C.3 Notes
25.1423GPPBase Station (BS) conformance testing (TDD)Release 17TS
C.3.1 Symbol length
A general code-multiplexed signal is multi-code and multi-rate. In order to avoid unnecessary complexity, the measurement applications use a unique symbol-length, corresponding to a specific spreading factor, regardless of the really intended spreading factor. Nevertheless, the complexity with a multi-code / multi-rate signal can be mastered by introducing appropriate definitions.
C.3.2 Deviation
It is conceivable to regard more parameters as type „deviation", e.g. chip clock and RF phase. However, because chip clock and RF frequency are linked together by a statement in the core specifications [1], it is sufficient to process RF frequency only.
The parameter RF phase must be varied within the best-fit process (C.2.5). Although necessary, this parameter-variation does not describe any error, as the modulation schemes used in the system do not depend on an absolute RF-phase.
The parameter Timing must be varied within the best fit process (C.2.5.) This parameter variation does not describe any error, when applied to the Node B test. However when applied to the UE test, it describes the error of the UE’s Timing Advance.
C.3.3 Residual
It is conceivable to regard more parameters as type „residual", e.g. IQ origin offset. As it is not the intention of the test to separate for different error sources, but to quantify the quality of the signal, all such parameters are not extracted by the best-fit process, instead remain part of EVM and PCDE.
C.3.4 TDD
EVM covers the midamble (or for IMB the TDM pilot region) part as well as the data part; however PCDE disregards the midamble (or IMB TDM pilot) part.
C.3.5 Synch channel
A node B signal contains a physical synch channel, which is non-orthogonal, related to the other DPCHs. In this context note: The code channel bearing the result of PCDE is exactly one of the DPCHs (never the synch channel). The origin of PCDE (erroneous code power) can be any DPCH and/or the synch channel. This means that the error due to the synch channel is projected onto the other (orthogonal) codes that make up the code domain.
C.3.6 Formula for the minimum process
where
L is the function to be minimised
The parameters to be varied in order to minimize are:
the RF frequency offset
the timing offset
the phase offset
code power offsets (one offset for each code)
the power offset of the midamble (or for IMB the TDM pilot region)
the code power offset of the primary SCH
the code power offsets of secondary SCHs, (i: 1,2,3)
( and
are only applied, if the timeslot under test contains the synchronisation channel.)
Z(ν) Samples of the signal under Test
R(ν) Samples of the reference signal
counting index
starting at the beginning of the measurement interval and ending at its end.
N No of chips during the measurement interval.
Z(ν): Samples of the signal under Test. It is modelled as a sequence of complex baseband samples Z(γ) with a time-shift Δt, a frequency offset Δf, a phase offset Δϕ, the latter three with respect to the reference signal.
R(ν): Samples of the reference signal:
where
g nominal gain of the code channel or midamble (or for IMB the TDM pilot region)
The gain offset to be varied in the minimum process
Chip(ν) is the chip sequence of the code channel or midamble (or for IMB the TDM pilot region)
Indices at g, Δg and Chip: The index indicates the code channel:
c = 1,2,… No of code channels
prim = primary SCH
seci = three secondary SCHs, i:1,2,3
Range for Chipc : +1,-1
C.3.7 Formula for EVM
Z’(γ), R’(γ) are the varied measured and reference signals.
Annex D (informative):
Derivation of Test Requirements
The Test Requirements in this specification have been calculated by relaxing the Minimum Requirements of the core specification using the Test Tolerances defined in subclause 5.11. When the Test Tolerance is zero, the Test Requirement will be the same as the Minimum Requirement. When the Test Tolerance is non-zero, the Test Requirements will differ from the Minimum Requirements, and the formula used for this relaxation is given in tables D.1 to D.3
Note that a formula for applying Test Tolerances is provided for all tests, even those with a test tolerance of zero. This is necessary in the case that the Test System uncertainty is greater than that allowed in subclause 5.10. In this event, the excess error shall be subtracted from the defined test tolerance in order to generate the correct tightened Test Requirements as defined in subclause 5.12.
For example, a Test System having 0,9 dB accuracy for test 6.2 Maximum output power (which is 0,2 dB above the limit specified in subclause 5.10.2) would subtract 0,2 dB from the Test Tolerance of 0,7 dB defined in subclause 5.11.1. This new test tolerance of 0,5 dB would then be applied to the Minimum Requirement using the formula defined in Table D.1 to give a new range of ±2,5 dB of the manufacturer’s rated output power.
For the case where an excess error of 0.2 dB exists, when applied to a test with a test tolerance of zero, the test tolerance used in the formula would be -0.2 dB.
Table D.1: Derivation of Test Requirements (Transmitter tests)
Test |
Minimum Requirement in TS 25.105 |
Test Tolerance |
Test Requirement in TS 25.142 |
6.2 Maximum output power |
In normal conditions … In extreme conditions… |
0,7 dB |
Formula: Upper limit + TT In normal conditions … In extreme conditions… |
6.3 Frequency stability |
Frequency stability Wide Area BS: = ± 0,05 ppm Local Area BS: ± 0,1 ppm |
12 Hz |
Formula: ± (frequency stability +TT) Wide Area BS: ± (0,05 ppm + 12 Hz) Local Area BS: ± (0,1 ppm + 12 Hz) |
6.4.2 Power control steps |
single step: step size tolerance specified in table 6.3 ten steps: minimum and maximum average rate of change in mean power specified in table 6.3 |
single step: 0,1 dB ten steps: 0,3 dB |
Formula: single step: ten steps: maximum average rate + TT 0,1 dB and 0,3 dB, respectively, applied as above to table 6.3 |
6.4.3 Power control dynamic range |
range ≥ 30 dB |
0,3 dB |
Formula: Range – TT range ≥ 29,7 dB |
6.4.4 Minimum output power |
PRAT – 30 dB |
0,7 dB |
Formula : PRAT – 30 dB +TT PRAT – 29,3 dB |
6.4.5 Primary CCPCH power |
PCCPCH power tolerance defined in table 6.8 |
0,8 dB |
Formula: ± (power tolerance + TT) 0,8 dB applied as above to table 6.8 |
6.4.6 Differential accuracy of Primary CCPCH power |
Differential accuracy of PCCPCH power: ≤ ± 0,5 dB |
0,1 dB |
Formula: ± (PCCPCH tolerance + TT) ± 0,6 dB |
6.5.1 Transmit OFF power |
Tx OFF power limit < -79 dBm |
2,0 dB |
Formula: < – 77 dBm |
6.5.2 Transmit ON/OFF time mask |
Tx power limit: 3,84 Mcps TDD option: < -33 dBm or -79 dBm, resp. 1,28 Mcps TDD option: < -42 dBm or -82 dBm, resp. |
< -33 dBm: < -79 dBm: 2,0 dB < -42 dBm: 0,7 dB < -82 dBm: 2,0 dB |
Formula: < Tx power limit + TT for 3,84 Mcps TDD option: < -32,3 dBm or < – 77 dBm for 1,28 Mcps TDD option: < -41,3 dBm or < -80 dBm |
6.6.1 Occupied bandwidth |
occupied bandwidth limit 3,84 Mcps TDD option: = 5 MHz 1,28 Mcps TDD option: 1,6 MHz |
0 kHz |
Formula: 3,84 Mcps TDD option: = 5 MHz 1,28 Mcps TDD option: 1,6 MHz |
6.6.2.1 Spectrum emission mask |
Maximum level defined in tables 6.13 to 6.16 |
1,5 dB |
Formula: Maximum level + TT Add 1,5 dB to Maximum level entries in tables 6.13 to 6.16 |
6.6.2.2 Adjacent Channel Leakage power Ratio (ACLR) |
3,84 Mcps TDD option: minimum requirement: requirement for operation in the same geographic area with unsynchronised TDD BS or FDD BS on adjacent channels: Maximum Level defined in tables 6.23 and 6.23AA requirement in case of co-siting with unsynchronised TDD BS or FDD BS operating on adjacent channels: Maximum Level defined in tables 6.24 and 6.24A 1,28 Mcps TDD option: minimum requirement: ACLR limit = 40 dB at 1,6 MHz requirement for operation in the same geographic area with unsynchronised TDD or FDD on adjacent channels: Maximum Level defined in tables 6.23A, 6.23B and 6.23C requirement in case of co-siting with unsynchronised TDD or FDD on an adjacent channel: Maximum Level defined in tables 6.24B, 6.24C and 6.24D |
3,84 Mcps TDD option: min. req. : 0,8 dB operation in the same geographic area: 4 dB (TBD in table 6.23A, 5 MHz offset, resp.) for Wide Area BS ; 0,8 dB for Local Area BS co-siting: TBD for Wide Area BS; 1 dB for Local Area BS 1,28 Mcps TDD option: min. req. : 0,8 dB operation in the same geographic area: 1 dB or 4 dB for the Wide Area BS; 0,8 dB for the Local Area BS co-siting: TBD for the Wide Area BS; 1 dB for the Local Area BS |
Formula: ACLR limit – TT 3,84 Mcps TDD option: min. requirement: operation in the same geographic area: Wide Area BS: Add 4 dB (TBD in table 6.23A, 5 MHz offset, resp.) to the Maximum Level entries in tables 6.23 and 6.23AA. Local Area BS: Add 0,8 dB to the Maximum Level entries in tables 6.23 and 6.23AA. co-siting: Wide Area BS: Add TBD to the Maximum Level entries in tables 6.24 and 6.24A. Local Area BS: Add 1 dB to the Maximum Level entries in tables 6.24 and 6.24A. 1,28 Mcps TDD option: min. requirement: operation in the same geographic area: Wide Area BS: Add 1 dB to the Maximum Level entries in tables 6.23A and 6.23B, and 4 dB to the Maximum Level entry in table 6.23C. Local Area BS: Add 0,8 dB to the Maximum Level entries in tables 6.23A, 6.23B and 6.23C. co-siting: Wide Area BS: Add TBD to the Maximum Level entries in tables 6.24B, 6.24C and 6.24D. Local Area BS: Add 1 dB to the Maximum Level entries in tables 6.24B, 6.24C and 6.24D. |
6.6.3 Spurious emissions |
maximum level defined in tables 6.29 to 6.37 |
0 dB |
Formula: Maximum limit + TT add 0 dB to maximum levels in tables 6.29 to 6.37 |
6.7 Transmit intermodulation (interferer requirements) This tolerance applies to the stimulus and not the measurements defined in 6.6.2.1, 6.6.2.2 and 6.6.3. |
Wanted signal level – interferer level = 30 dB |
0 dB |
Formula: Ratio + TT Wanted signal level – interferer level = 30 + 0 dB |
6.8.1 Modulation accuracy |
EVM limit = 12,5 % |
0 % |
Formula: EVM limit + TT EVM limit = 12,5 % |
6.8.2 Peak code domain error |
PCDE limit = – 28 dB |
1 dB |
Formula: PCDE limit + TT PCDE limit = – 27 dB |
6.8.3 Relative Code Domain Error |
RCDE limit = ‑21.9 dB |
1.0 dB |
Formula: RCDE limit + TT RCDE limit = ‑20.9 dB |
6.8.4 Time alignment error in MIMO transmission |
1,28 Mcps TDD option: Max time alignment error = 65 ns Min time alignment error = – 65 ns |
1,28 Mcps TDD option: [78] ns |
Formula: Max time alignment error + TT Min time alignment error – TT 1,28 Mcps TDD option: Max time alignment error = [143]ns Min time alignment error = [-143]ns |
Table D.2: Derivation of Test Requirements (Receiver tests)
Test |
Minimum Requirement in TS 25.105 |
Test Tolerance |
Test Requirement in TS 25.142 |
7.2 Reference sensitivity |
Reference sensitivity level 3,84 Mcps TDD option: = Wide Area BS: -109 dBm Local Area BS: -95 dBm 1,28 Mcps TDD option: Wide Area BS: -110 dBm Local Area BS: -96 dBm BER limit = 0,001 |
0,7 dB |
Formula: Reference sensitivity level 3,84 Mcps TDD option: Wide Area BS: -108,3 dBm Local Area BS: -94,3 dBm 1,28 Mcps TDD option: Wide Area BS: -110dBm Local Area BS: -95,3 dBm BER limit is not changed |
7.3 Dynamic range |
Wanted signal level = Interfering AWGN level 3,84 Mcps TDD option: Local Area BS: -59 dBm/3,84 MHz 1,28 Mcps TDD option: Local Area BS: -62 dBm/1,28 MHz |
1,2 dB |
Formula: Wanted signal level + TT AWGN level unchanged Wanted signal level = |
7.4 Adjacent Channel Selectivity (ACS) |
Wanted signal level = Interfering signal level 3,84 Mcps TDD option: Wide Area BS: -52 dBm/3,84 MHz Local Area BS: -38 dBm/3,84 MHz 1,28 Mcps TDD option: Local Area BS: -41 dBm/1,28 MHz |
0 dB |
Formula: Wanted signal level + TT Interfering signal level unchanged Wanted signal level = |
7.5 Blocking characteristics |
Wanted signal level = 3,84 Mcps TDD option: Interfering signal level see tables 7.6 to 7.10 1,28 Mcps TDD option: Interfering signal level see tables 7.6A to 7.10A |
0 dB |
Formula: Wanted signal level + TT Interfering signal level unchanged Wanted signal level = |
7.6 Intermodulation characteristics |
Wanted signal level = Interferer1 level (10 MHz offset CW for 3,84 Mcps TDD option; 3,2 MHz offset CW for 1,28 Mcps TDD option)) = -48 dBm Interferer2 level (20 MHz offset W-CDMA Modulated for 3,84 Mcps TDD option; 6,4 Mcps offset W-CDMA Modulated for 1,28 Mcps TDD option)) = -48 dBm |
0 dB |
Formula: Wanted signal level + TT Interferer 1 level: unchanged Interferer 2 level: unchanged Wanted signal level = <REFSENS> + 6 dB |
7.7 Spurious emissions |
Maximum level defined in table 7.12 |
0 dB |
Formula: Maximum level + TT Add TT to maximum level in table 7.12 |
Table D.3: Derivation of Test Requirements (Performance requirements)
Test |
Minimum Requirement in TS 25.105 |
Test Tolerance |
Test Requirement in TS 25.142 |
8.2 Demodulation in static propagation conditions |
TBD |
||
8.3 Demodulation of DCH in multipath fading conditions |
TBD |
||
8.3A Demodulation of DCH in high speed train conditions |
Received |
0.4dB |
Minimum requirement + TT |
Annex E (informative):
Acceptable uncertainty of Test Equipment
This informative annex specifies the critical parameters of the components of an overall Test System (e.g. Signal generators, Signal Analysers etc.) which are necessary when assembling a Test System which complies with subclause 5.10 Acceptable Uncertainty of Test System. These Test Equipment parameters are fundamental to the accuracy of the overall Test System and are unlikely to be improved upon through System Calibration.
Table E.1: Equipment accuracy for transmitter measurements
Test |
Equipment accuracy |
Range over which equipment accuracy applies |
6.2 Maximum output power |
Not critical |
Not critical |
6.3 Frequency stability |
± 10 Hz + timebase = 12 Hz |
Measurements in the range ± 500 Hz. |
6.4.2 Power control steps |
single step: ± 0,1 dB ten steps: ± 0,3 dB |
Pmax to Pmax – 30 dB |
6.4.3 Power control dynamic range |
± 0,3 dB |
Pmax to Pmax – 30 dB |
6.4.4 Minimum output power |
Not critical |
Pmax to Pmax – 30 dB |
6.4.5 Primary CCPCH power |
Not critical |
Not critical |
6.4.6 Differential accuracy of Primary CCPCH power |
± 0,1 dB |
|
6.5.1 Transmit OFF power |
Not critical |
Not critical |
6.5.2 Transmit ON/OFF time mask |
Not critical |
Not critical |
6.6.1 Occupied bandwidth |
± 100 kHz |
± 1 MHz of the minimum requirement |
6.6.2.1 Spectrum emission mask |
Not critical |
Not critical |
6.6.2.2 ACLR |
minimum requirement: ± 0,8 dB requirement in case of operation in proximity: ± 4,0 dB requirement in case of co-siting: TBD |
Measurements in the range ±3 dB of the minimum requirement at signal power = Pmax |
6.6.3 Spurious emissions |
Not critical |
Not critical |
6.7 Transmit intermodulation (interferer requirements) |
Not critical |
Not critical |
6.8.1 Modulation accuracy |
2,5 % (for single code) |
Specified accuracy applies to measurement results between ± 7,5% and 17,5% at signal power = Pmax to Pmax – 30 dB |
6.8.2 Peak code domain error |
± 1 dB |
Measurements in the range -25 dB to -30 dB at signal power = Pmax |
6.8.3 Relative Code Domain Error |
±1.0 dB |
Measurements in the range -18.9 to -24.9 dB at signal power = Pmax |
6.8.4 Time alignment error in MIMO transmission |
1,28 Mcps TDD option: ± [78] ns |
Table E.2: Equipment accuracy for receiver measurements
Subclause |
Equipment accuracy |
Range over which equipment accuracy applies |
7.2 Reference sensitivity level |
Not critical |
Not critical |
7.3 Dynamic range |
Not critical |
Not critical |
7.4 Adjacent channel selectivity |
Not critical |
Not critical |
7.5 Blocking characteristics |
Not critical |
Not critical |
7.6 Intermodulation characteristics |
Not critical |
Not critical |
7.7 Spurious Emissions |
Not critical |
Not critical |
Table E.3: Equipment accuracy for performance measurements
Subclause |
Equipment accuracy |
Range over which equipment accuracy applies |
8.2 Demodulation in static propagation conditions |
Not critical |
Not critical |
8.3 Demodulation of DCH in multipath fading conditions |
Not critical |
Not critical |
8.3A Demodulation of DCH in high speed train conditions |
Not critical |
Not critical |
Annex F (normative):
General rules for statistical testing