C.3 Notes

25.1423GPPBase Station (BS) conformance testing (TDD)Release 17TS

C.3.1 Symbol length

A general code-multiplexed signal is multi-code and multi-rate. In order to avoid unnecessary complexity, the measurement applications use a unique symbol-length, corresponding to a specific spreading factor, regardless of the really intended spreading factor. Nevertheless, the complexity with a multi-code / multi-rate signal can be mastered by introducing appropriate definitions.

C.3.2 Deviation

It is conceivable to regard more parameters as type „deviation", e.g. chip clock and RF phase. However, because chip clock and RF frequency are linked together by a statement in the core specifications [1], it is sufficient to process RF frequency only.

The parameter RF phase must be varied within the best-fit process (C.2.5). Although necessary, this parameter-variation does not describe any error, as the modulation schemes used in the system do not depend on an absolute RF-phase.

The parameter Timing must be varied within the best fit process (C.2.5.) This parameter variation does not describe any error, when applied to the Node B test. However when applied to the UE test, it describes the error of the UE’s Timing Advance.

C.3.3 Residual

It is conceivable to regard more parameters as type „residual", e.g. IQ origin offset. As it is not the intention of the test to separate for different error sources, but to quantify the quality of the signal, all such parameters are not extracted by the best-fit process, instead remain part of EVM and PCDE.

C.3.4 TDD

EVM covers the midamble (or for IMB the TDM pilot region) part as well as the data part; however PCDE disregards the midamble (or IMB TDM pilot) part.

C.3.5 Synch channel

A node B signal contains a physical synch channel, which is non-orthogonal, related to the other DPCHs. In this context note: The code channel bearing the result of PCDE is exactly one of the DPCHs (never the synch channel). The origin of PCDE (erroneous code power) can be any DPCH and/or the synch channel. This means that the error due to the synch channel is projected onto the other (orthogonal) codes that make up the code domain.

C.3.6 Formula for the minimum process

where

L is the function to be minimised

The parameters to be varied in order to minimize are:

the RF frequency offset

the timing offset

the phase offset

code power offsets (one offset for each code)

the power offset of the midamble (or for IMB the TDM pilot region)

the code power offset of the primary SCH

the code power offsets of secondary SCHs, (i: 1,2,3)

( and are only applied, if the timeslot under test contains the synchronisation channel.)

Z(ν) Samples of the signal under Test

R(ν) Samples of the reference signal

counting index starting at the beginning of the measurement interval and ending at its end.

N No of chips during the measurement interval.

Z(ν): Samples of the signal under Test. It is modelled as a sequence of complex baseband samples Z(γ) with a time-shift Δt, a frequency offset Δf, a phase offset Δϕ, the latter three with respect to the reference signal.

R(ν): Samples of the reference signal:

where

g nominal gain of the code channel or midamble (or for IMB the TDM pilot region)

The gain offset to be varied in the minimum process

Chip(ν) is the chip sequence of the code channel or midamble (or for IMB the TDM pilot region)

Indices at g, Δg and Chip: The index indicates the code channel:

c = 1,2,… No of code channels

prim = primary SCH

seci = three secondary SCHs, i:1,2,3

Range for Chipc : +1,-1

C.3.7 Formula for EVM

Z’(γ), R’(γ) are the varied measured and reference signals.

Annex D (informative):
Derivation of Test Requirements

The Test Requirements in this specification have been calculated by relaxing the Minimum Requirements of the core specification using the Test Tolerances defined in subclause 5.11. When the Test Tolerance is zero, the Test Requirement will be the same as the Minimum Requirement. When the Test Tolerance is non-zero, the Test Requirements will differ from the Minimum Requirements, and the formula used for this relaxation is given in tables D.1 to D.3

Note that a formula for applying Test Tolerances is provided for all tests, even those with a test tolerance of zero. This is necessary in the case that the Test System uncertainty is greater than that allowed in subclause 5.10. In this event, the excess error shall be subtracted from the defined test tolerance in order to generate the correct tightened Test Requirements as defined in subclause 5.12.

For example, a Test System having 0,9 dB accuracy for test 6.2 Maximum output power (which is 0,2 dB above the limit specified in subclause 5.10.2) would subtract 0,2 dB from the Test Tolerance of 0,7 dB defined in subclause 5.11.1. This new test tolerance of 0,5 dB would then be applied to the Minimum Requirement using the formula defined in Table D.1 to give a new range of ±2,5 dB of the manufacturer’s rated output power.

For the case where an excess error of 0.2 dB exists, when applied to a test with a test tolerance of zero, the test tolerance used in the formula would be -0.2 dB.

Table D.1: Derivation of Test Requirements (Transmitter tests)

Test

Minimum Requirement in TS 25.105
(numbering of tables in the column below refers to TS 25.142)

Test Tolerance
(TT)

Test Requirement in TS 25.142

6.2 Maximum output power

In normal conditions …
within +2 dB and -2 dB of the manufacturer’s rated output power

In extreme conditions…
within +2,5 dB and -2,5 dB of the manufacturer’s rated output power

0,7 dB

Formula: Upper limit + TT
Lower limit – TT

In normal conditions …
within +2,7 dB and -2,7 dB of the manufacturer’s rated output power

In extreme conditions…
within +3,2 dB and -3,2 dB of the manufacturer’s rated output power

6.3 Frequency stability

Frequency stability

Wide Area BS: = ± 0,05 ppm

Local Area BS: ± 0,1 ppm

12 Hz

Formula:

± (frequency stability +TT)

Wide Area BS:

± (0,05 ppm + 12 Hz)

Local Area BS:

± (0,1 ppm + 12 Hz)

6.4.2 Power control steps

single step: step size tolerance specified in table 6.3

ten steps: minimum and maximum average rate of change in mean power specified in table 6.3

single step:

0,1 dB

ten steps:

0,3 dB

Formula:

single step:
± (step size tolerance + TT)

ten steps:

maximum average rate + TT
minimum average rate – TT

0,1 dB and 0,3 dB, respectively, applied as above to table 6.3

6.4.3 Power control dynamic range

range ≥ 30 dB

0,3 dB

Formula: Range – TT

range ≥ 29,7 dB

6.4.4 Minimum output power

PRAT – 30 dB

0,7 dB

Formula :

PRAT – 30 dB +TT

PRAT – 29,3 dB

6.4.5 Primary CCPCH power

PCCPCH power tolerance defined in table 6.8

0,8 dB

Formula:

± (power tolerance + TT)

0,8 dB applied as above to table 6.8

6.4.6 Differential accuracy of Primary CCPCH power

Differential accuracy of PCCPCH power: ≤ ± 0,5 dB

0,1 dB

Formula:

± (PCCPCH tolerance + TT)

± 0,6 dB

6.5.1 Transmit OFF power

Tx OFF power limit < -79 dBm

2,0 dB

Formula:
< Tx OFF power limit + TT

< – 77 dBm

6.5.2 Transmit ON/OFF time mask

Tx power limit:

3,84 Mcps TDD option:

< -33 dBm or -79 dBm, resp.

1,28 Mcps TDD option:

< -42 dBm or -82 dBm, resp.

< -33 dBm:
0,7 dB

< -79 dBm:

2,0 dB

< -42 dBm:

0,7 dB

< -82 dBm:

2,0 dB

Formula:

< Tx power limit + TT

for 3,84 Mcps TDD option:

< -32,3 dBm

or

< – 77 dBm

for 1,28 Mcps TDD option:

< -41,3 dBm

or

< -80 dBm

6.6.1 Occupied bandwidth

occupied bandwidth limit

3,84 Mcps TDD option: = 5 MHz

1,28 Mcps TDD option: 1,6 MHz

0 kHz

Formula:
Occupied bandwidth limit + TT

3,84 Mcps TDD option: = 5 MHz

1,28 Mcps TDD option: 1,6 MHz

6.6.2.1 Spectrum emission mask

Maximum level defined in tables 6.13 to 6.16

1,5 dB

Formula: Maximum level + TT

Add 1,5 dB to Maximum level entries in tables 6.13 to 6.16

6.6.2.2 Adjacent Channel Leakage power Ratio (ACLR)

3,84 Mcps TDD option:

minimum requirement:
ACLR limit = 45 dB at 5 MHz
ACLR limit = 55 dB at 10 MHz

requirement for operation in the same geographic area with unsynchronised TDD BS or FDD BS on adjacent channels:

Maximum Level defined in tables 6.23 and 6.23AA

requirement in case of co-siting with unsynchronised TDD BS or FDD BS operating on adjacent channels:

Maximum Level defined in tables 6.24 and 6.24A

1,28 Mcps TDD option:

minimum requirement:

ACLR limit = 40 dB at 1,6 MHz
ACLR limit = 45 dB at 3,2 MHz

requirement for operation in the same geographic area with unsynchronised TDD or FDD on adjacent channels:

Maximum Level defined in tables

6.23A, 6.23B and 6.23C

requirement in case of co-siting with unsynchronised TDD or FDD on an adjacent channel:

Maximum Level defined in tables 6.24B, 6.24C and 6.24D

3,84 Mcps TDD option:

min. req. :

0,8 dB

operation in the same geographic area:

4 dB (TBD in table 6.23A, 5 MHz offset, resp.)

for Wide Area BS ;

0,8 dB for Local Area BS

co-siting: TBD for Wide Area BS;

1 dB for Local Area BS

1,28 Mcps TDD option:

min. req. :

0,8 dB

operation in the same geographic area:

1 dB or

4 dB for the Wide Area BS;

0,8 dB for the Local Area BS

co-siting: TBD for the Wide Area BS;

1 dB for the Local Area BS

Formula: ACLR limit – TT

3,84 Mcps TDD option:

min. requirement:
ACLR limit = 44,2 dB at 5 MHz
ACLR limit = 54,2 dB at 10 MHz

operation in the same geographic area:

Wide Area BS:

Add 4 dB (TBD in table 6.23A, 5 MHz offset, resp.) to the Maximum Level entries in tables 6.23 and 6.23AA.

Local Area BS:

Add 0,8 dB to the Maximum Level entries in tables 6.23 and 6.23AA.

co-siting:

Wide Area BS:

Add TBD to the Maximum Level entries in tables 6.24 and 6.24A.

Local Area BS:

Add 1 dB to the Maximum Level entries in tables 6.24 and 6.24A.

1,28 Mcps TDD option:

min. requirement:
ACLR limit = 39,2 dB at 1,6 MHz
ACLR limit = 44,2 dB at 3,2 MHz

operation in the same geographic area:

Wide Area BS:

Add 1 dB to the Maximum Level entries in tables 6.23A and 6.23B, and 4 dB to the Maximum Level entry in table 6.23C.

Local Area BS:

Add 0,8 dB to the Maximum Level entries in tables 6.23A, 6.23B and 6.23C.

co-siting:

Wide Area BS:

Add TBD to the Maximum Level entries in tables 6.24B, 6.24C and 6.24D.

Local Area BS:

Add 1 dB to the Maximum Level entries in tables 6.24B, 6.24C and 6.24D.

6.6.3 Spurious emissions

maximum level defined in tables 6.29 to 6.37

0 dB

Formula: Maximum limit + TT

add 0 dB to maximum levels in tables 6.29 to 6.37

6.7 Transmit intermodulation (interferer requirements)

This tolerance applies to the stimulus and not the measurements defined in 6.6.2.1, 6.6.2.2 and 6.6.3.

Wanted signal level – interferer level = 30 dB

0 dB

Formula: Ratio + TT

Wanted signal level – interferer level = 30 + 0 dB

6.8.1 Modulation accuracy

EVM limit = 12,5 %

0 %

Formula: EVM limit + TT

EVM limit = 12,5 %

6.8.2 Peak code domain error

PCDE limit = – 28 dB

1 dB

Formula: PCDE limit + TT

PCDE limit = – 27 dB

6.8.3 Relative Code Domain Error

RCDE limit = ‑21.9 dB

1.0 dB

Formula: RCDE limit + TT

RCDE limit = ‑20.9 dB

6.8.4 Time alignment error in MIMO transmission

1,28 Mcps TDD option:

Max time alignment error = 65 ns

Min time alignment error = – 65 ns

1,28 Mcps TDD option:

[78] ns

Formula:

Max time alignment error + TT

Min time alignment error – TT

1,28 Mcps TDD option:

Max time alignment error = [143]ns

Min time alignment error = [-143]ns

Table D.2: Derivation of Test Requirements (Receiver tests)

Test

Minimum Requirement in TS 25.105
(numbering of tables in the column below refers to TS 25.142)

Test Tolerance
(TT)

Test Requirement in TS 25.142

7.2 Reference sensitivity

Reference sensitivity level

3,84 Mcps TDD option: =

Wide Area BS: -109 dBm

Local Area BS: -95 dBm

1,28 Mcps TDD option:

Wide Area BS: -110 dBm

Local Area BS: -96 dBm

BER limit = 0,001

0,7 dB

Formula:
Reference sensitivity level + TT

Reference sensitivity level

3,84 Mcps TDD option:

Wide Area BS: -108,3 dBm

Local Area BS: -94,3 dBm

1,28 Mcps TDD option:

Wide Area BS: -110dBm

Local Area BS: -95,3 dBm

BER limit is not changed

7.3 Dynamic range

Wanted signal level =
<REFSENS> + 30 dB

Interfering AWGN level

3,84 Mcps TDD option:
Wide Area BS: -73 dBm/3,84 MHz

Local Area BS: -59 dBm/3,84 MHz

1,28 Mcps TDD option:
Wide Area BS: -76 dBm/1,28 MHz

Local Area BS: -62 dBm/1,28 MHz

1,2 dB

Formula:

Wanted signal level + TT

AWGN level unchanged

Wanted signal level =
<REFSENS> + 31,2 dB

7.4 Adjacent Channel Selectivity (ACS)

Wanted signal level =
Ref. sensitivity level + 6 dB

Interfering signal level

3,84 Mcps TDD option:

Wide Area BS: -52 dBm/3,84 MHz

Local Area BS: -38 dBm/3,84 MHz

1,28 Mcps TDD option:
Wide Area BS: -55 dBm/1,28 MHz

Local Area BS: -41 dBm/1,28 MHz

0 dB

Formula:

Wanted signal level + TT

Interfering signal level unchanged

Wanted signal level =
Ref. sensitivity level + 6 dB

7.5 Blocking characteristics

Wanted signal level =
<REFSENS> + 6 dB

3,84 Mcps TDD option:

Interfering signal level see tables 7.6 to 7.10

1,28 Mcps TDD option:

Interfering signal level see tables 7.6A to 7.10A

0 dB

Formula:

Wanted signal level + TT

Interfering signal level unchanged

Wanted signal level =
<REFSENS> + 6 dB

7.6 Intermodulation characteristics

Wanted signal level =
<REFSENS> + 6 dB

Interferer1 level (10 MHz offset CW for 3,84 Mcps TDD option; 3,2 MHz offset CW for 1,28 Mcps TDD option)) = -48 dBm

Interferer2 level (20 MHz offset W-CDMA Modulated for 3,84 Mcps TDD option; 6,4 Mcps offset W-CDMA Modulated for 1,28 Mcps TDD option)) = -48 dBm

0 dB

Formula:

Wanted signal level + TT

Interferer 1 level: unchanged

Interferer 2 level: unchanged

Wanted signal level =

<REFSENS> + 6 dB

7.7 Spurious emissions

Maximum level defined in table 7.12

0 dB

Formula: Maximum level + TT

Add TT to maximum level in table 7.12

Table D.3: Derivation of Test Requirements (Performance requirements)

Test

Minimum Requirement in TS 25.105

Test Tolerance
(TT)

Test Requirement in TS 25.142

8.2 Demodulation in static propagation conditions

TBD

8.3 Demodulation of DCH in multipath fading conditions

TBD

8.3A Demodulation of DCH in high speed train conditions

Received value

0.4dB

Minimum requirement + TT

Annex E (informative):
Acceptable uncertainty of Test Equipment

This informative annex specifies the critical parameters of the components of an overall Test System (e.g. Signal generators, Signal Analysers etc.) which are necessary when assembling a Test System which complies with subclause 5.10 Acceptable Uncertainty of Test System. These Test Equipment parameters are fundamental to the accuracy of the overall Test System and are unlikely to be improved upon through System Calibration.

Table E.1: Equipment accuracy for transmitter measurements

Test

Equipment accuracy

Range over which equipment accuracy applies

6.2 Maximum output power

Not critical

Not critical

6.3 Frequency stability

± 10 Hz + timebase = 12 Hz

Measurements in the range ± 500 Hz.

6.4.2 Power control steps

single step: ± 0,1 dB

ten steps: ± 0,3 dB

Pmax to Pmax – 30 dB

6.4.3 Power control dynamic range

± 0,3 dB

Pmax to Pmax – 30 dB

6.4.4 Minimum output power

Not critical

Pmax to Pmax – 30 dB

6.4.5 Primary CCPCH power

Not critical

Not critical

6.4.6 Differential accuracy of Primary CCPCH power

± 0,1 dB

6.5.1 Transmit OFF power

Not critical

Not critical

6.5.2 Transmit ON/OFF time mask

Not critical

Not critical

6.6.1 Occupied bandwidth

± 100 kHz

± 1 MHz of the minimum requirement

6.6.2.1 Spectrum emission mask

Not critical

Not critical

6.6.2.2 ACLR

minimum requirement: ± 0,8 dB

requirement in case of operation in proximity: ± 4,0 dB

requirement in case of co-siting: TBD

Measurements in the range ±3 dB of the minimum requirement at signal power = Pmax

6.6.3 Spurious emissions

Not critical

Not critical

6.7 Transmit intermodulation (interferer requirements)

Not critical

Not critical

6.8.1 Modulation accuracy

2,5 %

(for single code)

Specified accuracy applies to measurement results between

± 7,5% and 17,5% at signal power = Pmax to Pmax – 30 dB

6.8.2 Peak code domain error

± 1 dB

Measurements in the range -25 dB to -30 dB at signal power = Pmax

6.8.3 Relative Code Domain Error

±1.0 dB

Measurements in the range -18.9 to -24.9 dB at signal power = Pmax

6.8.4 Time alignment error in MIMO transmission

1,28 Mcps TDD option:

± [78] ns

Table E.2: Equipment accuracy for receiver measurements

Subclause

Equipment accuracy

Range over which equipment accuracy applies

7.2 Reference sensitivity level

Not critical

Not critical

7.3 Dynamic range

Not critical

Not critical

7.4 Adjacent channel selectivity

Not critical

Not critical

7.5 Blocking characteristics

Not critical

Not critical

7.6 Intermodulation characteristics

Not critical

Not critical

7.7 Spurious Emissions

Not critical

Not critical

Table E.3: Equipment accuracy for performance measurements

Subclause

Equipment accuracy

Range over which equipment accuracy applies

8.2 Demodulation in static propagation conditions

Not critical

Not critical

8.3 Demodulation of DCH in multipath fading conditions

Not critical

Not critical

8.3A Demodulation of DCH in high speed train conditions

Not critical

Not critical

Annex F (normative):
General rules for statistical testing