_Partial for PC1 (NOTE 3)

3 (NOTE 4)

DFT-s-OFDM 64QAM

Outer_Full

NOTE 1: The specific configuration of each RB allocation is defined in Table 6.1-1 for PC2, PC3 and PC4 or Table 6.1-2 for PC1.

NOTE 2: When testing Low range test only in Frequency Range lower than (FUL_low – ΔfOOB) and when testing High range test only in Frequency Range higher than (FUL_high + ΔfOOB).

NOTE 3: When testing Low range configure uplink RB to Inner_1RB_Left for PC2, PC3 and PC4 or Inner_Partial_Left_Region1 for PC1 and when testing High range configure uplink RB to Inner_1RB_Right for PC2, PC3 and PC4 or Inner_Partial_Right_Region1 for PC1.

NOTE 4: Test ID only applicable to PC1

NOTE 5: Test ID not applicable to PC1.

Table 6.5.3.3.4.1-2: Test Configuration Table for NS_203

Initial Conditions

Test Environment as specified in TS 38.508-1 [10] subclause 4.1

Normal

Test Frequencies as specified in TS 38.508-1 [10] subclause 4.3.1

Low range

Test Channel Bandwidths as specified in TS 38.508-1 [10] subclause 4.3.1

Highest

Test SCS as specified in Table 5.3.5-1

120kHz

Test Parameters

Test ID

Frequency

Channel Bandwidth

Downlink Configuration

Uplink Configuration

–

Modulation

RB allocation

(NOTE 1)

1

Default

Default

DFT-s-OFDM QPSK

Inner_Full

2

Default

Default

DFT-s-OFDM QPSK

Inner_1RB_Left for PC2, PC3 and PC4

Inner_Partial_Left_Region1 for PC1

3 (NOTE 2)

Low range + Channel Bandwidth (NOTE 3)

Default

DFT-s-OFDM QPSK

Inner_Partial_Left_Region1

NOTE 1: The specific configuration of each RB allocation is defined in Table 6.1-1 for PC2, PC3 and PC4 or Table 6.1-2 for PC1.

NOTE 2: Test ID only applicable to PC1.

NOTE 3: Test frequency for test ID 3 is sepecified in Table 6.2.3.4.1-4.

1. Connection between SS and UE is shown in TS 38.508-1 [10] Annex A, Figure [TBD] for TE diagram and Figure [TBD] for UE diagram.

2. The parameter settings for the cell are set up according to TS 38.508-1 [10] subclause 4.4.3.

3. Downlink signals are initially set up according to Annex C, and uplink signals according to Annex G.

4. The UL Reference Measurement channels are set according to Table 6.5.3.3.4.1-1

5. Propagation conditions are set according to Annex B.0.

6. Ensure the UE is in state RRC_CONNECTED with generic procedure parameters Connectivity NR, Connected without release On, Test Mode On and Test Loop Function On according to TS 38.508-1 [10] clause 4.5. Message contents are defined in clause 6.5.3.3.4.3.

6.5.3.3.4.2 Test procedure

1. Select any of the three Alignment Options (1, 2, or 3) from Tables N.2-1 through N.2-3 to mount the DUT inside the QZ.

2. If the re-positioning concept is applied, position the device in DUT Orientation 1 if the maximum beam peak direction is within zenith angular range 0o≤≤90o for the alignment option selected in step 1; position the device in DUT Orientation 2 (either Options 1 or 2) if the maximum beam peak direction is within zenith angular range 90o<≤180o for DUT Orientation 1 for the alignment option selected in step 1. If the re-positioning concept is not applied, position the device in DUT Orientation 1.

3. SS sends uplink scheduling information for each UL HARQ process via PDCCH DCI format 0_1 for C_RNTI to schedule the UL RMC according to Table 6.5.3.3.4.1-1. Since the UL has no payload and no loopback data to send the UE sends uplink MAC padding bits on the UL RMC.

4. Set the UE in the Inband Tx beam peak direction found with a 3D EIRP scan as performed in Annex K.1.1. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 3) for the UE Tx beam selection to complete.

5. Send continuously uplink power control "up" commands in every uplink scheduling information to the UE; allow at least 200msec for the UE to reach PUMAX. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 3) for the UE Tx beam selection to complete.

6. SS activates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.2 using condition Tx only.

7. Measure the spurious emissions as per steps outlined below with an exception to the procedure in Annex K if the re-positioning concept is applied (NOTE 4). Step (a) is optional and applicable only if SNR (test requirement level in Table 6.5.3.3.5-2 through Table 6.5.3.3.5-3, minus offset value minus noise floor of the test system) ≥ 0 dB is guaranteed.

(a) Perform coarse TRP measurements to identify spurious emission frequencies and corresponding power level according to the procedures in Annex K, using coarse TRP measurement grid selection criteria as per Table M.4.5-3 in Annex M. The measurement is completed in both polarizations θ and φ over frequency range and measurement bandwidth according to Table 6.5.3.3.5-2 through Table 6.5.3.3.5-3. Optionally, a larger and non-constant measurement bandwidth than that of Table 6.5.3.3.5-2 through Table 6.5.3.3.5-3 may be applied. The measurement period shall capture the active time slots. For each spurious emission frequency with coarse TRP identified to be less than an offset dB from the TRP limit according to Table 6.5.3.3.5-2 through Table 6.5.3.3.5-3, continue with fine TRP procedures according to step (b).

The offset value shall be the TRP measurement uncertainty at 95% confidence level including the effect of coarse grid measurement uncertainty element. Different coarse TRP grids and corresponding offset values may be used for different frequencies. The coarse TRP grid and offset values used shall be recorded in the test report.

(b) Measure fine TRP measurements according to procedures in Annex K, using fine TRP measurement grid selection criteria as per Table M.4.5-3 in Annex M, for each of the spurious emission frequency identified in step (a). Apply a measurement bandwidth according to Table 6.5.3.3.5-2 through Table 6.5.3.3.5-3.

8. SS deactivates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.3.

NOTE 1: The frequency range defined in Table 6.5.3.3.5-2 through Table 6.5.3.3.5-3 may be split into ranges. For each range a different test system, e.g. antenna and/or chamber, may be used. To pass the test case all verdicts of the frequency ranges must pass.

NOTE 2: The coarse TRP measurement grid and corresponding offset dB value referred in step 7(a) above, for some valid grids can be found in TR 38.903 [20] section B.18.

NOTE 3: The BEAM_SELECT_WAIT_TIME default value is defined in Annex K.1.1.

NOTE 4: If the (in-band) beam peak is within 0o≤≤90o: perform first hemispherical TRP scan (0o≤≤90o) in DUT Orientation 1 and second hemispherical TRP scan (90o>≥0o) in DUT Orientation 2. If the (in-band) beam peak is within 90o<≤180o: perform first hemispherical TRP scan (0o≤≤90o) in DUT Orientation 2 and second hemispherical TRP scan (90o>≥0o) in DUT Orientation 1. The DUT with UBF activated needs to be re-positioned during the test.

6.5.3.3.4.3 Message contents

Message contents are according to TS 38.508-1 [10] subclause 4.6 with TRANSFORM_PRECODER_ENABLED condition in Table 4.6.3-118 PUSCH-Config and with the following exceptions:

Information element additionalSpectrumEmission is set to NS_202. This can be set in SIB1 as part of the cell broadcast message. This exception indicates that the UE shall meet the additional spurious emission requirement for a specific deployment scenario.

Table 6.5.3.3.4.3-1: AdditionalSpectrumEmission: Additional spurious emissions test requirement for "NS_202”

Derivation Path: TS 38.508-1 [10] clause 4.6.3, Table 4.6.3-1

Information Element

Value/remark

Comment

Condition

additionalSpectrumEmission

2 (NS_202)

Information element additionalSpectrumEmission is set to NS_203. This can be set in SIB1 as part of the cell broadcast message. This exception indicates that the UE shall meet the additional spurious emission requirement for a specific deployment scenario.

Table 6.5.3.3.4.3-2: AdditionalSpectrumEmission: Additional spurious emissions test requirement for "NS_203”

Derivation Path: TS 38.508-1 [10] clause 4.6.3, Table 4.6.3-1

Information Element

Value/remark

Comment

Condition

additionalSpectrumEmission

3 (NS_203)

6.5.3.3.5 Test requirement

This clause specifies the requirements for the specified NR band for Transmitter Additional Spurious emissions requirement with frequency range as indicated in Table 6.5.3.3.5-2 and Table 6.5.3.3.5-3.

The maximum TRP power of spurious emission for Transmitter Additional Spurious emissions, measured using RMS detector, shall not exceed the described value in Table 6.5.3.3.5-2 and Table 6.5.3.3.5-3.

The Transmitter Additional Spurious emissions limits in Table 6.5.3.3.5-2 and Table 6.5.3.3.5-3 apply for all transmitter band configurations (NRB) and channel bandwidths.

NOTE: For measurement conditions at the edge of each frequency range, the lowest frequency of the measurement position in each frequency range should be set at the lowest boundary of the frequency range plus MBW/2. The highest frequency of the measurement position in each frequency range should be set at the highest boundary of the frequency range minus MBW/2. MBW denotes the measurement bandwidth defined for the protected band.

Table 6.5.3.3.5-1: Void

Table 6.5.3.3.5-2: Additional spurious emissions (NS_202) test requirements

Frequency Range

Maximum Level (dBm)

Measurement bandwidth

NOTE

7.25 GHz ≤ f ≤ 12.75 GHz

-10

100 MHz

12.75 GHz ≤ f ≤ 23.45 GHz

-10 + 13

100 MHz

NOTE 1

23.45 GHz ≤ f ≤ 40.8 GHz

-10 + 13

100 MHz

NOTE 1

40.8 GHz ≤ f ≤ 2nd harmonic of the upper frequency edge of the UL operating band

-10 + 13

100 MHz

NOTE 1

23.6 GHz ≤ f ≤ 24.0 GHz

+1 +0.3

200 MHz

NOTE 2

NOTE 1: 13 dB relaxation due to testability limit

NOTE 2: 0.3 dB relaxation due to testability limit

Table 6.5.3.3.5-3: Additional spurious emissions (NS_203) test requirements

Frequency band

(GHz)

Spectrum emission limit (dBm)

Measurement bandwidth

NOTE

23.6 ≤ f ≤ 24.0

+1 + 0.3

200 MHz

NOTE 1

NOTE 1: 0.3 dB relaxation due to testability limit