4 General

38.521-23GPPNRPart 2: Range 2 StandaloneRadio transmission and receptionRelease 17TSUser Equipment (UE) conformance specification

Tools: ARFCN - Frequency Conversion for 5G NR/LTE/UMTS/GSM

4.1 Relationship between minimum requirements and test requirements

The TS 38.101-2 [3] is a Single-RAT specification for NR UE, covering RF characteristics and minimum performance requirements. Conformance to the TS 38.101-2 [3] is demonstrated by fulfilling the test requirements specified in the present document.

The Minimum Requirements given in TS 38.101-2 [3] make no allowance for measurement uncertainty (MU). The measurement uncertainty defines in TR 38.903 [20]. The present document defines test tolerances (TT). These test tolerances are individually calculated for each test. The test tolerances are used to relax the minimum requirements in the TS 38.101-2 [3] to create test requirements. For some requirements, including regulatory requirements, the test tolerance is set to zero.

The measurement results returned by the test system are compared – without any modification – against the test requirements as defined by various levels of "Shared Risk" principle as described below.

a) Core specification value is not relaxed by any relaxation value (TT=0). For each single measurement, the probability of a borderline good UE being judged as FAIL equals the probability of a borderline bad UE being judged as PASS.

– Test tolerances equal to 0 (TT=0) are considered in this specification.

b) Core specification value is relaxed by a relaxation value (TT>0). For each single measurement, the probability of a borderline bad UE being judged as PASS is greater than the probability of a borderline good UE being judged as FAIL.

– Test tolerances lower than measurement uncertainty and greater than 0 (0 < TT < MU) are considered in this specification.

– Test tolerances high up to measurement uncertainty (TT = MU) are considered in this specification which is also known as “Never fail a good DUT” principle.

c) Core specification value is tightened by a stringent value (TT<0). For each single measurement, the probability of a borderline good UE being judged as FAIL is greater than the probability of a borderline bad UE being judged as PASS.

– Test tolerances lower than 0 (TT<0) are not considered in this specification.

The “Never fail a good DUT” and the “Shared Risk” principles are defined in Recommendation ITU R M.1545 [6].

4.2 Applicability of minimum requirements

a) In TS 38.101-2 [3] the Minimum Requirements are specified as general requirements and additional requirements. Where the Requirement is specified as a general requirement, the requirement is mandated to be met in all scenarios.

b) For specific scenarios for which an additional requirement is specified, in addition to meeting the general requirement, the UE is mandated to meet the additional requirements.

c) The spurious emissions power requirements are for the long-term average of the power. For the purpose of reducing measurement uncertainty it is acceptable to average the measured power over a period of time sufficient to reduce the uncertainty due to the statistical nature of the signal.

d) All the requirements for intra-band contiguous and non-contiguous CA apply under the assumption of the same slot format indicated by TDD-UL-DL-ConfigurationCommon and TDD-UL-DL-ConfigurationDedicated in the PCell and SCells for NR/5GC.

For FR2 intra-band CA configurations with multiple FR2 sub-blocks, where at least one of the sub-blocks is a contiguous CA configuration:

– if the field partialFR2-FallbackRX-Req is not present, the UE shall meet all applicable UE RF requirements for the highest order CA configuration and all associated fallback CA configurations;

– if the field partialFR2-FallbackRX-Req is present, for each FR2 intra-band CA configuration with multiple sub-blocks that the UE indicates support for explicitly in UE capability signalling: the in-gap UE RF requirements in clauses 7.5A, 7.5D, 7.6A, 7.6D apply as the equivalent requirements for the associated fallback CA configurations with the same number of sub-blocks, where at least one of the sub-blocks consists of a contiguous CA configuration. The UE shall meet all applicable UE RF requirements for fallback CA configurations with a lesser number of sub-blocks;

– regardless of the field partialFR2-FallbackRX-Req, the UE shall meet all DL out-of-gap requirements for all lower order fallback CA configurations.

4.3 Specification suffix information

Unless stated otherwise the following suffixes are used for indicating at 2^nd level clause, shown in Table 4.3-1.

Table 4.3-1: Definition of suffixes

Clause suffix	Variant
None	Single Carrier
A	Carrier Aggregation (CA)
B	Dual-Connectivity (DC)
C	Supplement Uplink (SUL)
D	UL MIMO
NOTE: Suffix D in this specification represents either polarized UL MIMO or spatial UL MIMO. RF requirements are same. If UE supports both kinds of UL MIMO, then RF requirements only need to be verified under either polarized or spatial UL MIMO.

4.4 Test point analysis

The information on test point analysis and test point selection including number of test points for each test case is shown in TR 38.905 [21] clause 4.2.

4.5 Applicability and test coverage rules

The applicability and test coverage rules for NR/5GC and EN-DC capable devices shall include the following:

If a test case for a FR2 NR band in a device is tested in EN-DC mode for non-exceptional requirement as per TS 38.521-3 [14], it shall fulfil the coverage requirement for that test case for NR/5GC FR2 test requirements for that NR band and need not be retested.