6.4 Transmit signal quality

38.521-23GPPNRPart 2: Range 2 StandaloneRadio transmission and receptionRelease 17TSUser Equipment (UE) conformance specification

6.4.1 Frequency error

6.4.1.1 Test purpose

This test verifies the ability of both, the receiver and the transmitter, to process frequency correctly.

Receiver: to extract the correct frequency from the stimulus signal, offered by the System simulator, under ideal propagation conditions and low level.

Transmitter: to derive the correct modulated carrier frequency from the results, gained by the receiver.

6.4.1.2 Test applicability

This test case applies to all types of NR UE release 15 and forward.

6.4.1.3 Minimum conformance requirements

The UE basic measurement interval of modulated carrier frequency is 1 UL slot. The mean value of basic measurements of UE modulated carrier frequency shall be accurate to within ±0.1 PPM observed over a period of 1 msec of cumulated measurement intervals compared to the carrier frequency received from the NR gNB.

The frequency error is defined as a directional requirement. The requirement is verified in beam locked mode with the test metric of Frequency (Link=TX beam peak direction, Meas=Link angle).

The normative reference for this requirement is TS 38.101-2 [3] clause 6.4.1

6.4.1.4 Test description

6.4.1.4.1 Initial condition

Initial conditions are a set of test configurations the UE needs to be tested in and the steps for the SS to take with the UE to reach the correct measurement state.

The initial test configurations consist of environmental conditions, test frequencies, test channel bandwidths and sub-carrier spacing based on NR operating bands specified in Table 5.3.5-1. All of these configurations shall be tested with applicable test parameters for each combination of channel bandwidth and sub-carrier spacing, are shown in Table 6.4.1.4.1-1. The details of the uplink and downlink reference measurement channels (RMCs) are specified in Annexes A.2 and A.3. Configurations of PDSCH and PDCCH before measurement are specified in Annex C.2.

Table 6.4.1.4.1-1: Test Configuration Table

Initial Conditions

Test Environment as specified in TS 38.508-1 [10] subclause 4.1

Normal, TL, TH

Test Frequencies as specified in TS 38.508-1 [10] subclause 4.3.1

Mid range

Test Channel Bandwidths as specified in TS 38.508-1 [10] subclause 4.3.1

Highest

Test SCS as specified in Table 5.3.5-1.

Lowest

Test Parameters

Downlink Configuration

Uplink Configuration

Test ID

Modulation

RB allocation

Modulation

RB allocation

1

CP-OFDM QPSK

Full RB (NOTE 1)

DFT-s-OFDM QPSK

REFSENS (NOTE 2)

NOTE 1: Full RB allocation shall be used per each SCS and channel BW as specified in Table 7.3.2.4.1-2.

NOTE 2: REFSENS refers to Table 7.3.2.4.1-3 which defines uplink RB configuration and start RB location for each SCS, channel BW and NR band.

1. Connection between SS and UE is shown in TS 38.508-1 [10] Annex A, Figure A.3.3.1.1 for TE diagram and section A.3.4.1.1 for UE diagram.

2. The parameter settings for the cell are set up according to TS 38.508-1 [10] subclause 4.4.3.

3. Downlink signals are initially set up according to Annex C, and uplink signals according to Annex G.

4. The DL and UL Reference Measurement channels are set according to Table 6.4.1.4.1-1.

5. Propagation conditions are set according to Annex B.0.

6. Ensure the UE is in state RRC_CONNECTED with generic procedure parameters Connectivity NR, Connected without release On, Test Mode On and Test Loop Function On according to TS 38.508-1 [10] clause 4.5. Message contents are defined in clause 6.4.1.4.3

6.4.1.4.2 Test procedure

1. Retrieve the LO position from the parameter txDirectCurrentLocation in UplinkTxDirectCurrent IE.

2. SS transmits PDSCH via PDCCH DCI format 1_1 for C_RNTI to transmit the DL RMC according to Table 6.4.1.4.1-1. The SS sends downlink MAC padding bits on the DL RMC.

3. SS sends uplink scheduling information for each UL HARQ process via PDCCH DCI format 0_1 for C_RNTI to schedule the UL RMC according to Table 6.4.1.4.1-1. Since the UL has no payload and no loopback data to send the UE sends uplink MAC padding bits on the UL RMC.

5. Set the UE in the Inband Tx beam peak direction and apply the associated polarization for the DL, both found with a 3D EIRP scan as performed in Annex K.1.1. Connect the SS (System Simulator) with the DUT through the measurement antenna with polarization reference PolLink to form the TX beam towards the TX beam peak direction and respective polarization. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 1) for the UE Tx beam selection to complete.

4. Send continuously uplink power control "up" commands to the UE in every uplink scheduling information to the UE so that the UE transmits at PUMAX level for the duration of the test. Allow at least 200ms starting from the first TPC Command for the UE to reach PUMAX level. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 1) for the UE Tx beam selection to complete.

6. SS activates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.2 using condition TxRx.

7. Measure the Frequency Error using Global In-Channel Tx-Test (Annex E) for the θ- and φ-polarization of the UL. For TDD, only slots consisting of only UL symbols are under test.

NOTE 1: The BEAM_SELECT_WAIT_TIME default value is defined in Annex K.1.1.

6.4.1.4.3 Message contents

Message contents are according to TS 38.508-1 [10] subclause 4.6 with DFT-s-OFDM condition in Table 4.6.3-118 PUSCH-Config.

6.4.1.5 Test requirement

The 10 frequency error Δf results for the θ-polarization or the 10 frequency error Δf results for the φ-polarization must fulfil the test requirement:

|Δf| ≤ (0.1 PPM + 0.005 PPM),

6.4.2 Transmit modulation quality

Transmit modulation quality defines the modulation quality for expected in-channel RF transmissions from the UE. The transmit modulation quality is specified in terms of:

– Error Vector Magnitude (EVM) for the allocated resource blocks (RBs)

– EVM equalizer spectrum flatness derived from the equalizer coefficients generated by the EVM measurement process

– Carrier leakage

– In-band emissions for the non-allocated RB

All the parameters defined in subclause 6.4.2 are defined using the measurement methodology specified in Annex E.

All the requirements in 6.4.2 are defined as directional requirement. The requirements are verified in beam locked mode on beam peak direction, with parameter maxRank (as defined in TS 38.331 [19]) set to 1. The requirements are applicable to UL transmission from each configurable antenna port (as defined in TS 38.331 [19]) of UE, enabled one at a time.

In case the parameter 3300 or 3301 is reported from UE via txDirectCurrentLocation IE (as defined in TS 38.331 [19]), carrier leakage measurement requirement in subclause 6.4.2.2 and 6.4.2.3 shall be waived, and the RF correction with regard to the carrier leakage and IQ image shall be omitted during the calculation of transmit modulation quality.

6.4.2.1 Error vector magnitude

Editor’s note: This clause is incomplete. The following aspects are either missing or not yet determined:

  • Measurement Uncertainty and Test Tolerance are FFS except for PUSCH, PC3 in FR2a and FR2b.

6.4.2.1.1 Test Purpose

The Error Vector Magnitude is a measure of the difference between the reference waveform and the measured waveform. This difference is called the error vector. Before calculating the EVM, the measured waveform is corrected by the sample timing offset and RF frequency offset. Then the carrier leakage shall be removed from the measured waveform before calculating the EVM.

The measured waveform is further equalised using the channel estimates subjected to the EVM equaliser spectrum flatness requirement specified in sub-clauses 6.4.2.4.3 and 6.4.2.5.3. For DFT-s-OFDM waveforms, the EVM result is defined after the front-end FFT and IDFT as the square root of the ratio of the mean error vector power to the mean reference power expressed as a %. For CP-OFDM waveforms, the EVM result is defined after the front-end FFT as the square root of the ratio of the mean error vector power to the mean reference power expressed as a %.

The basic EVM measurement interval in the time domain is one preamble sequence for the PRACH and the duration of PUCCH/PUSCH channel, or one hop, if frequency hopping is enabled for PUCCH and PUSCH in the time domain. The EVM measurement interval is reduced by any symbols that contain an allowable power transient as defined in subclause 6.3.3.3.

6.4.2.1.2 Test applicability

This test case applies to all types of NR UE release 15 and forward.

6.4.2.1.3 Minimum conformance requirements

The RMS average of the basic EVM measurements for the average EVM case, and for the reference signal EVM case, for the different modulation schemes shall not exceed the values specified in Table 6.4.2.1.3-1 for the parameters defined in Table 6.4.2.1.3-2 or Table 6.4.2.1.3-3 depending on UE power class. For EVM evaluation purposes, all 13 PRACH preamble formats and all 5 PUCCH formats are considered to have the same EVM requirement as QPSK modulated.

The measurement interval for the EVM determination is 10 subframes. The requirement is verified with the test metric of EVM (Link=TX beam peak direction, Meas=Link angle).

Table 6.4.2.1.3-1: Minimum requirements for error vector magnitude

Parameter

Unit

Average EVM level

Reference signal EVM level

Pi/2 BPSK

%

30.0

30.0

QPSK

%

17.5

17.5

16 QAM

%

12.5

12.5

64 QAM

%

8.0

8.0

Table 6.4.2.1.3-2: Parameters for Error Vector Magnitude for power class 1

Parameter

Unit

Level

UE EIRP

dBm

≥ 4

UE EIRP for UL 16QAM

dBm

≥ 7

UE EIRP for UL 64QAM

dBm

≥ 11

Operating conditions

Normal conditions

Table 6.4.2.1.3-3: Parameters for Error Vector Magnitude for power class 2, 3, and 4

Parameter

Unit

Level

UE EIRP

dBm

≥ -13

UE EIRP for UL 16QAM

dBm

≥ -10

UE EIRP for UL 64QAM

dBm

≥ -6

Operating conditions

Normal conditions

The normative reference for this requirement is TS 38.101-2 [3] clause 6.4.2.1.

6.4.2.1.4 Test description

6.4.2.1.4.1 Initial conditions

Initial conditions are a set of test configurations the UE needs to be tested in and the steps for the SS to take with the UE to reach the correct measurement state.

The initial test configurations consist of environmental conditions, test frequencies, test channel bandwidths and sub-carrier spacing based on NR operating bands specified in Table 5.3.5-1. All of these configurations shall be tested with applicable test parameters for each combination of channel bandwidth and sub-carrier spacing, are shown in Table 6.4.2.1.4.1-1. The details of the uplink reference measurement channels (RMCs) are specified in Annex A.2. Configurations of PDSCH and PDCCH before measurement are specified in Annex C.2.

Table 6.4.2.1.4.1-1: Test Configuration Table for PUSCH

Initial Conditions

Test Environment as specified in TS 38.508-1 [10] subclause 4.1

Normal

Test Frequencies as specified in TS 38.508-1 [10] subclause 4.3.1

Low range, Mid range, High range

Test Channel Bandwidths as specified in TS 38.508-1 [10] subclause 4.3.1

Lowest, Highest

Test SCS as specified in Table 5.3.5-1

Lowest, Highest

Test Parameters

Test ID

Downlink Configuration

Uplink Configuration

Modulation

RB allocation (NOTE 1)

1

DFT-s-OFDM PI/2 BPSK

Inner_Full for PC2, PC3 and PC4

Inner_Full_Region1 for PC1

2

DFT-s-OFDM PI/2 BPSK

Outer_Full

3

DFT-s-OFDM QPSK

Inner_Full for PC2, PC3 and PC4

Inner_Full_Region1 for PC1

4

DFT-s-OFDM QPSK

Outer_Full

5

DFT-s-OFDM 16 QAM

Inner_Full for PC2, PC3 and PC4

Inner_Full_Region1 for PC1

6

DFT-s-OFDM 16 QAM

Outer_Full

7

DFT-s-OFDM 64 QAM

Inner_Full for PC2, PC3 and PC4

Inner_Full_Region1 for PC1

8

DFT-s-OFDM 64 QAM

Outer_Full

9

CP-OFDM QPSK

Inner_Full for PC2, PC3 and PC4

Inner_Full_Region1 for PC1

10

CP-OFDM QPSK

Outer_Full

11

CP-OFDM 16 QAM

Inner_Full for PC2, PC3 and PC4

Inner_Full_Region1 for PC1

12

CP-OFDM 16 QAM

Outer_Full

13

CP-OFDM 64 QAM

Inner_Full for PC2, PC3 and PC4

Inner_Full_Region1 for PC1

14

CP-OFDM 64 QAM

Outer_Full

NOTE 1: The specific configuration of each RB allocation is defined in Table 6.1-1 for PC2, PC3 and PC4 or Table 6.1-2 for PC1.

NOTE 2: Test Channel Bandwidths are checked separately for each NR band, which applicable channel bandwidths are specified in Table 5.3.5-1.

NOTE 3: The following test points are not testable for PC3 devices:

FR2a channel bandwidth 200MHz: test points 8, 13 and 14

FR2a channel bandwidth 400MHz: test points 7, 8, 11, 12, 13 and 14

FR2b channel bandwidth 50MHz: test points 13 and 14

FR2b channel bandwidth 100MHz: test points 7, 8, 13 and 14

FR2b channel bandwidth 200MHz: test points 7, 8, 13 and 14

FR2b channel bandwidth 400MHz: test points 5, 6, 7, 8, 11, 12, 13 and 14

Table 6.4.2.1.4.1-2: Test Configuration Table for PUCCH

Initial Conditions

Test Environment as specified in TS 38.508-1 [10] subclause 4.1

Normal

Test Frequencies as specified in TS 38.508-1 [10] subclause 4.3.1

See Table 6.4.2.1.4.1-1

Test Channel Bandwidths as specified in TS 38.508-1 [10] subclause 4.3.1

See Table 6.4.2.1.4.1-1

Test SCS as specified in Table 5.3.5-1

See Table 6.4.2.1.4.1-1

Test Parameters

ID

Downlink Configuration

Uplink Configuration

Modulation

RB allocation

Waveform

PUCCH format

1

CP-OFDM QPSK

Full RB (Note 1)

CP-OFDM

PUCCH format = Format 1

Length in OFDM symbols = 14

2

CP-OFDM QPSK

Full RB (Note 1)

DFT-s-OFDM

PUCCH format = Format 3

Length in OFDM symbols = 14

NOTE 1: Full RB allocation shall be used per each SCS and channel BW as specified in Table 7.3.2.4.1-2.

NOTE 2: Test Channel Bandwidths are checked separately for each NR band, which applicable channel bandwidths are specified in Table 5.3.5-1.

Table 6.4.2.1.4.1-3: Test Configuration for PRACH

Initial Conditions

Test Environment as specified in TS 38.508-1 [10] subclause 4.1

Normal

Test Frequencies as specified in TS 38.508-1 [10] subclause 4.3.1

See Table 6.4.2.1.4.1-1

Test Channel Bandwidths as specified in TS 38.508-1 [10] subclause 4.3.1

See Table 6.4.2.1.4.1-1

Test SCS as specified in Table 5.3.5-1

See Table 6.4.2.1.4.1-1

PRACH preamble format

PRACH Configuration Index

52

SS/PBCH SSS EPRE setting (dBm/120kHz)

-96

1. Connection between SS and UE is shown in TS 38.508-1 [10] Annex A, in Figure A.3.3.1.1 for TE diagram and section A.3.4.1.1 for UE diagram.

2. The parameter settings for the cell are set up according to TS 38.508-1 [10] subclause 4.4.3.

3. Downlink signals are initially set up according to Annex C, and uplink signals according to Annex G.

4. The UL Reference Measurement channels are set according to Table 6.4.2.1.4.1-1.

5. Propagation conditions are set according to Annex B.0.

6. Ensure the UE is in state RRC_CONNECTED with generic procedure parameters Connectivity NR, Connected without release On, Test Mode On and Test Loop Function On according to TS 38.508-1 [10] clause 4.5. Message contents are defined in clause 6.4.2.1.4.3

6.4.2.1.4.2 Test procedure

Test procedure for PUSCH:

1.1 Retrieve the LO position from the parameter txDirectCurrentLocation in UplinkTxDirectCurrent IE.

1.2 SS sends uplink scheduling information for each UL HARQ process via PDCCH DCI format 0_1 for C_RNTI to schedule the UL RMC according to Table 6.4.2.1.4.1-1. Since the UE has no payload data to send, the UE transmits uplink MAC padding bits on the UL RMC.

1.3 Set the UE in the Inband Tx beam peak direction found with a 3D EIRP scan as performed in Annex K.1.1. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 2) for the UE Tx beam selection to complete.

1.4 Send continuously uplink power control "up" commands in the uplink scheduling information to the UE until the UE transmits at PUMAX level. Allow at least 200 ms starting from the first TPC command in this step for the UE to reach PUMAX level. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 2) for the UE Tx beam selection to complete.

1.5 SS activates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.2 using condition TxRx.

1.6 Measure the EVMθ, EVMφ, and using Global In-Channel Tx-Test (Annex E) for the θ- and φ-polarizations, respectively. For TDD, only slots consisting of only UL symbols are under test. Calculate and .

1.7 SS deactivates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.3.

NOTE1: When switching to DFT-s-OFDM waveform, as specified in Table 6.4.2.1.4.1-1, send an NR RRCReconfiguration message according to TS 38.508-1 [10] clause 4.6.3 Table 4.6.3-118 PUSCH-Config with TRANSFORM_PRECODER_ENABLED condition.

NOTE 2: The BEAM_SELECT_WAIT_TIME default value is defined in Annex K.1.1.

Table 6.4.2.1.4.2-1: Void

Table 6.4.2.1.4.2-2: Void

Table 6.4.2.1.4.2-3: Void

Test procedure for PUCCH:

2.1 Retrieve the LO position from the parameter txDirectCurrentLocation in UplinkTxDirectCurrent IE.

2.2 PUCCH is set according to Table 6.4.2.1.4.1-2.

2.3 SS transmits PDSCH via PDCCH DCI format 1_1 for C_RNTI to transmit the DL RMC according to Table 6.4.2.1.4.1-2. The SS sends downlink MAC padding bits on the DL RMC. The transmission of PDSCH will make the UE send uplink ACK/NACK using PUCCH. There is no PUSCH transmission.

2.4 Set the UE in the Inband Tx beam peak direction found with a 3D EIRP scan as performed in Annex K.1.1. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 2) for the UE Tx beam selection to complete.

2.5 SS send appropriate TPC commands for PUCCH to the UE until the UE transmit PUCCH at [PUMAX level]. Allow at least 200 ms starting from the first TPC command in this step for the UE to reach [PUMAX level]. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 2) for the UE Tx beam selection to complete.

2.6 SS activates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.2 using condition TxRx.

2.7 Measure PUCCH EVMθ and PUCCH EVMφ using Global In-Channel Tx-Test (Annex E). Calculate .

2.8 SS deactivates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.3.

NOTE1: When switching to DFT-s-OFDM waveform, as specified in Table 6.4.2.1.4.1-2, send an NR RRCReconfiguration message according to TS 38.508-1 [10] clause 4.6.3 Table 4.6.3-118 PUSCH-Config with TRANSFORM_PRECODER_ENABLED condition.

NOTE 2: The BEAM_SELECT_WAIT_TIME default value is defined in Annex K.1.1.

Test procedure for PRACH:

3.1 Retrieve the LO position from the parameter txDirectCurrentLocation in UplinkTxDirectCurrent IE.

3.2 Set the UE in the Inband Tx beam peak direction found with a 3D EIRP scan as performed in Annex K.1.1.

3.3 The SS shall set RS EPRE according to Table 6.4.2.1.4.1-3.

3.4 PRACH is set according to Table 6.4.2.1.4.1-3.

3.5 The SS shall signal a Random Access Preamble ID via a PDCCH order to the UE and initiate a Non-contention based Random Access procedure.

3.6 The UE shall send the signalled preamble to the SS.

3.7 In response to the preamble, the SS shall transmit a random access response not corresponding to the transmitted random access preamble, or send no response.

3.8 The UE shall consider the random access response reception not successful then re-transmit the preamble with the calculated PRACH transmission power.

3.9 Repeat step 3.5 and 3.6 until the SS collect enough PRACH preambles ([2] preambles for format 0 and [10] preambles for format 4). Measure the EVMθ and EVMφ in PRACH channel using Global In-Channel Tx-Test (Annex E). Calculate .

6.4.2.1.4.3 Message contents

Message contents are according to TS 38.508-1 [10] subclause 4.6 with the following exceptions for PRACH test.

Table 6.4.2.1.4.3-1: RACH-ConfigGeneric for PRACH test

Derivation Path: TS 38.508-1 [10], Table 4.6.3-130

Information Element

Value/remark

Comment

Condition

RACH-ConfigGeneric ::= SEQUENCE {

preambleReceivedTargetPower

-60

powerRampingStep

dB0

}

Table 6.4.2.1.4.3-2: ServingCellConfigCommon

Derivation Path: TS 38.508-1 [10], Table 4.6.3-168

Information Element

Value/remark

Comment

Condition

ServingCellConfigCommon ::= SEQUENCE {

ss-PBCH-BlockPower

18

}

Table 6.4.2.1.4.3-3: ServingCellConfigCommonSIB

Derivation Path: TS 38.508-1 [10], Table 4.6.3-169

Information Element

Value/remark

Comment

Condition

ServingCellConfigCommonSIB ::= SEQUENCE {

ss-PBCH-BlockPower

18

}

6.4.2.1.5 Test requirement

The PUSCH EVM, derived in Annex E.4.2, shall not exceed the values in Table 6.4.2.1.5-1.

The PUSCH, derived in Annex E.4.6.2, shall not exceed the values in Table 6.4.2.1.5-1 when embedded with data symbols of the respective modulation scheme.

The PUCCH EVM derived in Annex E.5.9.2 shall not exceed the values for QPSK in Table 6.4.2.1.5-1.

The PRACH EVM derived in Annex E.6.9.2 shall not exceed the values for QPSK in Table 6.4.2.1.5-1.

Table 6.4.2.1.5-1: Test requirements for Error Vector Magnitude

Parameter

Unit

Average EVM Level

Reference Signal EVM Level

Pi/2 BPSK

%

30+TT

30+TT

QPSK

%

17.5+TT

17.5+TT

16 QAM

%

12.5+TT

12.5+TT

64 QAM

%

8+TT

8+TT

Table 6.4.2.1.5-2: Test Tolerance (TT) for PUSCH, PC3, FR2a

Test ID

Modulation

RB alloc.

50MHz

100MHz

200MHz

400MHz

1

DFT-s-OFDM PI/2 BPSK

Inner_Full

0.00%

0.00%

0.00%

0.00%

2

DFT-s-OFDM PI/2 BPSK

Outer_Full

0.00%

0.00%

0.00%

0.00%

3

DFT-s-OFDM QPSK

Inner_Full

0.00%

0.00%

0.00%

1.61%

4

DFT-s-OFDM QPSK

Outer_Full

0.00%

0.00%

0.00%

2.18%

5

DFT-s-OFDM 16 QAM

Inner_Full

0.00%

0.00%

1.53%

4.29%

6

DFT-s-OFDM 16 QAM

Outer_Full

0.00%

0.00%

1.67%

4.29%

7

DFT-s-OFDM 64 QAM

Inner_Full

1.06%

1.97%

3.61%

NA

8

DFT-s-OFDM 64 QAM

Outer_Full

1.44%

2.68%

NA

NA

9

CP-OFDM QPSK

Inner_Full

0.00%

0.00%

0.00%

3.66%

10

CP-OFDM QPSK

Outer_Full

0.00%

0.00%

1.37%

3.66%

11

CP-OFDM 16 QAM

Inner_Full

0.00%

1.35%

2.57%

NA

12

CP-OFDM 16 QAM

Outer_Full

0.00%

1.35%

2.57%

NA

13

CP-OFDM 64 QAM

Inner_Full

2.19%

3.97%

NA

NA

14

CP-OFDM 64 QAM

Outer_Full

2.19%

3.97%

NA

NA

NOTE 1: Test combinations without TT defined must be skipped as not testable.

Table 6.4.2.1.5-3: Test Tolerance (TT) for PUSCH, PC3, FR2b

Test ID

Modulation

RB alloc.

50MHz

100MHz

200MHz

400MHz

1

DFT-s-OFDM PI/2 BPSK

Inner_Full

0.00%

0.00%

0.00%

0.00%

2

DFT-s-OFDM PI/2 BPSK

Outer_Full

0.00%

0.00%

0.00%

2.50%

3

DFT-s-OFDM QPSK

Inner_Full

0.00%

0.00%

1.31%

2.49%

4

DFT-s-OFDM QPSK

Outer_Full

0.00%

0.00%

1.79%

4.01%

5

DFT-s-OFDM 16 QAM

Inner_Full

0.00%

1.48%

2.85%

NA

6

DFT-s-OFDM 16 QAM

Outer_Full

1.00%

1.92%

3.60%

NA

7

DFT-s-OFDM 64 QAM

Inner_Full

2.49%

NA

NA

NA

8

DFT-s-OFDM 64 QAM

Outer_Full

3.35%

NA

NA

NA

9

CP-OFDM QPSK

Inner_Full

0.00%

1.42%

2.73%

8.42%

10

CP-OFDM QPSK

Outer_Full

0.00%

1.58%

3.04%

8.42%

11

CP-OFDM 16 QAM

Inner_Full

1.72%

3.25%

5.92%

NA

12

CP-OFDM 16 QAM

Outer_Full

1.72%

3.25%

5.92%

NA

13

CP-OFDM 64 QAM

Inner_Full

NA

NA

NA

NA

14

CP-OFDM 64 QAM

Outer_Full

NA

NA

NA

NA

NOTE 1: Test combinations without TT defined must be skipped as not testable.

6.4.2.2 Carrier leakage

Editor’s note: The following aspects are either missing or not yet determined:

  • Measurement Uncertainty and Test Tolerance are FFS for power class 1, 2 and 4.
  • The test case is incomplete for band n259.

6.4.2.2.1 Test purpose

Carrier leakage expresses itself as unmodulated sine wave with the carrier frequency. It is an interference of approximately constant amplitude and independent of the amplitude of the wanted signal. Carrier leakage interferes with the sub carriers at its position (if allocated), especially, when their amplitude is small.

The purpose of this test is to exercise the UE transmitter to verify its modulation quality in terms of carrier leakage.

6.4.2.2.2 Test applicability

This test case applies to all types of NR UE release 15 and forward.

6.4.2.2.3 Minimum conformance requirements

Carrier leakage is an additive sinusoid waveform. The carrier leakage requirement is defined for each component carrier. The measurement interval is one slot in the time domain. The relative carrier leakage power is a power ratio of the additive sinusoid waveform to the power in the modulated waveform.

The requirement is verified with the test metric of Carrier Leakage (Link=TX beam peak direction, Meas=Link angle).

When carrier leakage is contained inside the spectrum confined within the configured UL and DL CCs, the relative carrier leakage power shall not exceed the values specified in Table 6.4.2.2.3-1 for power class 1 UEs.

Table 6.4.2.2.3-1: Minimum requirements for relative carrier leakage power for power class 1

Parameters

Relative Limit (dBc)

EIRP > 17 dBm

-25

4 dBm ≤ EIRP ≤ 17 dBm

-20

When carrier leakage is contained inside the spectrum occupied by the configured UL CCs and DL CCs, the relative carrier leakage power shall not exceed the values specified in Table 6.4.2.2.3-2 for power class 2.

Table 6.4.2.2.3-2: Minimum requirements for relative carrier leakage power for power class 2

Parameters

Relative Limit (dBc)

EIRP > 6 dBm

-25

-13 dBm ≤ EIRP ≤ 6 dBm

-20

When carrier leakage is contained inside the spectrum occupied by the configured UL CCs and DL CCs, the relative carrier leakage power shall not exceed the values specified in Table 6.4.2.2.3-3 for power class 3 UEs.

Table 6.4.2.2.3-3: Minimum requirements for relative carrier leakage power for power class 3

Parameters

Relative Limit (dBc)

EIRP > 0 dBm

-25

-13 dBm ≤ EIRP ≤ 0 dBm

-20

When carrier leakage is contained inside the spectrum occupied by the configured UL CCs and DL CCs, the relative carrier leakage power shall not exceed the values specified in Table 6.4.2.2.3-4 for power class 4.

Table 6.4.2.2.3-4: Minimum requirements for relative carrier leakage power for power class 4

Parameters

Relative Limit (dBc)

EIRP > 11 dBm

-25

-13 dBm ≤ EIRP ≤11 dBm

-20

The normative reference for this requirement is TS 38.101-2[3] clause 6.4.2.2.

When carrier leakage is contained inside the spectrum occupied by the configured UL CCs and DL CCs, the relative carrier leakage power shall not exceed the values specified in Table 6.4.2.2.3-6 for power class 6.

Table 6.4.2.2.3-6: Minimum requirements for relative carrier leakage power for power class 6

Parameters

Relative Limit (dBc)

EIRP > 7 dBm

-25

-6 dBm ≤ EIRP ≤ 7 dBm

-20

6.4.2.2.4 Test description

6.4.2.2.4.1 Initial condition

Initial conditions are a set of test configurations the UE needs to be tested in and the steps for the SS to take with the UE to reach the correct measurement state.

The initial test configurations consist of environmental conditions, test frequencies, test channel bandwidths and sub-carrier spacing based on NR operating bands specified in Table 5.3.5-1. All of these configurations shall be tested with applicable test parameters for each combination of channel bandwidth and sub-carrier spacing, are shown in Table 6.4.2.2.4.1-1. The details of the uplink reference measurement channels (RMCs) are specified in Annexes A.2. Configurations of PDSCH and PDCCH before measurement are specified in Annex C.2.

Table 6.4.2.2.4.1-1: Test Configuration

Initial Conditions

Test Environment as specified in TS 38.508-1 [10] subclause 4.1

Normal

Test Frequencies as specified in TS 38.508-1 [10] subclause 4.3.1

Low range, Mid range, High range

Test Channel Bandwidths as specified in TS 38.508-1 [10] subclause 4.3.1

Mid

Test SCS as specified in Table 5.3.5-1

Highest

Test Parameters

Test ID

Downlink Configuration

Uplink Configuration

Modulation

RB allocation (NOTE 1, 3)

1

DFT-s-OFDM QPSK

Inner_Partial_Left for PC2, PC3, PC4

Inner_Partial_Left_Region2 for PC1

NOTE 1: The specific configuration of each RB allocation is defined in Table 6.1-1 for PC2, PC3 and PC4 or Table 6.1-2 for PC1.

NOTE 2: Test Channel Bandwidths are checked separately for each NR band, which applicable channel bandwidths are specified in Table 5.3.5-1.

NOTE 3: When the signalled DC carrier position is at Inner_Partial_Left for PC2, PC3, PC4, use Inner_Partial_Right for UL RB allocation. When the signalled DC carrier position is in Inner_Partial_Left_Region2 for PC1, use Inner_Partial_Right_Region2 for UL RB allocation.

1. Connection between SS and UE is shown in TS 38.508-1 [10] Annex A, in Figure A.3.3.1.1 for TE diagram and section A.3.4.1.1 for UE diagram.

2. The parameter settings for the cell are set up according to TS 38.508-1 [10] subclause 4.4.3.

3. Downlink signals are initially set up according to Annex C, and uplink signals according to Annex G.

4. The UL Reference Measurement channels are set according to Table 6.4.2.2.4.1-1.

5. Propagation conditions are set according to Annex B.0.

6. Ensure the UE is in state RRC_CONNECTED with generic procedure parameters Connectivity NR, Connected without release On, Test Mode On and Test Loop Function On according to TS 38.508-1 [10] clause 4.5. Message contents are defined in clause 6.4.2.2.4.3.

7. In case the parameter 3300 or 3301 is reported from the UE via txDirectCurrentLocation IE, do not proceed to test procedure and mark the test not applicable with reasoning in the test report.

6.4.2.2.4.2 Test procedure

1. Retrieve the LO position from the parameter txDirectCurrentLocation in UplinkTxDirectCurrent IE.

2. SS sends uplink scheduling information for each UL HARQ process via PDCCH DCI format 0_1 for C_RNTI to schedule the UL RMC according to Table 6.4.2.2.4.1-1. Since the UE has no payload and no loopback data to send the UE sends uplink MAC padding bits on the UL RMC.

3. Set the UE in the Inband Tx beam peak direction found with a 3D EIRP scan as performed in Annex K.1.1. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 1) for the UE Tx beam selection to complete.

4. Send uplink power control commands to the UE using 1dB power step size to ensure that the UE EIRPTotal = EIRPθ + EIRPφ measured by the test system is within the Uplink power control window, defined as +MU to +(MU + Uplink power control window size) dB of the target power level Preq, where:

– Preq is the power level specified in Table 6.4.2.2.4.2-1 according to the power class.

– MU is the test system uplink absolute power measurement uncertainty and is specified in Table F.1.2-1 under carrier leakage sub-clause for the carrier frequency f and the channel bandwidth BW.

– Uplink power control window size = 1dB (UE power step size) + 5 dB (UE power step tolerance) + (Test system uplink relative power measurement uncertainty), where, the UE power step tolerance is specified in TS 38.101-1 [2], Table 6.3.4.3-1 and is 5dB for 1dB power step size, and the Test system uplink relative power measurement uncertainty is specified in Table F.1.2-1.

Allow at least BEAM_SELECT_WAIT_TIME (NOTE 1) for the UE Tx beam selection to complete.

5. SS activates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.2 using condition TxRx.

6. Measure carrier leakage using Global In-Channel Tx-Test (Annex E) for the θ- and φ-polarization at the LO position obtained in step 1. For TDD, only slots consisting of only UL symbols are under test. Calculate CarrLeak = min(CarrLeakθ , CarrLeakφ).

7. SS deactivates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.3.

NOTE 1: The BEAM_SELECT_WAIT_TIME default value is defined in Annex K.1.1.

NOTE 2: The purpose of the Uplink power control window is to ensure that the actual UE output power is no less than the target power level, and as close as possible to the target power level. The relationship between the Uplink power control window, the target power level and the corresponding possible actual UE Uplink power window is illustrated in Annex F.4.2.

Table 6.4.2.2.4.2-1: UE EIRP Preq (dBm) for carrier leakage

Power Class

Preq (dBm) for step 3

Power Class 1

17

Power Class 2

6

Power Class 3

0

Power Class 4

11

Table 6.4.2.2.4.2-2: Void.

6.4.2.2.4.3 Message contents

Message contents are according to TS 38.508-1 [10] subclause 4.6 with TRANSFORM_PRECODER_ENABLED condition in Table 4.6.3-118 PUSCH-Config.

6.4.2.2.5 Test requirement

For each of the n carrier leakage results derived in Annex E.3.1 for θ- and φ-polarization the minimum is calculated according to

CarrLeak = min(CarrLeakθ , CarrLeakφ), where

.

Each of the n carrier leakage results CarrLeak shall not exceed the values in Table 6.4.2.2.5-1 to Table 6.4.2.2.5-4. Allocated RBs are not under test.

Table 6.4.2.2.5-1a: Test requirements for relative carrier leakage power for power class 1

Parameter

Relative limit (dBc)

17 dBm + MU < EIRP ≤ 17 dBm + MU + Uplink power control window size

-25 + TT

Table 6.4.2.2.5-1b: Test Tolerance (carrier leakage for power class 1)

Test Metric

FR2a

FR2b

Max device size ≤ 30 cm

TBD

TBD

Table 6.4.2.2.5-2a: Test requirements for relative carrier leakage power for power class 2

Parameter

Relative limit (dBc)

6 dBm + MU < EIRP ≤ 6 dBm + MU + Uplink power control window size

-25 + TT

Table 6.4.2.2.5-2b: Test Tolerance (carrier leakage for power class 2)

Test Metric

FR2a

FR2b

Max device size ≤ 30 cm

TBD

TBD

Table 6.4.2.2.5-3a: Test requirements for relative carrier leakage power for power class 3

Parameter

Relative limit (dBc)

0 dBm + MU < EIRP ≤ 0 dBm + MU + Uplink power control window size

-25 + TT

Table 6.4.2.2.5-3b: Test Tolerance (carrier leakage for power class 3)

Test Metric

FR2a

FR2b

Max device size ≤ 30 cm

3.54 dB

3.62 dB

Table 6.4.2.2.5-4a: Test requirements for relative carrier Leakage Power for power class 4

Parameter

Relative limit (dBc)

11 dBm + MU < EIRP ≤ 11 dBm + MU + Uplink power control window size

-25 + TT

Table 6.4.2.2.5-4b: Test Tolerance (carrier leakage for power class 4)

Test Metric

FR2a

FR2b

Max device size ≤ 30 cm

TBD

TBD

6.4.2.3 In-band emissions

Editor’s note: This clause is incomplete. The following aspects are either missing or not yet determined:

  • Measurement Uncertainty and Test Tolerance are FFS.
  • Testing of the general in-band emission requirement and if yes at which UE Tx power level and with which relaxation applied to the requirement is FFS.

6.4.2.3.1 Test purpose

The in-band emissions are a measure of the interference falling into the non-allocated resources blocks.

The purpose of this test is to exercise the UE transmitter to verify its modulation quality in terms of in-band emissions.

6.4.2.3.2 Test applicability

This test case applies to all types of NR UE release 15 and forward.

6.4.2.3.3 Minimum conformance requirements

The in-band emission is defined as the average across 12 sub-carriers and as a function of the RB offset from the edge of the allocated UL transmission bandwidth. The in-band emission is measured as the ratio of the UE output power in a non–allocated RB to the UE output power in an allocated RB. The IBE requirement does not apply if UE declares support for mpr-PowerBoost-FR2-r16, UL transmission is QPSK, MPRf,c = 0 and when NS_200 applies, and the network configures the UE to operate with mpr-PowerBoost-FR2-r16.

The basic in-band emissions measurement interval is identical to that of the EVM test.

The requirement is verified with the test metric of In-band emission (Link=TX beam peak direction, Meas=Link angle).

The relative in-band emission shall not exceed the values specified in Table 6.4.2.3.3-1 for power class 1 UEs.

The average of the in-band emission measurement over 10 sub-frames shall not exceed the values specified in Table 6.4.2.3.3-1 for power class 1, Table 6.4.2.3.3-2 for power class 2, Table 6.4.2.3.3-3 for power class 3 and Table 6.4.2.3.3-4 for power class 4 UEs.

Table 6.4.2.3.3-1: Requirements for in-band emissions for power class 1

Parameter description

Unit

Limit (NOTE 1)

Applicable Frequencies

General

dB

Any non-allocated (NOTE 2)

IQ Image

dB

-25

Output power > 27 dBm

Image frequencies (NOTES 2, 3)

-20

Output power ≤ 27 dBm

Carrier leakage

dBc

-25

Output power > 17 dBm

Carrier frequency (NOTES 4, 5)

-20

4 dBm ≤ Output power ≤ 17 dBm

NOTE 1: An in-band emissions combined limit is evaluated in each non-allocated RB. For each such RB, the minimum requirement is calculated as the higher of (PRB – 25 dB) and the power sum of all limit values (General, IQ Image or Carrier leakage) that apply. PRB is defined in NOTE 10.

NOTE 2: The measurement bandwidth is 1 RB and the limit is expressed as a ratio of measured power in one non-allocated RB to the measured average power per allocated RB, where the averaging is done across all allocated RBs. For pi/2 BPSK with Spectrum Shaping, the limit is expressed as a ratio of measured power in one non-allocated RB to the measured power in the allocated RB with highest PSD

NOTE 3: The applicable frequencies for this limit are those that are enclosed in the reflection of the allocated bandwidth, based on symmetry with respect to the carrier frequency, but excluding any allocated RBs.

NOTE 4: The measurement bandwidth is 1 RB and the limit is expressed as a ratio of measured power in one non-allocated RB to the measured total power in all allocated RBs.

NOTE 5: The applicable frequencies for this limit depend on the parameter txDirectCurrentLocation in UplinkTxDirectCurrent IE, and are those that are enclosed in the RBs containing the DC frequency but excluding any allocated RB.

NOTE 6: LCRB is the Transmission Bandwidth (see Section 5.3).

NOTE 7: NRB is the Transmission Bandwidth Configuration (see Section 5.3).

NOTE 8: EVM s the limit for the modulation format used in the allocated RBs.

NOTE 9: RB is the starting frequency offset between the allocated RB and the measured non-allocated RB (e.g. RB= 1 or RB= -1 for the first adjacent RB outside of the allocated bandwidth).

NOTE 10: PRB is the transmitted power per allocated RB, measured in dBm.

NOTE 11: All powers are EIRP in beam peak direction.

The relative in-band emission shall not exceed the values specified in Table 6.4.2.3.3-2 for power class 2.

Table 6.4.2.3.3-2: Requirements for in-band emissions for power class 2

Parameter description

Unit

Limit (NOTE 1)

Applicable Frequencies

General

dB

Any non-allocated (NOTE 2)

IQ Image

dB

-25

Output power > 16 dBm

Image frequencies (NOTES 2, 3)

-20

Output power ≤ 16 dBm

Carrier leakage

dBc

-25

Output power > 6 dBm

Carrier frequency (NOTES 4, 5)

-20

-13 dBm ≤ Output power ≤ 6 dBm

NOTE 1: An in-band emissions combined limit is evaluated in each non-allocated RB. For each such RB, the minimum requirement is calculated as the higher of (PRB – 25 dB) and the power sum of all limit values (General, IQ Image or Carrier leakage) that apply. PRB is defined in NOTE 10.

NOTE 2: The measurement bandwidth is 1 RB and the limit is expressed as a ratio of measured power in one non-allocated RB to the measured average power per allocated RB, where the averaging is done across all allocated RBs. For pi/2 BPSK with Spectrum Shaping, the limit is expressed as a ratio of measured power in one non-allocated RB to the measured power in the allocated RB with highest PSD

NOTE 3: The applicable frequencies for this limit are those that are enclosed in the reflection of the allocated bandwidth, based on symmetry with respect to the carrier frequency, but excluding any allocated RBs.

NOTE 4: The measurement bandwidth is 1 RB and the limit is expressed as a ratio of measured power in one non-allocated RB to the measured total power in all allocated RBs.

NOTE 5: The applicable frequencies for this limit depend on the parameter txDirectCurrentLocation in UplinkTxDirectCurrent IE, and are those that are enclosed in the RBs containing the DC frequency but excluding any allocated RB.

NOTE 6: LCRB is the Transmission Bandwidth (see Section 5.3).

NOTE 7: NRB is the Transmission Bandwidth Configuration (see Section 5.3).

NOTE 8: EVM s the limit for the modulation format used in the allocated RBs.

NOTE 9: RB is the starting frequency offset between the allocated RB and the measured non-allocated RB (e.g. RB= 1 or RB= -1 for the first adjacent RB outside of the allocated bandwidth).

NOTE 10: PRB is the transmitted power per allocated RB, measured in dBm.

NOTE 11: All powers are EIRP in beam peak direction.

The relative in-band emission shall not exceed the values specified in Table 6.4.2.3.3-3 for power class 3 UEs.

Table 6.4.2.3.3-3: Requirements for in-band emissions for power class 3

Parameter description

Unit

Limit (NOTE 1)

Applicable Frequencies

General

dB

Any non-allocated (NOTE 2)

IQ Image

dB

-25

Output power > 10 dBm

Image frequencies (NOTES 2, 3)

-20

Output power ≤ 10 dBm

Carrier leakage

dBc

-25

Output power > 0 dBm

Carrier frequency (NOTES 4, 5)

-20

-13 dBm ≤ Output power ≤ 0 dBm

NOTE 1: An in-band emissions combined limit is evaluated in each non-allocated RB. For each such RB, the minimum requirement is calculated as the higher of (PRB – 25 dB) and the power sum of all limit values (General, IQ Image or Carrier leakage) that apply. PRB is defined in NOTE 10.

NOTE 2: The measurement bandwidth is 1 RB and the limit is expressed as a ratio of measured power in one non-allocated RB to the measured average power per allocated RB, where the averaging is done across all allocated RBs. For pi/2 BPSK with Spectrum Shaping, the limit is expressed as a ratio of measured power in one non-allocated RB to the measured power in the allocated RB with highest PSD

NOTE 3: The applicable frequencies for this limit are those that are enclosed in the reflection of the allocated bandwidth, based on symmetry with respect to the carrier frequency, but excluding any allocated RBs.

NOTE 4: The measurement bandwidth is 1 RB and the limit is expressed as a ratio of measured power in one non-allocated RB to the measured total power in all allocated RBs.

NOTE 5: The applicable frequencies for this limit depend on the parameter txDirectCurrentLocation in UplinkTxDirectCurrent IE, and are those that are enclosed in the RBs containing the DC frequency but excluding any allocated RB.

NOTE 6: LCRB is the Transmission Bandwidth (see Section 5.3).

NOTE 7: NRB is the Transmission Bandwidth Configuration (see Section 5.3).

NOTE 8: EVM s the limit for the modulation format used in the allocated RBs.

NOTE 9: RB is the starting frequency offset between the allocated RB and the measured non-allocated RB (e.g. RB= 1 or RB= -1 for the first adjacent RB outside of the allocated bandwidth).

NOTE 10: PRB is the transmitted power per allocated RB, measured in dBm.

NOTE 11: All powers are EIRP in beam peak direction.

The relative in-band emission shall not exceed the values specified in Table 6.4.2.3.3-4 for power class 4 UEs.

Table 6.4.2.3.3-4: Requirements for in-band emissions for power class 4

Parameter description

Unit

Limit (NOTE 1)

Applicable Frequencies

General

dB

Any non-allocated (NOTE 2)

IQ Image

dB

-25

Output power > 21 dBm

Image frequencies (NOTES 2, 3)

-20

Output power ≤ 21 dBm

Carrier leakage

dBc

-25

Output power > 11 dBm

Carrier frequency (NOTES 4, 5)

-20

-13 dBm ≤ Output power ≤11 dBm

NOTE 1: An in-band emissions combined limit is evaluated in each non-allocated RB. For each such RB, the minimum requirement is calculated as the higher of (PRB – 25 dB) and the power sum of all limit values (General, IQ Image or Carrier leakage) that apply. PRB is defined in NOTE 10.

NOTE 2: The measurement bandwidth is 1 RB and the limit is expressed as a ratio of measured power in one non-allocated RB to the measured average power per allocated RB, where the averaging is done across all allocated RBs. For pi/2 BPSK with Spectrum Shaping, the limit is expressed as a ratio of measured power in one non-allocated RB to the measured power in the allocated RB with highest PSD

NOTE 3: The applicable frequencies for this limit are those that are enclosed in the reflection of the allocated bandwidth, based on symmetry with respect to the carrier frequency, but excluding any allocated RBs.

NOTE 4: The measurement bandwidth is 1 RB and the limit is expressed as a ratio of measured power in one non-allocated RB to the measured total power in all allocated RBs.

NOTE 5: The applicable frequencies for this limit depend on the parameter txDirectCurrentLocation in UplinkTxDirectCurrent IE, and are those that are enclosed in the RBs containing the DC frequency but excluding any allocated RB.

NOTE 6: LCRB is the Transmission Bandwidth (see Section 5.3).

NOTE 7: NRB is the Transmission Bandwidth Configuration (see Section 5.3).

NOTE 8: EVM s the limit for the modulation format used in the allocated RBs.

NOTE 9: RB is the starting frequency offset between the allocated RB and the measured non-allocated RB (e.g. RB= 1 or RB= -1 for the first adjacent RB outside of the allocated bandwidth).

NOTE 10: PRB is the transmitted power per allocated RB, measured in dBm.

NOTE 11: All powers are EIRP in beam peak direction.

The normative reference for this requirement is TS 38.101-2 [3] clause 6.4.2.3.

The average of the in-band emission measurement over 10 sub-frames shall not exceed the values specified in Table 6.4.2.3.3-6 for power class 6 UEs.

Table 6.4.2.3.3-6: Requirements for in-band emissions for power class 6

Parameter description

Unit

Limit (NOTE 1)

Applicable Frequencies

General

dB

Any non-allocated (NOTE 2)

IQ Image

dB

-25

Output power > 17 dBm

Image frequencies (NOTES 2, 3)

-20

Output power ≤ 17 dBm

Carrier leakage

dBc

-25

Output power > 7 dBm

Carrier frequency (NOTES 4, 5)

-20

-6 dBm ≤ Output power ≤ 7 dBm

NOTE 1: An in-band emissions combined limit is evaluated in each non-allocated RB. For each such RB, the minimum requirement is calculated as the higher of (- 25 dB) and the power sum of all limit values (General, IQ Image or Carrier leakage) that apply. is defined in NOTE 10.

NOTE 2: The measurement bandwidth is 1 RB and the limit is expressed as a ratio of measured power in one non-allocated RB to the measured average power per allocated RB, where the averaging is done across all allocated RBs. For Pi/2 BPSK with Spectrum Shaping, the limit is expressed as a ratio of measured power in one non-allocated RB to the measured power in the allocated RB with highest PSD

NOTE 3: The applicable frequencies for this limit are those that are enclosed in the reflection of the allocated bandwidth, based on symmetry with respect to the carrier frequency, but excluding any allocated RBs.

NOTE 4: The measurement bandwidth is 1 RB and the limit is expressed as a ratio of measured power in one non-allocated RB to the measured total power in all allocated RBs.

NOTE 5: The applicable frequencies for this limit depend on the parameter txDirectCurrentLocation in UplinkTxDirectCurrent IE, and are those that are enclosed in the RBs containing the DC frequency but excluding any allocated RB.

NOTE 6: LCRB is the Transmission Bandwidth (see Clause 5.3).

NOTE 7: NRB is the Transmission Bandwidth Configuration (see Clause 5.3).

NOTE 8: EVM s the limit for the modulation format used in the allocated RBs.

NOTE 9: RB is the starting frequency offset between the allocated RB and the measured non-allocated RB (e.g. RB = 1 or RB = -1 for the first adjacent RB outside of the allocated bandwidth).

NOTE 10: is an average of the transmitted power over 10 sub-frames normalized by the number of allocated RBs, measured in dBm.

NOTE 11: All powers are EIRP in beam peak direction.

6.4.2.3.4 Test description

6.4.2.3.4.1 Initial condition

Initial conditions are a set of test configurations the UE needs to be tested in and the steps for the SS to take with the UE to reach the correct measurement state.

The initial test configurations consist of environmental conditions, test frequencies, test channel bandwidths and sub-carrier spacing based on NR operating bands specified in Table 5.3.5-1. All of these configurations shall be tested with applicable test parameters for each combination of channel bandwidth and sub-carrier spacing, are shown in Table 6.4.2.3.4.1-1. The details of the uplink reference measurement channels (RMCs) are specified in Annex A.2. Configurations of PDSCH and PDCCH before measurement are specified in Annex C.2.

Table 6.4.2.3.4.1-1: Test Configuration Table for PUSCH

Initial Conditions

Test Environment as specified in TS 38.508-1 [10] subclause 4.1

Normal

Test Frequencies as specified in TS 38.508-1 [10] subclause 4.3.1

Low range, Mid range, High range

Test Channel Bandwidths as specified in TS 38.508-1 [10] subclause 4.3.1

Lowest, Mid, Highest

Test SCS as specified in Table 5.3.5-1

Lowest

Test Parameters

Test ID

Downlink Configuration

Uplink Configuration

Modulation

RB allocation (NOTE 1)

1

DFT-s-OFDM PI/2 BPSK

Inner_ Partial_Left for PC2, PC3, PC4

Inner_ Partial_Left_Region2 for PC1

2

DFT-s-OFDM PI/2 BPSK

Inner_ Partial_Right for PC2, PC3, PC4

Inner_ Partial_Right_Region2 for PC1

3

CP-OFDM QPSK

Inner_ Partial_Left for PC2, PC3, PC4

Inner_ Partial_Left_Region2 for PC1

4

CP-OFDM QPSK

Inner_ Partial_Right for PC2, PC3, PC4

Inner_ Partial_Right_Region2 for PC1

NOTE 1: The specific configuration of each RB allocation is defined in Table 6.1-1 for PC2, PC3 and PC4 or Table 6.1-2 for PC1.

NOTE 2: Test Channel Bandwidths are checked separately for each NR band, which applicable channel bandwidths are specified in Table 5.3.5-1.

Table 6.4.2.3.4.1-2: Test Configuration Table for PUCCH

Initial Conditions

Test Environment as specified in TS 38.508-1 [10] subclause 4.1

See Table 6.4.2.3.4.1-1

Test Frequencies as specified in TS 38.508-1 [10] subclause 4.3.1

See Table 6.4.2.3.4.1-1

Test Channel Bandwidths as specified in TS 38.508-1 [10] subclause 4.3.1

See Table 6.4.2.3.4.1-1

Test SCS as specified in Table 5.3.5-1

See Table 6.4.2.3.4.1-1

Test Parameters

ID

Downlink Configuration

Uplink Configuration

Modulation

RB allocation

Waveform

PUCCH format

1

CP-OFDM QPSK

Full RB (Note 1)

CP-OFDM

PUCCH format = Format 1

Length in OFDM symbols = 14

2

CP-OFDM QPSK

Full RB (Note 1)

DFT-s-OFDM

PUCCH format = Format 3

Length in OFDM symbols = 14

NOTE 1: Full RB allocation shall be used per each SCS and channel BW as specified in Table 7.3.2.4.1-2.

NOTE 2: Test Channel Bandwidths are checked separately for each NR band, which applicable channel bandwidths are specified in Table 5.3.5-1.

1. Connection between SS and UE is shown in TS 38.508-1 [10] Annex A, in Figure A.3.3.1.1 for TE diagram and section A.3.4.1.1 for UE diagram.

2. The parameter settings for the cell are set up according to TS 38.508-1 [10] subclause 4.4.3.

3. Downlink signals are initially set up according to Annex C, and uplink signals according to Annex G.

4. The UL Reference Measurement channels are set according to Table 6.4.2.3.4.1-1.

5. Propagation conditions are set according to Annex B.0.

6. Ensure the UE is in state RRC_CONNECTED with generic procedure parameters Connectivity NR, Connected without release On, Test Mode On and Test Loop Function On according to TS 38.508-1 [10] clause 4.5. Message contents are defined in clause 6.4.2.3.4.3

6.4.2.3.4.2 Test procedure

Test procedure for PUSCH:

1.1 Retrieve the LO position from the parameter txDirectCurrentLocation in UplinkTxDirectCurrent IE.

1.2 SS sends uplink scheduling information for each UL HARQ process via PDCCH DCI format 0_1 for C_RNTI to schedule the UL RMC according to Table 6.4.2.3.4.1-1. Since the UE has no payload and no loopback data to send the UE sends uplink MAC padding bits on the UL RMC.

1.3 Set the UE in the Inband Tx beam peak direction found with a 3D EIRP scan as performed in Annex K.1.1. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 2) for the UE Tx beam selection to complete.

1.4 Send the appropriate TPC commands in the uplink scheduling information to the UE until UE output power is Preq + PW ± PW, where Preq is the power level specified in Tables 6.4.2.3.4.2-1 according to the power class with power ID = 1. PW is the power window according to Table 6.4.2.3.4.2-2 for the carrier frequency f and the channel bandwidth BW. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 2) for the UE Tx beam selection to complete.

1.5 SS activates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.2 using condition TxRx.

1.6 Measure In-band emission IEθ, IEφ using Global In-Channel Tx-Test (Annex E) for the θ- and φ-polarizations, respectively. For TDD, only slots consisting of only UL symbols are under test. Calculate IE = IEθ + IEφ, where the calculation is based on linear power ratios.

1.7 SS deactivates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.3.

1.8 Repeat steps 1.3 through 1.6 until In-band emissions have been measured for all power IDs in Table 6.4.2.3.4.2-1.

NOTE 1: When switching to DFT-s-OFDM waveform, as specified in Table 6.4.2.3.4.1-1, send an NR RRCReconfiguration message according to TS 38.508-1 [10] clause 4.6.3 Table 4.6.3-118 PUSCH-Config with TRANSFORM_PRECODER_ENABLED condition.

NOTE 2: The BEAM_SELECT_WAIT_TIME default value is defined in Annex K.1.1.

Table 6.4.2.3.4.2-1: Parameters for In-band emissions

Power ID

Unit

Level for power class 1

Level for power class 2

Level for power class 3

Level for power class 4

1

dBm

27

16

10

21

2

dBm

17

6

0

11

Table 6.4.2.3.4.2-2: Power Window (dB) for In-band emissions PUSCH and PUCCH

TBD

Test procedure for PUCCH:

2.1 Retrieve the LO position from the parameter txDirectCurrentLocation in UplinkTxDirectCurrent IE.

2.2 PUCCH is set according to Table 6.4.2.3.4.1-2. SS transmits PDSCH via PDCCH DCI format 1_1 for C_RNTI to transmit the DL RMC according to Table 6.4.2.3.4.1-2. The SS sends downlink MAC padding bits on the DL RMC. The transmission of PDSCH will make the UE send uplink ACK/NACK using PUCCH.

2.3 Set the UE in the Inband Tx beam peak direction found with a 3D EIRP scan as performed in Annex K.1.1. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 1) for the UE Tx beam selection to complete.

2.4 Send the appropriate TPC commands in the uplink scheduling information for PUCCH to the UE until UE output power is Preq + PW ± PW, where Preq is the power level specified in Tables 6.4.2.3.4.2-1 according to the power class with power ID = 1. PW is the power window according to Table 6.4.2.3.4.2-2 for the carrier frequency f and the channel bandwidth BW. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 1) for the UE Tx beam selection to complete.

2.5 SS activates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.2 using condition TxRx.

2.6 Measure In-band emission IEθ, IEφ using Global In-Channel Tx-Test (Annex E) for the θ- and φ-polarizations, respectively. Calculate IE = IEθ + IEφ, where the calculation is based on linear power ratios.

2.7 SS deactivates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.3.

2.8 Repeat steps 2.3 through 2.6 until In-band emissions have been measured for all power IDs in Table 6.4.2.3.4.2-1.

NOTE 1: The BEAM_SELECT_WAIT_TIME default value is defined in Annex K.1.1.

NOTE 2: When switching to DFT-s-OFDM waveform, as specified in Table 6.4.2.3.4.1-1, send an NR RRCReconfiguration message according to TS 38.508-1 [10] clause 4.6.3 Table 4.6.3-118 PUSCH-Config with TRANSFORM_PRECODER_ENABLED condition.

6.4.2.3.4.3 Message contents

Message contents are according to TS 38.508-1 [10] subclause 4.6.

6.4.2.3.5 Test requirement

For power ID1 and ID2, the averaged in-band emissions result, derived in Annex E.4.3 shall not exceed the corresponding values for IQ Image and Carrier Leakage in Table 6.4.2.3.5-1 for power class 1 UEs.

Table 6.4.2.3.5-1: Test requirements for in-band emissions for power class 1

Parameter description

Unit

Limit (NOTE 1)

Applicable Frequencies

General

(NOTE 12)

dB

+ TT

Any non-allocated (NOTE 2)

IQ Image

(NOTE 12)

dB

-25+TT

Output power > 27 dBm

Image frequencies (NOTES 2, 3)

-20+TT

Output power ≤ 27 dBm

Carrier leakage

(NOTE 12)

dBc

-25+TT

Output power > 17 dBm

Carrier frequency (NOTES 4, 5)

-20+TT

4 dBm ≤ Output power ≤ 17 dBm

NOTE 1: An in-band emissions combined limit is evaluated in each non-allocated RB. For each such RB, the minimum requirement is calculated as the higher of (PRB – 25 dB) and the power sum of all limit values (General, IQ Image or Carrier leakage) that apply. PRB is defined in NOTE 10.

NOTE 2: The measurement bandwidth is 1 RB and the limit is expressed as a ratio of measured power in one non-allocated RB to the measured average power per allocated RB, where the averaging is done across all allocated RBs. For pi/2 BPSK with Spectrum Shaping, the limit is expressed as a ratio of measured power in one non-allocated RB to the measured power in the allocated RB with highest PSD

NOTE 3: The applicable frequencies for this limit are those that are enclosed in the reflection of the allocated bandwidth, based on symmetry with respect to the carrier frequency, but excluding any allocated RBs.

NOTE 4: The measurement bandwidth is 1 RB and the limit is expressed as a ratio of measured power in one non-allocated RB to the measured total power in all allocated RBs.

NOTE 5: The applicable frequencies for this limit depend on the parameter txDirectCurrentLocation in UplinkTxDirectCurrent IE, and are those that are enclosed in the RBs containing the DC but excluding any allocated RB.

NOTE 6: LCRB is the Transmission Bandwidth (see Section 5.3).

NOTE 7: NRB is the Transmission Bandwidth Configuration (see Section 5.3).

NOTE 8: EVM s the limit for the modulation format used in the allocated RBs.

NOTE 9: RB is the starting frequency offset between the allocated RB and the measured non-allocated RB (e.g. RB= 1 or RB= -1 for the first adjacent RB outside of the allocated bandwidth).

NOTE 10: PRB is the transmitted power per allocated RB, measured in dBm.

NOTE 11: All powers are EIRP in beam peak direction.

NOTE 12: In case the parameter 3300 or 3301 is reported from UE via txDirectCurrentLocation IE, IQ Image and Carrier leakage limit do not apply and General limit applies for all non-allocated frequencies.

For power ID1 and ID2, the averaged in-band emissions result, derived in Annex E.4.3 shall not exceed the corresponding values for IQ Image and Carrier Leakage in Table 6.4.2.3.5-2 for power class 2 UEs.

Table 6.4.2.3.5-2: Test requirements for in-band emissions for power class 2

Parameter description

Unit

Limit (NOTE 1)

Applicable Frequencies

General

(NOTE 12)

dB

+ TT

Any non-allocated (NOTE 2)

IQ Image

(NOTE 12)

dB

-25 + TT

Output power > 16 dBm

Image frequencies (NOTES 2, 3)

-20 + TT

Output power ≤ 16 dBm

Carrier leakage

(NOTE 12)

dBc

-25 + TT

Output power > 6 dBm

Carrier frequency (NOTES 4, 5)

-20 + TT

-13 dBm ≤ Output power ≤ 6 dBm

NOTE 1: An in-band emissions combined limit is evaluated in each non-allocated RB. For each such RB, the minimum requirement is calculated as the higher of (PRB – 25 dB) and the power sum of all limit values (General, IQ Image or Carrier leakage) that apply. PRB is defined in NOTE 10.

NOTE 2: The measurement bandwidth is 1 RB and the limit is expressed as a ratio of measured power in one non-allocated RB to the measured average power per allocated RB, where the averaging is done across all allocated RBs. For pi/2 BPSK with Spectrum Shaping, the limit is expressed as a ratio of measured power in one non-allocated RB to the measured power in the allocated RB with highest PSD

NOTE 3: The applicable frequencies for this limit are those that are enclosed in the reflection of the allocated bandwidth, based on symmetry with respect to the carrier frequency, but excluding any allocated RBs.

NOTE 4: The measurement bandwidth is 1 RB and the limit is expressed as a ratio of measured power in one non-allocated RB to the measured total power in all allocated RBs.

NOTE 5: The applicable frequencies for this limit depend on the parameter txDirectCurrentLocation in UplinkTxDirectCurrent IE, and are those that are enclosed in the RBs containing the DC frequency if NRB is odd, or in the two RBs immediately adjacent to the DC frequency if NRB is even but excluding any allocated RB.

NOTE 6: LCRB is the Transmission Bandwidth (see Section 5.3).

NOTE 7: NRB is the Transmission Bandwidth Configuration (see Section 5.3).

NOTE 8: EVM s the limit for the modulation format used in the allocated RBs.

NOTE 9: RB is the starting frequency offset between the allocated RB and the measured non-allocated RB (e.g. RB= 1 or RB= -1 for the first adjacent RB outside of the allocated bandwidth).

NOTE 10: PRB is the transmitted power per allocated RB, measured in dBm.

NOTE 11: All powers are EIRP in beam peak direction.

NOTE 12: In case the parameter 3300 or 3301 is reported from UE via txDirectCurrentLocation IE, IQ Image and Carrier leakage limit do not apply and General limit applies for all non-allocated frequencies.

For power ID1 and ID2, the averaged in-band emissions result, derived in Annex E.4.3 shall not exceed the corresponding values for IQ Image and Carrier Leakage in Table 6.4.2.3.5-3 for power class 3 UEs.

Table 6.4.2.3.5-3: Requirements for in-band emissions for power class 3

Parameter description

Unit

Limit (NOTE 1)

Applicable Frequencies

General

(NOTE 12)

dB

+ TT

Any non-allocated (NOTE 2)

IQ Image

(NOTE 12)

dB

-25+TT

Output power > 10 dBm

Image frequencies (NOTES 2, 3)

-20+TT

Output power ≤ 10 dBm

Carrier leakage

(NOTE 12)

dBc

-25+TT

Output power > 0 dBm

Carrier frequency (NOTES 4, 5)

-20+TT

-13 dBm ≤ Output power ≤ 0 dBm

NOTE 1: An in-band emissions combined limit is evaluated in each non-allocated RB. For each such RB, the minimum requirement is calculated as the higher of (PRB – 25 dB) and the power sum of all limit values (General, IQ Image or Carrier leakage) that apply. PRB is defined in NOTE 10.

NOTE 2: The measurement bandwidth is 1 RB and the limit is expressed as a ratio of measured power in one non-allocated RB to the measured average power per allocated RB, where the averaging is done across all allocated RBs. For pi/2 BPSK with Spectrum Shaping, the limit is expressed as a ratio of measured power in one non-allocated RB to the measured power in the allocated RB with highest PSD.

NOTE 3: The applicable frequencies for this limit are those that are enclosed in the reflection of the allocated bandwidth, based on symmetry with respect to the carrier frequency, but excluding any allocated RBs.

NOTE 4: The measurement bandwidth is 1 RB and the limit is expressed as a ratio of measured power in one non-allocated RB to the measured total power in all allocated RBs.

NOTE 5: The applicable frequencies for this limit depend on the parameter txDirectCurrentLocation in UplinkTxDirectCurrent IE, and are those that are enclosed in the RBs containing the DC but excluding any allocated RB.

NOTE 6: LCRB is the Transmission Bandwidth (see Section 5.3).

NOTE 7: NRB is the Transmission Bandwidth Configuration (see Section 5.3).

NOTE 8: EVM s the limit for the modulation format used in the allocated RBs.

NOTE 9: RB is the starting frequency offset between the allocated RB and the measured non-allocated RB (e.g. RB= 1 or RB= -1 for the first adjacent RB outside of the allocated bandwidth).

NOTE 10: PRB is the transmitted power per allocated RB, measured in dBm.

NOTE 11: All powers are EIRP in beam peak direction.

NOTE 12: In case the parameter 3300 or 3301 is reported from UE via txDirectCurrentLocation IE, IQ Image and Carrier leakage limit do not apply and General limit applies for all non-allocated frequencies.

For power ID1 and ID2, the averaged in-band emissions result, derived in Annex E.4.3 shall not exceed the corresponding values for IQ Image and Carrier Leakage in Table 6.4.2.3.5-4 for power class 4 UEs.

Table 6.4.2.3.5-4: Test requirements for in-band emissions for power class 4

Parameter description

Unit

Limit (NOTE 1)

Applicable Frequencies

General

(NOTE 12)

dB

+ TT

Any non-allocated (NOTE 2)

IQ Image

(NOTE 12)

dB

-25 + TT

Output power > 21 dBm

Image frequencies (NOTES 2, 3)

-20 + TT

Output power ≤ 21 dBm

Carrier leakage

(NOTE 12)

dBc

-25 + TT

Output power > 11 dBm

Carrier frequency (NOTES 4, 5)

-20 + TT

-13 dBm ≤ Output power ≤11 dBm

NOTE 1: An in-band emissions combined limit is evaluated in each non-allocated RB. For each such RB, the minimum requirement is calculated as the higher of (PRB – 25 dB) and the power sum of all limit values (General, IQ Image or Carrier leakage) that apply. PRB is defined in NOTE 10.

NOTE 2: The measurement bandwidth is 1 RB and the limit is expressed as a ratio of measured power in one non-allocated RB to the measured average power per allocated RB, where the averaging is done across all allocated RBs. For pi/2 BPSK with Spectrum Shaping, the limit is expressed as a ratio of measured power in one non-allocated RB to the measured power in the allocated RB with highest PSD

NOTE 3: The applicable frequencies for this limit are those that are enclosed in the reflection of the allocated bandwidth, based on symmetry with respect to the carrier frequency, but excluding any allocated RBs.

NOTE 4: The measurement bandwidth is 1 RB and the limit is expressed as a ratio of measured power in one non-allocated RB to the measured total power in all allocated RBs.

NOTE 5: The applicable frequencies for this limit depend on the parameter txDirectCurrentLocation in UplinkTxDirectCurrent IE, and are those that are enclosed in the RBs containing the DC frequency but excluding any allocated RB.

NOTE 6: LCRB is the Transmission Bandwidth (see Section 5.3).

NOTE 7: NRB is the Transmission Bandwidth Configuration (see Section 5.3).

NOTE 8: EVM s the limit for the modulation format used in the allocated RBs.

NOTE 9: RB is the starting frequency offset between the allocated RB and the measured non-allocated RB (e.g. RB= 1 or RB= -1 for the first adjacent RB outside of the allocated bandwidth).

NOTE 10: PRB is the transmitted power per allocated RB, measured in dBm.

NOTE 11: All powers are EIRP in beam peak direction.

NOTE 12: In case the parameter 3300 or 3301 is reported from UE via txDirectCurrentLocation IE, IQ Image and Carrier leakage limit do not apply and General limit applies for all non-allocated frequencies.

6.4.2.4 EVM equalizer spectrum flatness

Editor’s note: This clause is incomplete. The following aspects are either missing or not yet determined:

  • Measurement Uncertainty and Test Tolerance are FFS.

6.4.2.4.1 Test purpose

The zero-forcing equalizer correction applied in the EVM measurement process (as described in Annex E) must meet a spectral flatness requirement for the EVM measurement to be valid. The EVM equalizer spectrum flatness is defined in terms of the maximum peak-to-peak ripple of the equalizer coefficients (dB) across the allocated uplink block, at which the equalizer coefficients are generated by the EVM measurement process. The basic measurement interval is the same as for EVM.

The EVM equalizer spectrum flatness requirement does not limit the correction applied to the signal in the EVM measurement process but for the EVM result to be valid, the equalizer correction that was applied must meet the EVM equalizer spectrum flatness minimum requirements.

6.4.2.4.2 Test applicability

This test case applies to all types of NR UE release 15 and forward.

6.4.2.4.3 Minimum conformance requirements

For pi/2 BPSK modulation, the minimum requirements are defined in Clause 6.4.2.5.3.

The peak-to-peak variation of the EVM equalizer coefficients contained within the frequency range of the uplink allocation shall not exceed the maximum ripple specified in Table 6.4.2.4.3-1 for normal conditions. For uplink allocations contained within both Range 1 and Range 2, the coefficients evaluated within each of these frequency ranges shall meet the corresponding ripple requirement and the following additional requirements: the relative difference between the maximum coefficient in Range 1 and the minimum coefficient in Range 2 (Table 6.4.2.4.3-1) must not be larger than 7 dB, and the relative difference between the maximum coefficient in Range 2 and the minimum coefficient in Range 1 must not be larger than 8 dB (see Figure 6.4.2.4.3-1).

The requirement is verified with the test metric of EVM SF (Link=TX beam peak direction, Meas=Link angle).

Table 6.4.2.4.3-1: Minimum requirements for EVM equalizer spectrum flatness (normal conditions)

Frequency range

Maximum ripple (dB)

|FUL_Meas – Fcenter| ≤ X MHz

(Range 1)

6 (p-p)

|FUL_Meas – Fcenter| > X MHz

(Range 2)

9 (p-p)

NOTE 1: FUL_Meas refers to the sub-carrier frequency for which the equalizer coefficient is evaluated

NOTE 2: Fcenter refers to the centre frequency of the CC

NOTE 3: X, in MHz, is equal to 30% of the CC bandwidth

Figure 6.4.2.4.3-1: The limits for EVM equalizer spectral flatness with the maximum allowed variation of the coefficients indicated under normal conditions

The normative reference for this requirement is TS 38.101-2 [3] clause 6.4.2.4.

6.4.2.4.4 Test description

6.4.2.4.4.1 Initial condition

Initial conditions are a set of test configurations the UE needs to be tested in and the steps for the SS to take with the UE to reach the correct measurement state.

The initial test configurations consist of environmental conditions, test frequencies, test channel bandwidths and sub-carrier spacing based on NR operating bands specified in Table 5.3.5-1. All of these configurations shall be tested with applicable test parameters for each combination of channel bandwidth and sub-carrier spacing, are shown in Table 6.4.2.4.4.1-1. The details of the uplink reference measurement channels (RMCs) are specified in Annex A.2. Configurations of PDSCH and PDCCH before measurement are specified in Annex C.2.

Table 6.4.2.4.4.1-1: Test Configuration

Initial Conditions

Test Environment as specified in TS 38.508-1 [10] subclause 4.1

Normal

Test Frequencies as specified in TS 38.508-1 [10] subclause 4.3.1

Low range, Mid range, High range

Test Channel Bandwidths as specified in TS 38.508-1 [10] subclause 4.3.1

Lowest, Mid, Highest

Test SCS as specified in Table 5.3.5-1

Lowest

Test Parameters

Test ID

Downlink Configuration

Uplink Configuration

Modulation

RB allocation (NOTE 1)

1

DFT-s-OFDM QPSK

Outer_Full

2

CP-OFDM QPSK

Outer_Full

NOTE 1: The specific configuration of each RB allocation is defined in Table 6.1-1 for PC2, PC3 and PC4 or Table 6.1-2 for PC1.

NOTE 2: Test Channel Bandwidths are checked separately for each NR band, which applicable channel bandwidths are specified in Table 5.3.5-1.

1. Connection between SS and UE is shown in TS 38.508-1 [10] Annex A, in Figure A.3.3.1.1 for TE diagram and section A.3.4.1.1 for UE diagram.

2. The parameter settings for the cell are set up according to TS 38.508-1 [10] subclause 4.4.3.

3. Downlink signals are initially set up according to Annex C, and uplink signals according to Annex G.

4. The UL Reference Measurement channels are set according to Table 6.4.2.4.4.1-1.

5. Propagation conditions are set according to Annex B.0.

6. Ensure the UE is in state RRC_CONNECTED with generic procedure parameters Connectivity NR, Connected without release On, Test Mode On and Test Loop Function On according to TS 38.508-1 [10] clause 4.5. Message contents are defined in clause 6.4.2.4.4.3

6.4.2.4.4.2 Test procedure

1. Retrieve the LO position from the parameter txDirectCurrentLocation in UplinkTxDirectCurrent IE.

2. SS sends uplink scheduling information for each UL HARQ process via PDCCH DCI format 0_1 for C_RNTI to schedule the UL RMC according to Table 6.4.2.4.4.1-1. Since the UE has no payload and no loopback data to send the UE sends uplink MAC padding bits on the UL RMC

3. Set the UE in the Inband Tx beam peak direction found with a 3D EIRP scan as performed in Annex K.1.1. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 2) for the UE Tx beam selection to complete.

4. Send continuously uplink power control "up" commands in the uplink scheduling information to the UE until the UE transmits at PUMAX level. Allow at least 200 ms for the UE to reach PUMAX level. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 2) for the UE Tx beam selection to complete.

5. SS activates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.2 using condition TxRx.

6. Measure spectrum flatness using Global In-Channel Tx-Test (Annex E) for the θ- and φ-polarizations, respectively. For TDD, only slots consisting of only UL symbols are under test.

7. SS deactivates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.3.

NOTE1: When switching to DFT-s-OFDM waveform, as specified in Table 6.4.2.4.4.1-1, send an NR RRCReconfiguration message according to TS 38.508-1 [10] clause 4.6.3 Table 4.6.3-118 PUSCH-Config with TRANSFORM_PRECODER_ENABLED condition.

NOTE 2: The BEAM_SELECT_WAIT_TIME default value is defined in Annex K.1.1.

6.4.2.4.4.3 Message contents

Message contents are according to TS 38.508-1 [10] subclause 4.6.

6.4.2.4.5 Test requirement

Each of the n spectrum flatness functions, shall derive four ripple results in Annex E.4.4. The derived results shall not exceed the values in Figure 6.4.2.4.5-1: The peak-to-peak variation of the EVM equalizer coefficients contained within the frequency range of the uplink allocation shall not exceed the maximum ripple specified in Table 6.4.2.4.5-1 for normal conditions. For uplink allocations contained within both Range 1 and Range 2, the coefficients evaluated within each of these frequency ranges shall meet the corresponding ripple requirement and the following additional requirements: the relative difference between the maximum coefficient in Range 1 and the minimum coefficient in Range 2 (Table 6.4.2.4..5-1) must not be larger than 7 dB + TT, and the relative difference between the maximum coefficient in Range 2 and the minimum coefficient in Range 1 must not be larger than 8 dB + TT (see Figure 6.4.2.4.5-1).

The UE passes the test when the derived results for at least one polarization fulfil the test requirements.

Table 6.4.2.4.5-1: Test requirements for EVM equalizer spectrum flatness (normal conditions)

Frequency range

Maximum ripple (dB)

|FUL_Meas – Fcenter| ≤ X MHz

(Range 1)

6 +TT (p-p)

|FUL_Meas – Fcenter| > X MHz

(Range 2)

9 + TT (p-p)

NOTE 1: FUL_Meas refers to the sub-carrier frequency for which the equalizer coefficient is evaluated

NOTE 2: Fcenter refers to the centre frequency of the CC

NOTE 3: X, in MHz, is equal to 30% of the CC bandwidth

Figure 6.4.2.4.5-1: The limits for EVM equalizer spectral flatness with the maximum allowed variation of the coefficients indicated under normal conditions

6.4.2.5 EVM spectral flatness for pi/2 BPSK modulation

Editor’s note: This clause is incomplete. The following aspects are either missing or not yet determined:

  • Measurement Uncertainty and Test Tolerance are FFS.
  • Whether and, if yes, how to test the requirement on shaping filter is FFS.

6.4.2.5.1 Test purpose

Same test purpose as in clause 6.4.2.4.1.

6.4.2.5.2 Test applicability

This test case applies to all types of NR FR2 UE release 15 and forward supporting pi/2 BPSK modulation.

6.4.2.5.3 Minimum conformance requirements

These requirements are defined for pi/2 BPSK modulation. The EVM equalizer coefficients across the allocated uplink block shall be modified to fit inside the mask specified in Table 6.4.2.5.3-1 for normal conditions, prior to the calculation of EVM. The limiting mask shall be placed to minimize the change in equalizer coefficients in a sum of squares sense.

Table 6.4.2.5.3-1: Mask for EVM equalizer coefficients for pi/2 BPSK (normal conditions)

Frequency range

Parameter

Maximum ripple (dB)

|FUL_Meas – Fcenter| ≤ X MHz

(Range 1)

X1

6 (p-p)

|FUL_Meas – Fcenter| > X MHz

(Range 2)

X2

14 (p-p)

NOTE 1: FUL_Meas refers to the sub-carrier frequency for which the equalizer coefficient is evaluated.

NOTE 2: Fcenter refers to the centre frequency of an allocated block of PRBs.

NOTE 3: X, in MHz, is equal to 25% of the bandwidth of the PRB allocation.

NOTE 4: See Figure 6.4.2.5.3-1 for description of X1, X2 and X3.

Figure 6.4.2.5.3-1: The limits for EVM equalizer spectral flatness with the maximum allowed variation. Fcenter denotes the centre frequency of the allocated block of PRBs. F_alloc denotes the bandwidth of the PRB allocation

This requirement does not apply to other modulation types. The UE shall be allowed to employ spectral shaping for pi/2 BPSK. The shaping filter shall be restricted so that the impulse response of the transmit chain shall meet

ãt(t,0)│ ≥ │ãt(t, τ)│ ∀τ ≠ 0

20log10ãt(t,τ)│< -15 dB 1< τ < M – 1,

Where:

│ãt(t,τ)│=IDFT{│ãt(t,f)│ejφ (t,f)} ,

f is the frequency of the M allocated subcarriers,

ã(t,f) and φ(t,f) are the amplitude and phase response, respectively of the transmit chain

0dB reference is defined as 20log10│ãt(t,0)│

The normative reference for this requirement is TS 38.101-2 [3] clause 6.4.2.5.

6.4.2.5.4 Test description

6.4.2.5.4.1 Initial condition

Same initial conditions as in clause 6.4.2.4.4.1 with following exceptions:

– Instead of Table 6.4.2.4.4.1-1 🡪 use Table 6.4.2.5.4.1-1

Table 6.4.2.5.4.1-1: Test Configuration

Initial Conditions

Test Environment as specified in TS 38.508-1 [10] subclause 4.1

Normal

Test Frequencies as specified in TS 38.508-1 [10] subclause 4.3.1

Low range, Mid range, High range

Test Channel Bandwidths as specified in TS 38.508-1 [10] subclause 4.3.1

Lowest, Mid, Highest

Test SCS as specified in TS 38.508-1 [10] subclause 5.3.5-1

Lowest

Test Parameters

Test ID

Downlink Configuration

Uplink Configuration

Modulation

RB allocation (NOTE 1)

1

DFT-s-OFDM pi/2-BPSK

Outer_Full

NOTE 1: The specific configuration of each RB allocation is defined in Table 6.1-1 for PC2, PC3 and PC4 or Table 6.1-2 for PC1.

NOTE 2: Test Channel Bandwidths are checked separately for each NR band, which applicable channel bandwidths are specified in Table 5.3.5-1.

6.4.2.5.4.2 Test procedure

1. Retrieve the LO position from the parameter txDirectCurrentLocation in UplinkTxDirectCurrent IE.

2. SS sends uplink scheduling information for each UL HARQ process via PDCCH DCI format 0_1 for C_RNTI to schedule the UL RMC according to Table 6.4.2.5.4.1-1. Since the UE has no payload and no loopback data to send the UE sends uplink MAC padding bits on the UL RMC

3. Set the UE in the Inband Tx beam peak direction found with a 3D EIRP scan as performed in Annex K.1.1. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 1) for the UE Tx beam selection to complete.

4. Send continuously uplink power control "up" commands in the uplink scheduling information to the UE until the UE transmits at PUMAX level. Allow at least 200 ms for the UE to reach PUMAX level. Allow at least BEAM_SELECT_WAIT_TIME (NOTE 1) for the UE Tx beam selection to complete.

5. SS activates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.2 using condition TxRx.

6. Measure spectrum flatness using Global In-Channel Tx-Test (Annex E) for the θ- and φ-polarizations, respectively. For TDD, only slots consisting of only UL symbols are under test.

7. SS deactivates the UE Beamlock Function (UBF) by performing the procedure as specified in TS 38.508-1 [10] clause 4.9.3.

NOTE 1: The BEAM_SELECT_WAIT_TIME default value is defined in Annex K.1.1.

6.4.2.5.4.3 Message contents

Message contents are according to TS 38.508-1 [10] subclause 4.6 with TRANSFORM_PRECODER_ENABLED condition in Table 4.6.3-118 PUSCH-Config.

6.4.2.5.5 Test requirement

Each of the n spectrum flatness functions, shall derive four ripple results in Annex E.4.4. The derived results shall not exceed the values in Table 6.4.2.5.5-1 and Figure 6.4.2.5.5-1:

Table 6.4.2.5.5-1: Test requirement for EVM equalizer coefficients for pi/2 BPSK (normal conditions)

Frequency range

Parameter

Maximum ripple (dB)

|FUL_Meas – Fcenter| ≤ X MHz

(Range 1)

X1

6 + TT (p-p)

|FUL_Meas – Fcenter| > X MHz

(Range 2)

X2

14 + TT (p-p)

NOTE 1: FUL_Meas refers to the sub-carrier frequency for which the equalizer coefficient is evaluated.

NOTE 2: Fcenter refers to the centre frequency of an allocated block of PRBs.

NOTE 3: X, in MHz, is equal to 25% of the bandwidth of the PRB allocation.

NOTE 4: See Figure 6.4.2.5.5-1 for description of X1, X2 and X3.

Figure 6.4.2.5.5-1: The limits for EVM equalizer spectral flatness with the maximum allowed variation. Fcenter denotes the centre frequency of the allocated block of PRBs

The UE passes the test when the derived results for at least one polarization fulfil the test requirements.