F.1 Statistical testing of receiver BER/BLER performance
25.1423GPPBase Station (BS) conformance testing (TDD)Release 17TS
F.1.1 Error Definition
Bit Error Ration (BER) and Block Error Ratio (BLER) are defined in section 3.1.
F.1.2 Test Method
Each test is performed in the following manner:
a) Setup the required test conditions.
b) Record the number of samples tested and the number of occurred events (bit error or block error)
c) Stop the test at a stop criterion which is minimum test time or an early pass or an early fail event.
d) Once the test is stopped decide according to the pass fail decision rules ( subclause F.1.7)
F.1.3 Test Criteria
The test shall fulfil the following requirements:
a) good pass fail decision
1) to keep reasonably low the probability (risk) of passing a bad unit for each individual test;
2) to have high probability of passing a good unit for each individual test;
b) good balance between test time and statistical significance
3) to perform measurements with a high degree of statistical significance;
4) to keep the test time as low as possible.
F.1.4 Calculation assumptions
F.1.4.1 Statistical independence
a) It is assumed, that error events are rare (lim BER BLER 🡪 0) independent statistical events. However the memory of the convolutional /turbo coder is terminated after oneTTI. Samples and errors are summed up everyTTI. So the assumption of independent error events is justified.
b) In the BLER test with fading there is the memory of the multipath fading channel which interferes the statistical independence. A minimum test time is introduced to average fluctuations of the multipath fading channel. So the assumption of independent error events is justified approximately.
F.1.4.2 Applied formulas
The formulas, applied to describe the BER BLER test, are based on the following experiments:
1) After having observed a certain number of errors (ne) the number of samples are counted to calculate BER BLER. Provisions are made (note 1) such that the complementary experiment is valid as well:
2) After a certain number of samples (ns) the number of errors, occurred, are counted to calculate BER BLER.
Experiment 1) stipulates to use the following Chi Square Distribution with degree of freedom ne:
2*dchisq(2*NE,2*ne).
Experiment 2) stipulates to use the Poisson Distribution:
dpois(ne,NE)
(NE: mean of the distribution)
To determine the early stop conditions, the following inverse cumulative operation is applied:
0.5 * qchisq(D,2*ne). This is applicable for experiment (1) and (2).
D: wrong decision risk per test step
Note: other inverse cumulative operations are available, however only this is suited for experiment (1) and (2).
F.1.4.3 Approximation of the distribution
The test procedure is as follows:
During a running measurement for a BS ns (number of samples) and ne (number of errors) are accumulated and from this the preliminary BER BLER is calculated. Then new samples up to the next error are taken. The entire past and the new samples are basis for the next preliminary BER BLER. Depending on the result at every step, the BS can pass, can fail or must continue the test.
As early pass- and early fail-BSs leave the statistical totality under consideration, the experimental conditions are changed every step resulting in a distribution that is truncated more and more towards the end of the entire test. Such a distribution can not any more be handled analytically. The unchanged distribution is used as an approximation to calculate the early fail and early pass bounds.
F.1.5 Definition of good pass fail decision
This is defined by the probability of wrong decision F at the end of the test. The probability of a correct decision is 1-F.
The probability (risk) to fail a good DUT shall be ≤ F according to the following definition: The failed DUT is still better than the specified error ratio (Test requirement)with a probability of ≤ F.
The probability to pass a bad DUT shall be ≤ F according to the following definition: The passed DUT is still worse than M times the specified error ratio (M>1 is the bad DUT factor) with a probability of ≤ F.
This definitions lead to an early pass and an early fail limit:
Early fail: ber≥ berlimfail
(1)
For ne≥ 7
Early pass: ber ≤berlimbadpass
(2)
For ne ≥ 1
With
ber (normalized BER,BLER): BER,BLER according to F.1.1 divided by Test requirement
D: wrong decision probability for a test step . This is a numerically evaluated fraction of F, the wrong decision probability at the end of the test. See table F.1.
ne: Number of error events
M: bad DUT factor see table F.1.
qchisq: inverse-cumulative-function of the chi-squared-distribution
F.1.6 Good balance between test time and statistical significance
Three independent test parameters are introduced into the test and shown in Table F.1. These are the obvious basis of test time and statistical significance. From the first two of them four dependent test parameters are derived. The third independent test parameter is justified separately.
Table F.1: independent and dependant test parameters
Independent parameters |
Dependant parameters |
||||
Test Parameter |
Value |
Reference |
Test parameter |
Value |
Reference |
Bad DUT factor M |
1.5 |
Tables F.4 & F.5 |
Early pass/fail condition |
Curves |
Subclause F.1.5 Figure F.1 |
Final probability of wrong pass/fail decision F |
0.2%, (0.02%, note 2) |
Subclause F.1.5 |
Target number of error events |
345 |
Table F.4 & F.5 |
Probability of wrong pass/fail decision per test step D |
0.0085%, (0.0008% and 0.008%, note 2) |
||||
Test limit factor TL |
1.234 |
Table F.4 & F.5 |
|||
Minimum test time |
Tables F.2 & F.3 |
The minimum test time is derived from the following justification:
1) For no propagation conditions and static propagation condition
No early fail calculated from fractional number of errors <1 (see note 1)
2) For multipath fading condition
No stop of the test until [990] wavelengths are crossed during relevant BS reception timeslots, relevant for BER BLER testing, with the speed given in the fading profile.
3) For high speed train condition
Scenario 1: 82.3s. This corresponds to 4 complete cycles of approach towards and departure leave to and from a BS antenna
Scenario 3: 28.8s. This corresponds to 4 complete cycles of approach towards and departure from a BS antenna
Table F.2: minimum Test time
Fading profile |
Minimum test time |
Multipath propagation 3 km/h |
[164 s*TSPF/TSRX] |
Multipath propagation 120 km/h |
[4.1 s* TSPF/TSRX] |
High speed train conditions Scenario 1 |
82.3 sec |
High speed train conditions Scenario 3 |
28.8 sec |
TSPF = Time slots per frame |
TSPF and TSRX form the prolongation factor and depend on the user data rate and the TDD Option (3,84 Mchip/s or 1,28 Mchip/s )
Table F.3: Prolongation factor for minimum Test time
User Data rate |
TSPF/TSRX for TDD 3,84 Mchip/s |
TSPF/TSRX for TDD 1,28 Mchip/s |
12.2 kbit/s |
15/1 |
7/1 |
64 kbit/s |
15/1 |
7/1 |
144 kbit/s |
15/1 |
7/2 |
384 kbit/s |
15/3 |
7/4 |
In tables F.4 and F.5 the minimum test time is converted in minimum number of samples.
F.1.7 Pass fail decision rules
No decision is allowed before the minimum test time is elapsed.
1) If minimum Test time < time for target number of error events then the following applies: The required confidence level 1-F (= correct decision probability) shall be achieved. This is fulfilled at an early pass or early fail event.
For BER:
For every TTI (Transmit Time Interval) sum up the number of bits (ns) and the number if errors (ne) from the beginning of the test and calculate
BER1 (including the artificial error at the beginning of the test (Note 1))and
BER0 (excluding the artificial error at the beginning of the test (Note 1)).
If BER0 is above the early fail limit, fail the DUT.
If BER1 is below the early pass limit, pass the DUT.
Otherwise continue the test
For BLER:
For every TTI sum up the number of blocks (ns) and the number of erroneous blocks (ne) from the beginning of the test and calculate
BLER1 (including the artificial error at the beginning of the test (Note 1))and
BLER0 (excluding the artificial error at the beginning of the test (Note 1)).
If BLER1 is below the early pass limit, pass the DUT.
If BLER0 is above the early fail limit, fail the DUT.
Otherwise continue the test
2) If the minimum test time ≥ time for target error events, then the test runs for the minimum test time and the decision is done by comparing the result with the test limit.
For BER:
For every TTI (Transmit Time Interval) sum up the number of bits (ns) and the number if errors (ne) from the beginning of the test and calculate BER0
For BLER:
For every TTI sum up the number of blocks (ns) and the number of erroneous blocks (ne) from the beginning of the test and calculate BLER0
If BER0/BLER0 is above the test limit, fail the DUT.
If BER0/BLER0 is on or below the test limit, pass the DUT.
F.1.8 Test conditions for BER,BLER Tests
Table F.4: Test conditions for BER tests
Type of test (BER) |
Propagation conditions |
Test requirement (BER) |
Test limit (BER)= Test requirement (BER)x TL TL |
Target number of error events (time) Note * |
Minimum number of samples |
Prob that good unit will fail = Prob that bad unit will pass (%) |
Bad unit BER factor M |
Reference Sensitivity Level |
– |
0.001 |
1.234 |
345 (22.9s) |
Note 1 |
0.2 |
1.5 |
Dynamic Range |
– |
0.001 |
1.234 |
345 (22.9s) |
Note 1 |
0.2 |
1.5 |
Adjacent Channel Selectivity |
– |
0.001 |
1.234 |
345 (22.9s) |
Note 1 |
0.2 |
1.5 |
Blocking Characteristics Pass condition Note 2 |
– |
0.001 |
1.251 |
402 (26.3s) |
Note 1 |
0.2 |
1.5 |
Blocking Characteristics Fail condition Note 2 |
– |
0.001 |
1.251 |
402 (26.3s) |
Note 1 |
0.02 |
1.5 |
Intermodulation Characteristics |
– |
0.001 |
1.234 |
345 (22.9s) |
Note 1 |
0.2 |
1.5 |
Note *: the time in the bracket means the reception time |
Table F.5: Test conditions for BLER tests
Type of test (BLER) |
Information Bit rate (kbit/s) |
Test requirement (BLER) |
Test limit (BLER)= Test requirement (BLER)x TL TL |
Target number of error events (time) |
Minimumnumber of samples (time) TDD 3,84 Mchip/s |
Minimum number of samples (time) TDD 1,28 Mchip/s |
Prob that bad unit will pass = Prob that good unit will fail (%) |
Bad unit BLER factor M |
Demodulation in Static Propagation conditions |
12.2 64 144 384 |
0.01 0.1 0.01 0.1 0.01 0.1 0.01 |
1.234 |
345 (559s) (55.9s) (559s) (55.9s) (559s) (28s) (280s) |
Note1 |
Note1 |
0.2 |
1.5 |
Demodulation of DCH in Multi-path Fading Propagation conditions 3km/h (Case 1, Case 2) |
12.2 64 144 384 |
0.01 0.1 0.01 0.1 0.01 0.1 0.01 |
1.234 |
345 (559s) (55.9s) (559s) (55.9s) (559s) (28s) (280s) |
[(2460s)] [123000] [123000] [123000] [123000] [123000] [(820s)] [82000] [82000] |
[ (1148s)] [5740] [5740] [5740] [(574s)] [2870] [2870] [(278s)] [27800] [27800] |
0.2 |
1.5 |
Demodulation of DCH in Multi-path Fading Propagation conditions 120 km/h (Case3) |
12.2 64 144 384 |
0.01 0.1 0.01 0.1 0.01 0.1 0.01 |
1.234 |
345 (559s) (55.9s) (559s) (55.9s) (559s) (28s) (280s) |
[(61.5s)] [3075] [3075] [3075] [3075] [3075] [(20.5s)] [2050] [2050] |
[(28.7s)] [1435] [1435] [1435] [(14.35s)] [718] [718] [(7.175s)] [718] [718] |
0.2 |
1.5 |
Demodulation of DCH in high speed train condition |
12.2 64 |
0.01 0.1 0.01 |
1.234 |
345 (559s) (55.9s) (559s) |
Scenario 1 (82.3s) 4115 Scenario 3 (28.8s) 1440 |
0.2 |
1.5 |
F.1.9 Practical Use (informative)
See figure F.1:
– The early fail limit represents formula (1) in F.1.5. The range of validity is ne≥7 ( ≥8 in case of blocking test) to ne =345
– The early pass limit represents formula (2) in F.1.5. The range of validity is ne=1 to ne =345. See note 1
– The intersection co-ordinates of both curves are : target number of errors ne =345 and test limit TL =1.234.
– The range of validity for TL is ne>345.
A typical BER BLER test, calculated from the number of samples and errors (F.1.2.(b)) using experimental method (1) or (2) (see F.1.4.2 calculation assumptions) runs along the yellow trajectory. With an errorless sample the trajectory goes down vertically. With an erroneous sample it jumps up right. The tester checks if the BER BLER test intersects the early fail or early pass limits. The real time processing can be reduced by the following actions:
BLER0 (excluding the artificial error at the beginning of the test (Note 1)). is calculated only in case of an error event.
BER0 (excluding the artificial error at the beginning of the test (Note 1)). is calculated only in case of an error event within a TTI.
So the early fail limit cannot be missed by errorless samples.
The check against the early pass limit may be done by transforming formula (2) in F.1.5 such that the tester checks against a Limit-Number-of-samples ( NL(ne)) depending on the current number of errors (including the artificial error at the beginning of the test (Note 1)).
Early pass if
TR: test requirement (0.001)
Figure F.1
NOTE 1: At the beginning of the test, an artificial error is introduced. This ensures that an ideal DUT meets the valid range of the early pass limit. In addition this ensures that the complementary experiment (F.1.4.2 bullet point (2)) is applicable as well.
For the check against the early fail limit the artificial erroneous sample, introduced at the beginning of the test , is disregarded.
Due to the nature of the test, namely discrete error events, the early fail condition shall not be valid, when fractional errors <1 are used to calculate the early fail limit: Any early fail decision is postponed until number of errors ne ≥7. In the blocking test any early fail decision is postponed until number of errors ne ≥ 8.
NOTE 2: F=0.2% is intended to be used for a test containing a few BER/BLER tests (e.g. receiver sensitivity is repeated 12 times(3 RF Channels * 2 Power-supplies * 2 Temperatures). For a test containing many BER/BLER tests (e.g. blocking test) this value is not appropriate for a single BER/BLER test.
The blocking test contains approx. 12750 single BER tests. A DUT on the limit will fail approx. 25 to 26 times due to statistical reasons using wrong decision probability at the end of the test F= 0.2%. This shall be solved by the following rule:
All passes (based on F=0.2%) are accepted, including the wrong decisions due to statistical reasons.
An early fail limit based on F=0.02% instead of 0.2% is established. That ensures that wrong decisions due to statistical reasons are reduced to 2 to 3 in 12750 BER measurements. If the fail cases are ≤12, it is allowed to repeat each fail cases 1 time before the final verdict.
These asymmetric test conditions ensure that a DUT on the limit consumes hardly more test time for a blocking test than in the symmetric case and reduces the wrong decision probability considerably and on the other hand the repetition allowance sufficiently suppresses the residual statistically caused wrong verdict for the aggregate test.
Annex G (informative):
Change History
Table G.1: Change History
TSG |
Doc |
CR |
R |
Title |
Cat |
Curr |
New |
Work Item |
RP-29 |
Rel-7 version created based on v6.3.0 |
7.0.0 |
||||||
RP-29 |
RP-050579 |
0176 |
Introduction of UMTS 2.6 GHz operating band for TDD |
B |
6.2.0 |
7.0.0 |
RInImp-UMTS2600TDD |
|
RP-29 |
RP-050579 |
0177 |
UMTS 2.6 GHz TDD Propagation Conditions |
B |
6.2.0 |
7.0.0 |
RInImp-UMTS2600TDD |
|
RP-29 |
RP-050579 |
0178 |
2 |
Channel Raster for 3,84 Mcps TDD in UMTS 2.6 GHz |
B |
6.2.0 |
7.0.0 |
RInImp-UMTS2600TDD |
RP-29 |
RP-050579 |
0179 |
UMTS 2.6 GHz TDD BS Transmitter Specifications |
B |
6.2.0 |
7.0.0 |
RInImp-UMTS2600TDD |
|
RP-29 |
RP-050579 |
0180 |
UMTS 2.6 GHz TDD BS Receiver Specifications |
B |
6.2.0 |
7.0.0 |
RInImp-UMTS2600TDD |
|
RP-29 |
RP-050579 |
0181 |
Introduction of Propagation Conditions for UMTS 2.6 GHz for 1,28Mcps TDD |
B |
6.2.0 |
7.0.0 |
RInImp-UMTS2600TDD |
|
RP-29 |
RP-050579 |
0182 |
UMTS 2.6 GHz TDD BS receiver spurious emission |
B |
6.2.0 |
7.0.0 |
RInImp-UMTS2600TDD |
|
RP-30 |
RP-050740 |
0183 |
Introduction of UMTS 2.6 BS transmitter specification for 1,28Mcps TDD |
B |
7.0.0 |
7.1.0 |
RInImp-UMTS2600TDD |
|
RP-30 |
RP-050740 |
0184 |
Introduction of UMTS 2.6 BS receiver specification for 1,28Mcps TDD |
B |
7.0.0 |
7.1.0 |
RInImp-UMTS2600TDD |
|
RP-30 |
RP-050841 |
0186 |
Name correction of logical and transport channels in Annex 2 |
A |
7.0.0 |
7.1.0 |
TEI6 |
|
RP-32 |
RP-060307 |
0187 |
UMTS 2.6 GHz blocking and spurious emission test condition |
F |
7.1.0 |
7.2.0 |
RInImp-UMTS2600TDD |
|
RP-32 |
RP-060312 |
0188 |
1 |
7.68 Mcps Frequency Band & Channel Arrangement |
B |
7.1.0 |
7.2.0 |
VHCRTDD-RF |
RP-32 |
RP-060312 |
0189 |
7.68 Mcps Transmitter Characteristics |
B |
7.1.0 |
7.2.0 |
VHCRTDD-RF |
|
RP-32 |
RP-060312 |
0190 |
1 |
7.68 Mcps Receiver Characteristics |
B |
7.1.0 |
7.2.0 |
VHCRTDD-RF |
RP-32 |
RP-060312 |
0191 |
7.68 Mcps – Channel Performance |
B |
7.1.0 |
7.2.0 |
VHCRTDD-RF |
|
RP-32 |
RP-060312 |
0192 |
7.68 Mcps Measurement Channels & Propagation Conditions |
B |
7.1.0 |
7.2.0 |
VHCRTDD-RF |
|
RP-33 |
RP-060517 |
0205 |
Clarification of Tx spurious emission level from 3,84 Mcps and 7.68 Mcps TDD BS into PHS band |
F |
7.2.0 |
7.3.0 |
TEI7 |
|
RP-33 |
RP-060518 |
0212 |
1 |
Clarification on the deployment of UTRA TDD in Japan |
A |
7.2.0 |
7.3.0 |
TEI |
RP-33 |
RP-060519 |
0214 |
1 |
Tx and Rx Spurious Emission from 3,84 Mcps and 7.68 Mcps TDD BS into FDD bands in Japan |
A |
7.2.0 |
7.3.0 |
TEI6 |
RP-33 |
RP-060528 |
0206 |
Performance requirements for 3,84 Mcps E-DCH channel. |
B |
7.2.0 |
7.3.0 |
EDCHTDD-RF |
|
RP-33 |
RP-060526 |
0207 |
2 |
7.68 Mcps Operations in 2.6 GHz band |
B |
7.2.0 |
7.3.0 |
RInImp-UMTS26VHCRTDD |
RP-34 |
RP-060818 |
0215 |
Performance requirements for 7.68 Mcps E-DCH channel. |
B |
7.3.0 |
7.4.0 |
TEI7 |
|
RP-35 |
RP-070081 |
0219 |
HS-SICH detection performance test specification for 1.28Mcps TDD |
A |
7.4.0 |
7.5.0 |
TEI6 |
|
RP-35 |
RP-070082 |
0216 |
Tx and Rx Spurious Emission from 7.68 Mcps TDD BS into FDD band in Japan |
F |
7.4.0 |
7.5.0 |
TEI7 |
|
RP-35 |
RP-070082 |
0217 |
Clarification on the deployment of UTRA TDD in Japan |
F |
7.4.0 |
7.5.0 |
TEI7 |
|
RP-36 |
RP-070369 |
0225 |
Modifying category B spurious emission limits for UTRA TDD BS |
A |
7.5.0 |
7.6.0 |
TEI |
|
RP-36 |
RP-070377 |
0221 |
Adding test case of E-DCH performance requirement for 1.28Mcps TDD option |
F |
7.5.0 |
7.6.0 |
LCRTDD-EDCH-RF |
|
RP-37 |
RP-070651 |
0227 |
7.68 Mcps TDD Option test tolerances and transmit ON/OFF time mask level. |
F |
7.6.0 |
7.7.0 |
TEI7 |
|
RP-37 |
RP-070651 |
0226 |
Inclusion of 7.68 Mcps in the scope of document |
F |
7.6.0 |
7.7.0 |
TEI7 |
|
RP-39 |
RP-080119 |
0229 |
1 |
Correcting the power allocation for HS-SICH performance detection |
A |
7.7.0 |
7.8.0 |
TEI6 |
RP-40 |
RP-080329 |
0234 |
RCDE for 1.28Mcps TDD 64QAM modulated codes |
B |
7.8.0 |
7.9.0 |
RANimp-64Qam1.28TDD |
|
RP-40 |
RP-080384 |
0233 |
1 |
UMTS2300MHz propagation channel model addition for 1.28Mcps TDD in 25.142 |
B |
7.9.0 |
8.0.0 |
RInImp8-UMTS2300TDD |
RP-40 |
RP-080384 |
0232 |
1 |
UMTS2300MHz Receiver performance addition for 1.28Mcps TDD in 25.142 |
B |
7.9.0 |
8.0.0 |
RInImp8-UMTS2300TDD |
RP-40 |
RP-080384 |
0231 |
1 |
UMTS2300MHz Transmitter performance addition for 1.28Mcps TDD in 25.142 |
B |
7.9.0 |
8.0.0 |
RInImp8-UMTS2300TDD |
RP-40 |
RP-080384 |
0230 |
1 |
UMTS2300MHz New band introduction for 1.28Mcps TDD in 25.142 |
B |
7.9.0 |
8.0.0 |
RInImp8-UMTS2300TDD |
RP-41 |
RP-080636 |
0236 |
1 |
Modify the Fixed Reference Channels of E-DCH for LCR TDD |
A |
8.0.0 |
8.1.0 |
TEI7 |
RP-43 |
RP-090166 |
0241 |
Correction of BS reference measurement channel and performance requirement for LCR TDD 384kbps service |
A |
8.1.0 |
8.2.0 |
TEI4 |
|
RP-43 |
RP-090197 |
0242 |
Introduction of band 1880MHz for 25.142 |
F |
8.1.0 |
8.2.0 |
Rlnlmp9-UMTS1880TDD |
|
RP-43 |
RP-090197 |
0243 |
UMTS1880MHz: transmitter characteristic |
F |
8.1.0 |
8.2.0 |
RInImp9-UMTS1880TDD |
|
RP-43 |
RP-090197 |
0244 |
UMTS1880MHz: receiver characteristic and propagation conditions |
F |
8.1.0 |
8.2.0 |
RInImp9-UMTS1880TDD |
|
RP-44 |
RP-090553 |
0247 |
Correction of local area base station coexistence requirements |
F |
8.2.0 |
8.3.0 |
RInImp9-UMTS1880TDD |
|
RP-44 |
RP-090554 |
0245 |
1 |
Addition of Time alignment error test for BS supporting 1.28Mcps TDD MIMO |
F |
8.2.0 |
8.3.0 |
RANimp-LCRMIMO |
RP-44 |
RP-090556 |
0246 |
Correction on the test parameter table of E-DCH for 1.28Mcps TDD |
F |
8.2.0 |
8.3.0 |
TEI8 |
|
RP-45 |
RP-090818 |
251 |
Changes to 25.142 accommodating IMB |
F |
8.3.0 |
8.4.0 |
MBSFN-DOB |
|
RP-46 |
RP-091285 |
255 |
 |
BS test requirements in high speed train condition for LCR TDD |
B |
8.5.0 |
 9.0.0 |
RInImp9-LCRTDD350 |
RP-47 |
RP-100257 |
260 |
Correction of E-DCH FRC3 for LCR TDD |
A |
 9.0.0 |
 9.1.0 |
TEI7 |
|
RP-47 |
RP-100253 |
262 |
Protection of E-UTRA for UTRA TDD BS |
A |
 9.0.0 |
 9.1.0 |
LTE-RF |
|
RP-47 |
RP-100273 |
257 |
Additional BS test requirements in high speed train conditions for LCR TDD |
F |
 9.0.0 |
 9.1.0 |
RInImp9- LCRTDD350 |
|
RP-48 |
RP-100631 |
263 |
1 |
Corrections for performance requirements in HST condition |
F |
9.1.0 |
9.2.0 |
TEI9 |
RP-49 |
RP-100922 |
264 |
1 |
Clarification on applicability of requirements for multi-carrier BS |
F |
9.2.0 |
9.3.0 |
RInImp9-RFmulti |
RP-50 |
RP-101340 |
275 |
 |
Addition of test case for HS-SICH type2 performance |
A |
9.3.0 |
9.4.0 |
TEI8 |
RP-50 |
RP-101340 |
277 |
 |
Clarifications of Base Station transmit and receive configurations |
A |
9.3.0 |
9.4.0 |
TEI8 |
RP-50 |
RP-101351 |
267 |
1 |
Introduction of the BS requirements for 1.28Mcps TDD MC-HSUPA |
B |
9.4.0 |
10.0.0 |
TDD_MC_HSUPA |
RP-50 |
RP-101352 |
269 |
 |
1.28Mcps TDD Home NodeB class into Base Station class in 25.142 |
B |
9.4.0 |
10.0.0 |
HNB_LCRTDD_RF-Perf |
RP-50 |
RP-101352 |
270 |
 |
1.28Mcps TDD Home NodeB Transmitter |
B |
9.4.0 |
10.0.0 |
HNB_LCRTDD_RF-Perf |
RP-50 |
RP-101352 |
271 |
 |
1.28Mcps TDD Home NodeB Receiver |
B |
9.4.0 |
10.0.0 |
HNB_LCRTDD_RF-Perf |
RP-50 |
RP-101352 |
272 |
 |
1.28Mcps TDD Home NodeB Demodulation Requirement |
B |
9.4.0 |
10.0.0 |
HNB_LCRTDD_RF-Perf |
RP-51 |
RP-110352 |
0278 |
– |
Adding missing demodulaiton requirements for LCR TDD Home BS |
F |
10.0.0 |
10.1.0 |
TEI10 |
RP-51 |
RP-110352 |
0279 |
1 |
Harmonization of co-existence/co-location requirements between 25.142 and 36.141 |
F |
10.0.0 |
10.1.0 |
TEI10 |
RP-52 |
RP-110796 |
280 |
 |
Correction of co-existence requirement for UTRA TDD |
F |
10.1.0 |
10.2.0 |
TEI10 |
RP-52 |
RP-110796 |
281 |
 |
Correction of the test port description for TS 25.142 |
F |
10.1.0 |
10.2.0 |
TEI10 |
RP-53 |
RP-111262 |
282 |
 |
Clarification of demodulation in static propagation and Multipath fading case 1 for Home BS |
F |
10.2.0 |
10.3.0 |
TEI10 |
RP-56 |
RP-120783 |
286 |
 |
Update to regional requirement table |
F |
10.3.0 |
10.4.0 |
TEI10 |
RP-56 |
RP-120765 |
292 |
1 |
Additional spurious emissions requirements for PHS |
A |
10.3.0 |
10.4.0 |
TEI8 |
RP-56 |
RP-120795 |
283 |
1 |
TDD blocking for co-location |
F |
10.4.0 |
11.0.0 |
TEI11 |
RP-56 |
RP-120795 |
284 |
1 |
WA co-existence/co-location |
F |
10.4.0 |
11.0.0 |
TEI11 |
RP-56 |
RP-120795 |
285 |
1 |
Co-existence between TDD systems |
F |
10.4.0 |
11.0.0 |
TEI11 |
RP-56 |
RP-120795 |
287 |
 |
LA co-existence/co-location |
F |
10.4.0 |
11.0.0 |
TEI11 |
RP-56 |
RP-120795 |
288 |
 |
Co-existence/co-location between LA TDD systems |
F |
10.4.0 |
11.0.0 |
TEI11 |
RP-56 |
RP-120793 |
289 |
 |
Introduction of Band 44 |
B |
10.4.0 |
11.0.0 |
LTE_APAC700-Core |
RP-57 |
RP-121296 |
296 |
 |
Clarification for TDD Band |
A |
11.0.0 |
11.1.0 |
TEI8 |
RP-59 |
RP-130287 |
297 |
 |
Update of BS co-existence requirement towards UTRA TDD bands in China |
F |
11.1.0 |
11.2.0 |
TEI11 |
RP-60 |
RP-130768 |
298 |
1 |
On additional ACLR requirement |
F |
11.2.0 |
11.3.0 |
TEI11 |
RP-60 |
RP-130764 |
299 |
Co-existence around 3500 MHz |
F |
11.2.0 |
11.3.0 |
RInImp8-UMTSLTE3500 |
|
RP-60 |
RP-130768 |
300 |
Rel.11 CR for 25.142: Editorial Corrections and Amendment with Missed TT Values |
F |
11.2.0 |
11.3.0 |
TEI11 |
|
RP-60 |
RP-130768 |
301 |
1 |
Addition of MC-HSDPA for general clause 6.1 |
F |
11.2.0 |
11.3.0 |
TEI11 |
SP-65 |
– |
– |
– |
Update to Rel-12 version (MCC) |
– |
11.3.0 |
12.0.0 |
|
RP-66 |
RP-142146 |
314 |
 |
Introduction of testing for multi-carrier and multi-band operation in TS25.142 |
A |
12.0.0 |
12.1.0 |
MB_MSR_RF-Perf |
RP-66 |
RP-142146 |
315 |
 |
Introduction of requirements for BS capable of multi-band operation |
A |
12.0.0 |
12.1.0 |
MB_MSR_RF-Perf |
RP-70 |
RP-152132 |
317 |
TX intermodulation requirement correction |
A |
12.1.0 |
12.2.0 |
TEI11 |
|
SP-70 |
– |
– |
– |
Update to Rel-13 version (MCC) |
– |
12.2.0 |
13.0.0 |
|
Editorial Change to the cover page |
13.0.0 |
13.0.1 |
Change history |
|||||||
Date |
Meeting |
TDoc |
CR |
Rev |
Cat |
Subject/Comment |
New version |
2016-06 |
RAN#72 |
RP-161134 |
320 |
 |
B |
Introduction of Band 46 in TS 25.142 |
13.1.0 |
2017-03 |
RAN#75 |
– |
– |
– |
– |
Update to Rel-14 version (MCC) |
14.0.0 |
2018-06 |
SA#80 |
– |
– |
– |
– |
Update to Rel-15 version (MCC) |
15.0.0 |
Editorial Change to the cover page |
15.0.1 |
||||||
2020-06 |
SA#88 |
– |
– |
– |
– |
Update to Rel-16 version (MCC) |
16.0.0 |
2022-03 |
SA#95 |
Update to Rel-17 version (MCC) |
17.0.0 |